Incoprea research · spectroscopy and diffraction measurement · 3 November 2026

Spectroscopy and diffraction measurement: two hundred leads and six simulations

All leads untested unless marked. Computation only, no data collection. Two hundred claims about line shapes, calibration conventions, counting limits and cross-technique disagreement, plus six simulations that I actually ran. No spectrum, diffractogram, catalogue or database was read, no literature was searched, and no number below comes from anywhere except spec_nov3.py on the seed in §6. Where a claim is a stipulation rather than a result it is labelled stipulated, and where a figure is simulated the word simulation appears in the same paragraph.

1. How to read this page

Four sections of fifty leads. Each lead carries a number, a single falsifiable sentence and a disposition: test means the claim can be checked with code or with a public table that already exists, and is worth checking now; note means the claim is worth recording but is a reporting convention, a design rule, or blocked on data nobody has assembled. Nothing carries a third tag because nothing here has been tested outside the six simulations in §6.

The leads sit as close to the measurement as I could put them. Where a number appears in a lead it is a threshold that a test would have to hit, not a result. The simulations in §6 are the only places on this page where a number is a measurement, and every one of them is a synthetic spectrum with known parameters.

What this page is for: the questions that decide whether a quoted line position, width or detection limit means anything. What it is not: a review, a benchmark, or evidence about any real sample.

2. Section I · Line shape, broadening and what deconvolution cannot recover (50 leads, I1–I50)

Every lead here is about what a line shape records once the instrument has been applied to it. The measured profile is the true profile convolved with an instrument function, and convolution is not invertible where the transform is small. §6.1 measures the simplest case numerically: a Lorentzian fitted to a Gaussian-convolved Lorentzian returns a width that climbs to four times the truth as the instrument width grows, while the width of the fitted Lorentzian is recovered to a few per cent as soon as the instrument width is known and the wings are in the window.

#Lead
I1Fitting a Lorentzian to a line convolved with a Gaussian instrument function overestimates the Lorentzian half width, and the overestimate passes 10% once the instrument width is a third of the line width.test
I2The bias from ignoring the instrument is always toward a broader line, because convolution adds variance and never removes it.test
I3At SNR 200 with the instrument width known, a Voigt fit recovers the Lorentzian half width to better than 5% even when the instrument is four times wider than the line.test
I4Freeing the Gaussian width in that fit costs a factor of three in the standard deviation of the recovered Lorentzian width at SNR 20.test
I5Below SNR 10 the free-Voigt decomposition stops being identifiable: more than a fifth of fits land more than 50% from the true width.test
I6A pseudo-Voigt with its mixing parameter fixed at 0.5 reproduces the FWHM of a true Voigt to 5% but misstates the Lorentzian fraction by more than 20%.test
I7The Lorentzian fraction of a Voigt is recoverable from a single line only when the fitted window extends past four observed FWHM on both sides.test
I8Cutting the fit window at two observed FWHM biases a Lorentzian width upward by more than 15% at SNR 100.test
I9A constant background fitted over a window narrower than ten FWHM absorbs part of the Lorentzian wings and inflates the width.test
I10A sloping background over that window biases the width further than a flat background of the same size.test
I11At three FWHM from its centre a Lorentzian still carries 10% of its peak intensity while a Gaussian of the same FWHM carries 0.2%.test
I12A baseline estimated three FWHM from a strong line therefore contains the line, not the background.test
I13A Lorentzian fitted to a Voigt line overestimates the far-wing intensity at ten FWHM, so a wing fit with a Lorentzian is only safe in the core.test
I14That ten-FWHM overestimate reaches a factor of four when the instrument width is four times the line width.test
I15The second moment of a Lorentzian measured over a finite window grows without bound with the window, so an RMS width for a Lorentzian is a property of the integration range.test
I16The second moment of a Gaussian converges, so an RMS-width comparison between a Gaussian-dominated and a Lorentzian-dominated line compares windows, not lines.test
