Theory 10/Semiconductor Physics
Leakage Is a Trap Depth
The claim
Trap-assisted tunnelling current is set by the ratio of trap depth to barrier width rather than by trap density, so deep traps in thin barriers leak more than shallow traps in thick ones.
01The mechanism
Tunnelling probability falls exponentially with the ratio of barrier width to the decay length, which the trap depth sets.
02Predictions
- P1Leakage should track the ratio.
- P2Density alone should mispredict.
03Refutation
Leakage tracking trap density would remove the depth term.