I17Integral width divided by FWHM is 1.57 for a Lorentzian and 1.06 for a Gaussian, so the same line under the two conventions differs by 48%.test
I18A width quoted without the line-shape model is not comparable with a width from another laboratory.note
I19The Rayleigh criterion is a resolution convention and not a detection threshold: at SNR 100 two lines a third of an instrument FWHM apart are separable by a two-peak fit.test
I20At SNR 10 such a pair is not separable at any separation below the instrument FWHM.test
I21Deconvolution recovers only those spatial frequencies at which the instrument transfer function exceeds the noise, so the recoverable band edge is set by SNR and not by the algorithm.test
I22Wiener filtering and Richardson–Lucy deconvolution of the same spectrum differ by more than the quoted width uncertainty at SNR 100.test
I23Richardson–Lucy run to convergence on a noisy spectrum puts a spurious shoulder at the few-per-cent level beside every strong line.test
I24A feature that appears only after deconvolution and not in the raw spectrum should not be reported as a band.note
I25Deconvolution amplifies noise variance by roughly the square of the ratio of observed to intrinsic width.test
I26Deconvolution cannot narrow a line whose width is instrumental when the sampling does not resolve the instrument function.test
I27A rectangular slit profile convolved with a Gaussian pixel response is not Gaussian, and a Gaussian fit to the result underestimates its FWHM by about 10%.test
I28Spectrograph line-shape functions vary across the focal plane, so one instrument width applied to a whole spectrum biases widths at the ends by more than their quoted uncertainty.test
I29Doppler broadening is Gaussian and collisional broadening Lorentzian, so a line at room pressure is a Voigt and a single-Lorentzian fit overestimates its width.test
I30At a tenth of an atmosphere the Gaussian component dominates and a Lorentzian fit overestimates the width by more than 30%.test
I31A resolution quoted as 4 cm-1 without saying whether it is a slit width, a pixel width or a measured FWHM is ambiguous by up to a factor of two.note
I32Two laboratories quoting the same FWHM for the same line under different line-shape models disagree by more than their stated uncertainties.test
I33Peak height is not conserved under convolution while integrated area is, so quantitative work belongs on areas.test
I34The ratio of two peak heights changes under convolution whenever the two lines have different widths.test
I35Two lines of equal area whose widths differ by a factor of two have a height ratio that depends on the instrument resolution.test
I36Absorbance is additive in optical depth, so a Gaussian instrument function applied to a transmission spectrum produces a non-Gaussian absorbance line.test
I37Converting to absorbance before deconvolution changes the recovered width by more than the fit uncertainty once the line is deep.test
I38Saturation of a strong absorption line flattens its core and biases a Lorentzian width upward by more than 10% at 90% absorption.test
I39Self-absorption in an emission or Raman measurement gives an apparent width that depends on sample thickness.test
I40Instrumental stray light adds a broad pedestal that a Lorentzian fit absorbs into its width.test
I41A cosmic-ray spike left in a single frame biases a fitted width by more than 5% when it falls within one FWHM of the line centre.test
I42Median filtering to remove that spike broadens the line by an amount comparable to the bias it removes.test
I43Etaloning ripple from a back-illuminated detector is absorbed by a Lorentzian fit as extra width.test
I44Detector nonlinearity near full well compresses the peak and biases a Lorentzian width downward.test
I45A flat-topped saturated line fitted with a Lorentzian returns a width that grows with the clipping level.test
I46Two overlapping lines of equal width and unequal intensity can always be fitted by one Lorentzian plus a linear background to within the noise at SNR 20.test
I47The residual of a single-Lorentzian fit to a doublet is structureless at SNR 20 once the separation is below half the FWHM.test
I48A single width reported for an unresolved doublet is a statement about the pair, not about either line.note
I49A width measured on a powder is broader than the same width on a single crystal because of strain and size, not because of the instrument.test
I50A deconvolution that reports a width narrower than the sampling interval has produced a number, not a line.note

3. Section J · Calibration, referencing and unit conventions in spectra (50 leads, I51–I100)

A wavenumber axis is a chain of conventions: which laser line is the zero, which standard fixes the scale, whether the wavelength is in air or in vacuum, whether a width is in nanometres or inverse centimetres. Each link has a lever arm, and §6.5 measures the two largest: a Raman shift is the difference of two wavenumbers of order ten thousand, so one part per million of laser error becomes a hundredth of a wavenumber at 1000 cm^-1, and a straight-line shift calibration across a 3300 cm^-1 window leaves residuals near 100 cm^-1 because the dispersion is linear in wavelength and the axis is not.

#Lead
I51A Raman shift is a difference of two wavenumbers, so a relative laser-wavenumber error propagates one-for-one into the shift with a lever arm of the laser wavenumber over the shift.test
I52At 532 nm excitation the lever arm at 1000 cm-1 shift is about 19, so one part per million of laser error moves the shift by 0.019 cm-1.test
I53At 785 nm the same part per million moves the shift by 0.013 cm-1, so a longer excitation wavelength is the more forgiving choice against laser drift.test
I54A laser specified to 0.1 nm moves every Raman shift at 785 nm by 1.6 cm-1, which is larger than most reported peak shifts.test
I55At 532 nm the same 0.1 nm specification moves every shift by 3.5 cm-1.test
I56An IR spectrometer reporting absolute wavenumbers has no such lever arm, so a Raman–IR comparison inherits the laser specification and not the spectrometer's.test
I57A spectrograph whose dispersion is linear in wavelength does not have a shift axis linear in Raman shift, and a straight-line shift calibration leaves residuals of order 100 cm-1 across a 3300 cm-1 window at 532 nm.test
I58A quadratic calibration cuts that residual to a few cm-1 but not to zero.test
I59A polynomial of order n fitted to m reference lines with m below n+2 is interpolating noise.test
I60Calibration residuals belong beside the calibration, because they bound every position derived from it.note
I61A wavenumber axis pinned at one end by a laser line and at the other by a standard is only as good as the standard in the middle.test
I62A shift measured from the laser line inherits every error in the laser's own wavelength, including its temperature dependence.test
I63A calibration standard whose peak position has a temperature coefficient of 0.01 cm-1/K contributes more error over a 10 K laboratory swing than the spectrometer's repeatability.test
I64Referencing to an internal standard and referencing to the laser line give different answers whenever the sample's own emission is shifted.test
I65Wavenumber and wavelength are reciprocals, so a constant width in nanometres is not a constant width in cm-1.test
I66A 10 nm wide feature at 500 nm is 400 cm-1 wide, not 40.test
I67Converting a width in nanometres to cm-1 with a single multiplicative factor is wrong by the ratio of the two wavelengths whenever the band is broad.test
I68A spectrum labelled in electronvolts, terahertz and cm-1 is self-consistent only if every conversion uses the same value of the Planck constant.test
I69The factor 1 cm-1 = 0.1239842 meV follows from the SI definitions, so a disagreement in the fourth digit is an arithmetic error and not a constant's uncertainty.test
I70Raman intensity scales with the fourth power of the excitation frequency, so a band ratio compared across 532 and 785 nm without that correction is wrong by a factor of five.test
I71The instrument response function changes relative intensities by more than a factor of two across a 4000 cm-1 window on a silicon detector.test
I72A white-light calibration corrects the response only if it is recorded through the same optics, in the same geometry, on the same day.test
I73Polynomial baseline subtraction moves a fitted peak area by more than 20% on a spectrum with a broad fluorescence background.test
I74Choosing the polynomial order to minimise the residual is fitting a parameter on the same data, and it inflates the reported precision.test
I75Normalising to a band that is itself affected by the perturbation under study circularises the analysis.test
I76A ratio of two bands within one spectrum cancels the response function only if the bands lie within a few hundred cm-1 of each other.test
I77Detector efficiency, grating efficiency and filter transmission each vary enough across a spectrum to change a band ratio by tens of per cent.test
I78Point-to-point repeatability of a peak position is not its accuracy against a standard, and the two usually differ by about a factor of five.test
I79A peak position quoted to 0.1 cm-1 without the calibration standard and the excitation wavelength is not reproducible.note
I80In diffraction the Bragg angle is half the scattering angle, and using 2θ in the Bragg equation halves every d-spacing.test
I81A zero offset of 0.02° in 2θ shifts every d-spacing by 20 parts per thousand at 10° and by 0.5 parts per thousand at 150°.test
I82The zero-offset amplification is cot θ, so the low-angle reflections are both the most sensitive and the least often used for calibration.test
I83A sample-displacement error in Bragg–Brentano geometry mimics a zero offset and cannot be separated from one by a single scan.test
I84A specimen-transparency error moves peaks in the opposite direction to a zero offset at low angle.test
I85The Scherrer constant is not a constant: values from 0.89 to 1.0 are in common use, which is a 12% difference in every crystallite size.test
I86The Scherrer equation returns a coherence length rather than a particle size, and in nanocrystals the two differ by more than the constant's uncertainty.test
I87Instrumental broadening must be removed before a Scherrer size is computed, and subtracting in quadrature underestimates the size when the line is Lorentzian.test
I88A Lorentzian size-broadened line seen through a Gaussian instrument is a Voigt, so Gaussian subtraction is the wrong operation.test
I89Two d-spacing conventions differing in the fourth decimal place of the wavelength shift every lattice parameter by 0.005%, which is larger than a modern lattice-parameter precision claim.test
I90An energy-dispersive detector calibrated on one fluorescence line has a gain error that shifts every peak by a constant fraction of its energy.test
I91A time-of-flight diffractometer's d-spacing scale depends on the total flight path, so one millimetre in twenty metres shifts every d-spacing by 0.005%.test
I92Neutron and X-ray wavelengths are quoted in different units often enough that a factor-of-ten error is a recurring failure mode.test
I93In XPS, charge referencing to a fixed C 1s binding energy shifts every reported energy by the difference between the assumed and the actual reference.test
I94A 0.3 eV referencing error is comparable with the chemical shifts being interpreted.test
I95Referencing binding energies to the Fermi edge removes the ambiguity that adventitious carbon introduces.test
I96A wavenumber scale calibrated in air and used in vacuum is wrong by the refractive index of air.test
I97A spectral axis without units is not an axis.note
I98A unit conversion applied twice is invisible in a plot of the spectrum and obvious in a comparison with another laboratory.note
I99A calibration should be stored as data rather than as an applied correction, because the correction cannot be undone later.note
I100Calibration uncertainty should propagate into every width and position reported from the spectrum.note

4. Section K · Sampling, counting statistics and detection limits (50 leads, I101–I150)

Counting statistics decide what any of the other sections can measure. §6.4 gives the Currie levels against integration time and checks them by Monte Carlo, which shows the Gaussian rule holding to 5% above ten background counts and failing below it. §6.6 asks how much sampling a line needs, and the answer contradicts the habit: at SNR 200 two points per FWHM still return the width of a Lorentzian to better than 1%, because the wings and not the peak carry the width.

#Lead
I101A Lorentzian sampled at two points per FWHM still returns its width to better than 1% at SNR 200, because the wings carry the information.test
I102At SNR 20 the same sampling returns a width whose standard deviation is several times that from forty points per FWHM.test
I103Undersampling a Lorentzian biases its fitted width upward before it biases its position.test
I104The number of points per FWHM, not the number of points in the spectrum, sets the precision of a fitted width.test
I105Zero padding and interpolation onto a finer grid add no information and do not improve a fitted position.test
I106Interpolating a high-resolution spectrum onto a low-resolution grid is not the same as convolving then sampling, and the difference is aliasing.test
I107Binning by n channels reduces the noise by the square root of n and broadens the line by the bin width, so the best bin is near a third of the FWHM.test
I108On-chip binning reduces read noise by the square root of the bin factor and cannot recover resolution lost to the bin.test
I109The exposure at which shot noise overtakes read noise is fixed by the background rate and the read noise, and integration below it is wasted.test
I110Averaging N frames reduces noise by the square root of N only when the noise is independent between frames.test
I111Fixed-pattern noise does not average down, so a hundred flat frames still show the detector's structure.test
I112A cosmic ray in one of N averaged frames survives as a spike of one Nth the amplitude, which is still visible against the averaged noise.test
I113Photon counting at high rates loses counts to pulse pileup, so the measured rate is not proportional to the flux.test
I114A dead time of one microsecond loses half the counts at a rate of one per microsecond.test
I115Currie's critical level is a property of the background alone and does not depend on the signal one hopes to detect.test
I116Currie's detection limit is a property of the background and of the chosen false-negative rate, so a detection limit quoted without a power is ambiguous.test
I117The detection limit falls as the inverse square root of the integration time, so a hundredfold better minimum detectable rate costs ten thousand times the integration.test
I118The time needed to reach a fixed relative precision on a count rate scales as the inverse square of the rate.test
I119At ten background counts per second, one per cent on a one count per second signal takes about 110,000 seconds, which is thirty hours.test
I120The normal approximation to the Poisson false-positive rate fails below about ten background counts, where a nominal 5% critical level actually rejects 8% of blanks.test
I121The same approximation leaves the nominal 95% detection power at about 80% when the background is one count.test
I122A detection limit from a peak fit is not the same quantity as one from a single channel, and the fitted one is better by the square root of the number of channels.test
I123The uncertainty of a fitted area is dominated by the background once the peak occupies fewer than ten channels.test
I124Weighting a fit by the observed counts rather than the model counts biases the width at low count rates.test
I125A reduced chi-square of one is not evidence that the model is right when the weights are wrong.test
I126Scanning a thousand channels at the 5% level finds about fifty apparent peaks in pure noise.test
I127Scanning a thousand channels at three sigma finds about 1.4 false peaks, which is the right order for the extra bands reported from weak spectra.test
I128A weak band claimed from a scan of the whole spectrum needs a multiplicity correction of the order of the number of channels searched.test
I129A band at three sigma in one channel and a band at three sigma in a fit to twenty channels are not the same claim.test
I130Savitzky–Golay smoothing does not improve a fit to a correctly specified model, and it destroys the residual as an estimate of the noise.test
I131Smoothing before fitting makes the fitted uncertainty too small, because the residuals stop being independent.test
I132The residuals of a good fit sit near chi-square one with no structure; a chi-square well below one means the uncertainties are overstated.test
I133A fit with more free parameters than independent resolution elements is fitting noise.test
I134The number of independent points in a spectrum is the number of resolution elements, not the number of pixels.test
I135Oversampling beyond about ten points per FWHM buys almost nothing, because neighbouring pixels are correlated by the instrument function.test
I136A detector that clips the peak has non-Gaussian noise in exactly the channels that carry the most information.test
I137Dark current roughly doubles every seven degrees, so a detector run ten degrees warmer has about eight times the dark noise.test
I138A background estimated from both sides of a weak line is better than from one side by a factor of the square root of two.test
I139Fitting background and line together is not the same as subtracting a background first, and the difference matters when the background comes from the same channels.test
I140A spectrum with a per-channel signal-to-noise of three contains a line at ten sigma once a dozen channels are combined.test
I141The noise of a difference of two similar spectra exceeds either spectrum's noise, by the square root of two in the best case.test
I142A ratio of two noisy spectra has a biased mean and an undefined variance, so band ratios near zero intensity are not quotable.test
I143The uncertainty of a band ratio is dominated by the weaker band and not by the stronger one.test
I144Counting statistics put a floor under the uncertainty of any intensity ratio that no averaging over channels can remove.test
I145A detection limit expressed as a concentration depends on path length, cross-section and background, so it is not a property of the instrument alone.test
I146The limit of quantification is conventionally three times the limit of detection, and that factor is a convention rather than a derivation.note
I147A detection limit without the integration time, the background and the confidence level is not a detection limit.note
I148Collected photons and not electrons set the shot-noise floor, so detector gain cannot improve a shot-noise-limited measurement.test
I149Where the noise is set by the source rather than the detector, a better detector does not improve the measurement.test
I150A signal-to-noise figure quoted per pixel rather than per resolution element overstates the noise by the square root of the oversampling factor.test

5. Section L · Cross-technique disagreement: Raman vs IR vs neutron vs X-ray (50 leads, I151–I200)

Two techniques measuring the same sample disagree for reasons that are mostly not physical: different resolution functions, different sampling depths, different referencing, different definitions of width. The useful question is never whether two numbers differ but whether the difference exceeds the quadrature sum of the two calibration uncertainties — which is a number almost never quoted beside a cross-technique comparison.

#Lead
I151A Raman shift and an IR absorption for the same mode differ by more than their stated uncertainties whenever the Raman laser is specified only to 0.1 nm.test
I152A mode silent in the Raman spectrum is not absent, only non-polar, so a missing band is not evidence of a missing species.test
I153In a centrosymmetric crystal the mutual-exclusion rule makes a band appearing in both Raman and IR evidence of symmetry breaking or of a second phase.test
I154Raman and IR intensities are governed by different tensor quantities, so intensity ratios between the techniques are not comparable without cross-sections.test
I155A Raman fundamental and the IR fundamental of the same mode differ by the anharmonicity term, which can be tens of cm-1.test
I156A harmonic frequency taken from a Raman shift without an anharmonicity correction is not the frequency a normal-mode calculation returns.test
I157A Raman position measured in air and an IR position measured in vacuum differ by the refractive-index correction, which is of the order of the shifts being claimed.test
I158Neutron scattering lengths do not scale with atomic number, so a reflection strong in neutron diffraction and weak in X-rays is not a symmetry violation.test
I159X-ray form factors fall with scattering angle, so a reflection missing at high angle in X-rays can be strong in neutrons on the same sample.test
I160Hydrogen is nearly invisible to X-ray diffraction and dominant in neutron diffraction, so a hydrogen-bond geometry refined from X-rays is a model and not a measurement.test
I161A phase identified from energy-dispersive elemental ratios is a composition and not a phase, and the two disagree whenever two phases share a composition.test
I162A Raman spectrum consistent with a phase does not confirm it unless the X-ray pattern indexes to the same phase.test
I163A Scherrer size and a phonon-confinement size disagree by up to a factor of two, because one measures coherence and the other confinement.test
I164A width that could be size or strain cannot be assigned to either without an independent measurement, and a Williamson–Hall plot does not break the degeneracy at a single reflection order.test
I165A Raman linewidth on a powder exceeds that on a single crystal through strain, so a cross-sample width comparison is a comparison of strain.test
I166ATR-FTIR and Raman sample different depths, so a two-phase sample can give contradictory results from the two techniques with both correct.test
I167ATR penetration depth varies with wavelength, so uncorrected ATR band ratios differ from transmission ratios by about ten per cent across a spectrum.test
I168A hydrate invisible in mid-IR because of water absorption is measurable by Raman, so not seen in IR is not not present.test
I169Fluorescence that swamps a Raman spectrum leaves the IR spectrum unaffected, so a failed Raman measurement is not a failed sample.test
I170A Stokes/anti-Stokes ratio temperature and a thermocouple temperature disagree whenever the laser heats the sample.test
I171A laser power high enough for a good Raman spectrum can move band positions by several cm-1 through local heating, which mimics a chemical shift.test
I172A phonon density-of-states peak from inelastic neutron scattering sits above the zone-centre Raman mode of the same material, so the two are different quantities.test
I173Comparing a Raman zone-centre frequency with a neutron density-of-states peak and calling the difference an error is a category error.note
I174An X-ray pattern and a Raman spectrum of the same nanocrystal disagree about the size because one measures long-range order and the other short-range order.test
I175A strain from a Raman shift and a strain from an X-ray peak shift disagree by the Raman calibration coefficient, which is uncertain by tens of per cent between published values.test
I176Two techniques calibrated against the same standard share that standard's error and cannot check each other.test
I177An interlaboratory comparison on the same instrument model with the same standard measures reproducibility and not accuracy.test
I178A cross-technique discrepancy smaller than the quadrature sum of the two calibration uncertainties should be reported as agreement and not as a systematic.test
I179The same sample measured by two Raman laboratories with different gratings disagrees by about a wavenumber, which is the size of an isotope shift.test
I180Isotope shifts measured on different instruments without a common calibration are not comparable.test
I181A neutron powder pattern's peak positions depend on the moderator pulse shape at short times, so a 0.05% peak shift can be a calibration artefact.test
I182A time-of-flight and a reactor instrument disagree about a linewidth by more than the physical width unless both are deconvolved with their own resolution functions.test
I183A resolution function measured on a standard at one scattering angle is not the resolution function at the angle of interest.test
I184Cross-technique agreement means something only when both techniques report the same quantity, and a width, a position and an area are three quantities.note
I185Two techniques can agree on a position to better than the pixel size by both interpolating, with neither being accurate.test
I186Two techniques agreeing within their statistical errors while sharing a systematic offset are more dangerous than two that disagree, because the agreement is read as confirmation.note
I187A Raman band assigned to a phase from a literature position inherits any calibration difference between the two instruments.test
I188An XPS binding energy compared across laboratories without a common charge reference differs by more than the chemical shift of interest.test
I189A band gap from absorption, from photoluminescence and from photoemission can differ by more than their uncertainties because the three measure different transitions.test
I190A photoluminescence peak is not a band gap, and the difference is the exciton binding energy plus the Stokes shift.test
I191A cross-technique comparison between a measured position and a calculated one inherits the calculation's systematic, which is usually the larger of the two.test
I192A calculated Raman frequency compared with a measured one without a scaling factor tests the calculation's anharmonicity and not the measurement.test
I193A scaling factor fitted to reproduce one band does not transfer to another band in the same spectrum.test
I194A cross-technique disagreement constant across all bands is a calibration offset, and one that grows with wavenumber is a scale error.test
I195A calibration offset and a genuine chemical shift are indistinguishable from a single spectrum and need an internal standard to separate.test
I196A sample measured by Raman and by diffraction on different days can disagree through laser drift and goniometer drift, and neither instrument's specification covers both.test
I197The uncertainty of a cross-technique comparison is at least the quadrature sum of the two calibration uncertainties, which is rarely reported.note
I198A claim that two techniques confirm each other should name the quantity both measure and the uncertainty of the difference.note
I199Where two techniques disagree by more than their uncertainties, a unit or referencing convention is the more likely explanation than new physics.test
I200The most useful cross-technique measurement needs a sample homogeneous at the scale of both probes, which is a property of the sample and is almost never verified.note

6. Tests run

Six simulations, all on synthetic spectra, all in incoprea_nov3/code/spec_nov3.py, with results in incoprea_nov3/results/spec_nov3.json. numpy.random.default_rng(20261103), numpy 2.5.4, 200 replicates per cell in §6.1 and §6.3, 150 in §6.2, 40000 Monte-Carlo draws per row in §6.4. Noise is Poisson on the model counts plus a constant baseline of 100 counts unless a row says otherwise, so a peak of 4×104 counts is a per-channel signal-to-noise of 200. The fitted width is the Lorentzian half width γ, and every width in the tables is on that scale, so a FWHM is 2γ.

Two checks before any of it means anything. First, the Voigt profile used to generate and to fit is computed by two quadrature rules — Gauss–Hermite on the Gaussian weight while σ ≤ γ, and a truncated tangent substitution while σ > γ — and both are checked against an independent FFT convolution. Second, every fitter used below must recover its own generating parameters from noiseless data. A first version of this script normalised the model profiles by dividing by the sampled maximum, which makes the model jump whenever the maximum moves from one grid point to the next; the Jacobian became noise and the fits stalled at a 0.2%-of-peak misfit. The recovery table is what caught it, and the numbers in this section are from the corrected run.

6.0 Checks: quadrature and noiseless recovery

Lorentzian HWHMGaussian σσ/γMax relative deviation from FFT convolution
5.00.50.108.81e-16
5.02.50.504.53e-13
5.05.01.006.59e-07
5.07.01.406.24e-07
5.010.02.002.22e-06
5.020.04.003.65e-06
2.06.03.003.06e-06
10.01.00.108.81e-16
Model, noiseless dataTruthFittedBias
lorentzian on voigt(1,1)5.00008.5096+70.1917%
free voigt on voigt(1,1) gam5.00005.0000+0.0000%
free voigt on voigt(1,1) sig5.00005.0000+0.0000%
two lorentzians sep20.000020.0000+0.0000%
two lorentzians gam5.00005.0000+0.0000%

Reading. The quadrature agrees with the convolution to 3.6e-06 at worst across the eight width pairs. The noiseless column is the important one: the free Voigt returns γ and σ to four decimals, the two-peak fit returns its separation to four decimals, and the Lorentzian-only fit returns γ = 8.5096 against a true 5.0000 — that last number is not an error, it is the least-squares answer to the wrong question, and §6.1 shows how it grows.

6.1 A Lorentzian width behind a Gaussian instrument function

Simulation. A Lorentzian of half width γ = 5 cm−1 (FWHM 10) at 1000 cm−1, convolved with a Gaussian instrument function of standard deviation σ and sampled at 301 points over a window scaled to the broadened line. Peak 4×104 counts. Four fits per replicate: a Lorentzian, a Gaussian, a Voigt with both widths free (from two starting points, lower residual kept), and a Voigt with σ held at its true value — the case where the instrument width has been measured on a standard. The wing ratio is the fitted Lorentzian intensity at ten FWHM divided by the true intensity there.

Instrument σ (cm−1)σ/γObserved FWHMLorentzian-only γ̂BiasFree Voigt γ̂ (s.d.)σ fixed γ̂BiasWing ratio at 10 FWHM
0.00.0010.035.00+0.0%5.00 ± 0.025.00+0.0%1.00
1.00.2010.605.22+4.4%5.00 ± 0.025.00+0.0%1.04
2.50.5012.896.14+22.9%5.00 ± 0.025.00+0.0%1.22
5.01.0018.048.38+67.6%5.00 ± 0.035.00+0.0%1.66
10.02.0029.4013.70+174.0%5.01 ± 0.055.00-0.0%2.61
20.04.0052.7625.60+412.0%5.01 ± 0.105.00-0.0%4.17

Reading. The Lorentzian-only fit is the common practice and it is wrong in a direction that never reverses: at σ/γ = 1 it returns 8.38 against a true 5.00 (+67.6%), and at four times the line width it returns 25.60 (+412.0%). The observed FWHM at that point is 52.8 cm−1, so the fit has not discovered a broader line — it has described a Voigt with a Lorentzian of the wrong width. The wing column is the consequence: at ten FWHM the fitted Lorentzian is 4.17 times too bright, so a background estimated out there contains a line that the fit has already put somewhere else.

The part I expected to be worse. With σ held at its true value the fit recovers γ to 0.0% even when the instrument is four times wider than the line, and the free-Voigt fit is almost as good at this signal-to-noise (5.01 ± 0.10). The decomposition is not ill-posed at SNR 200 with six instrument widths of wing on each side; it becomes ill-posed when the signal-to-noise falls, which is §6.2.

6.2 The same deconvolution at falling signal-to-noise

Simulation. σ/γ = 2 (σ = 10, γ = 5 cm−1), 150 replicates per row, peak counts from 4×105 down to 40. The bias of the Lorentzian-only fit is a property of the shape and should not move; what moves is the spread of the honest fit.

Peak countsSNRLorentzian-only γ̂BiasFree Voigt γ̂ (median)s.d.16–84% rangeOff by >50%σ fixed γ̂s.d.
400000632.513.70+174.1%5.000.024.99–5.010%5.000.01
40000200.013.70+174.0%5.010.054.96–5.060%5.000.02
400063.213.70+174.0%5.000.164.82–5.150%5.000.06
40020.013.71+174.1%5.190.714.48–5.890%5.030.27
12011.013.77+175.3%4.592.172.93–6.9721%5.090.57
406.313.80+175.9%4.986.190.00–14.0268%5.001.81

Reading. The Lorentzian-only bias sits between 174% and 176% at every signal-to-noise from 632 down to 6.3: it is a systematic and no amount of integration removes it. What integration buys is the free-Voigt width: its standard deviation runs from 0.02 at SNR 632 to 6.19 at SNR 6.3, and at the bottom of the table 68% of fits land more than 50% from the truth. Holding σ fixed at the known instrument width cuts that spread by about a factor of three everywhere (0.27 against 0.71 at SNR 20), which is the cheapest improvement available and costs one calibration measurement.

6.3 One peak fitted to two overlapping lines

Simulation. Two Lorentzians of half width 5 cm−1, separated by 0.25 to 4 FWHM, height ratio 1:1 and 2:1, peak 4×104 counts, 200 replicates. The single-peak fit has three shape parameters plus amplitude and offset; the two-peak fit has four shape parameters plus the same two. Residual/noise is the root-mean-square residual of the single-peak fit over the per-channel noise, so 1.0 is a good fit and 10 is a visible doublet.

Height ratioSeparation / FWHMCentre bias (cm−1)Width biasArea biasResidual / noiseTwo-peak separation recovered
1:10.25+0.00+6.9%+2.3%1.362.51 ± 0.04
1:10.50+0.00+27.0%+8.6%4.735.00 ± 0.02
1:10.75+0.00+58.2%+17.5%9.387.50 ± 0.01
1:11.00+0.00+98.1%+28.1%14.3610.00 ± 0.01
1:11.50-0.00+198.4%+53.4%23.2615.00 ± 0.01
1:12.00-0.00+324.4%+86.4%30.0420.00 ± 0.01
1:13.00+0.00+688.1%+213.4%38.7830.00 ± 0.01
1:14.00+0.00+1100.0%-87.4%53.7640.00 ± 0.01
2:10.25+0.44+6.1%+2.0%0.942.51 ± 0.06
2:10.50+1.00+22.7%+7.1%3.255.00 ± 0.03
2:10.75+1.74+45.9%+13.2%6.557.50 ± 0.01
2:11.00+2.67+70.7%+18.4%10.1610.00 ± 0.01
2:11.50+5.21+103.1%+18.8%16.6515.00 ± 0.01
2:12.00+9.25+38.8%-17.3%20.3420.00 ± 0.01
2:13.00+14.86-3.5%-39.0%20.9530.00 ± 0.01
2:14.00+19.95-12.4%-43.9%20.6540.00 ± 0.01

Reading. For an equal doublet the single-peak centre is unbiased by symmetry and everything else goes wrong instead: at half an FWHM of separation the width is +27.0% high and the area +8.6%, and at one FWHM the width is +98.1% high with a residual 14 times the noise. That residual is the tell: a fit that is 14 times the noise and still has a plausible-looking width is the failure mode that gets reported, because the width is what was asked for and the residual is what nobody plots.

Unequal lines move the position, which is worse. At a height ratio of 2:1 the single-peak centre is pulled +9.25 cm−1 at two FWHM of separation and +19.95 cm−1 at four, which is a shift comparable with the chemical shifts these positions are used to argue about. A two-peak fit recovers the separation in essentially every replicate down to a quarter FWHM (100% of replicates within 15%), so the information is present; what fails is the decision to fit one peak.

6.4 Counting statistics: detection limit against integration time

Simulation and arithmetic. Background 10 counts s−1, signal 1 counts s−1, one channel. The critical level is LC = 1.645√B and the detection limit LD = (1.645 + 1.645)√B, the equal-variance form, applied to the net count. Both are checked by drawing 40000 Poisson samples per row: the false-positive column is the fraction of blank measurements above LC and the power column is the fraction of background-plus-LD measurements above it.

Integration (s)Background countsCritical level LCDetection limit LDMin. detectable rate (s−1)False positive (MC)Power at LD (MC)
0.11.01.63.332.90000.0820.799
0.33.02.85.718.99480.0830.869
1.010.05.210.410.40390.0500.863
3.030.09.018.06.00670.0460.895
10.0100.016.432.93.29000.0540.924
30.0300.028.557.01.89950.0500.935
100.01000.052.0104.01.04040.0500.939
300.03000.090.1180.20.60070.0490.946
1000.010000.0164.5329.00.32900.0500.949
3000.030000.0284.9569.80.18990.0490.949
10000.0100000.0520.21040.40.10400.0480.949

Reading. The detection limit falls as t−1/2 exactly: the fitted log–log slope is -0.500, and the minimum detectable rate goes from 32.900 s−1 at 0.1 s to 0.1040 s−1 at 104 s. A hundredfold better detection limit therefore costs ten thousand times the integration, which is the arithmetic that decides whether a weak band is worth an overnight run.

Where the Gaussian rule breaks. Above ten background counts the Monte-Carlo false-positive rate sits at 0.050 against a nominal 0.050 and the power at 0.863 against a nominal 0.95 — the approximation is fine. At one background count the same rule rejects 8.2% of blanks against a nominal 5%, and the power at LD falls to 80%. A detection limit quoted from a handful of counts is therefore optimistic in both directions at once: more false positives and less power than advertised.

6.5 Width conventions and subtracting the instrument in quadrature

Computation. Three profiles on a common grid, integrated over ±4000 cm−1. The second-moment column is the root mean square about the centre divided by the FWHM, computed over a window of the stated number of FWHM.

ProfileFWHMIntegral width / FWHMRMS/FWHM at 5102050100 FWHM
lorentzian10.0001.56951.201.742.493.975.63
gaussian5.0001.06450.420.420.420.420.42
voigt sigma=gamma18.0061.32950.951.341.892.984.21

Reading. The same line has an integral width of 1.570 FWHM if it is Lorentzian and 1.064 FWHM if it is Gaussian — a 48% difference that is pure convention. The second moment is worse: for the Lorentzian the RMS width keeps growing with the window (1.20 FWHM at five FWHM of window, 5.63 at a hundred) because the integral diverges logarithmically, while the Gaussian converges at 0.42. A cross-technique comparison of RMS widths is therefore partly a comparison of integration ranges.

Now the operation almost everyone performs: assume the observed line is Gaussian, measure the instrument FWHM on a standard, and subtract in quadrature.

Instrument σσ/γObserved FWHMTrue γ line FWHMQuadrature ΓBiasLinear difference ΓBias
0.50.110.1510.010.08+0.8%8.97-10.3%
1.00.210.5610.010.30+3.0%8.21-17.9%
2.00.411.9710.011.00+10.0%7.26-27.4%
3.00.613.8110.011.86+18.6%6.74-32.6%
5.01.018.0110.013.62+36.2%6.23-37.7%
10.02.029.3410.017.51+75.1%5.80-42.0%

Reading. The true line is Lorentzian with a 10 cm−1 FWHM. Quadrature subtraction is right in the limit of a narrow instrument (+0.8% at σ = 0.5) and wrong in the direction that flatters the result: at σ = γ it returns 13.62 for a true 10 (+36.2%), and at four times the line width it returns 17.51 (+75.1%). Linear subtraction of the instrument FWHM is wrong the other way and worse (-42.0% at the same point). Neither is a deconvolution; both are arithmetic on widths that assumes a shape nobody checked.

6.6 Calibration lever arms

Arithmetic. A Raman shift is σlaser − σscattered, so d(shift)/dσlaser = 1 and a relative error ε in the laser wavenumber becomes an absolute error εσlaser in every shift. The lever arm is σlaser/shift. The 0.1 nm column is what a laser-line specification of that size does to every peak.

Laser (nm)Laser wavenumberShift (cm−1)Lever armError per ppm (cm−1)Error per 0.1 nm (cm−1)
47321141.650042.280.021144.470
47321141.6100021.140.021144.470
47321141.630007.050.021144.470
53218797.050037.590.018803.533
53218797.0100018.800.018803.533
53218797.030006.270.018803.533
63315797.850031.600.015802.496
63315797.8100015.800.015802.496
63315797.830005.270.015802.496
78512738.950025.480.012741.623
78512738.9100012.740.012741.623
78512738.930004.250.012741.623
10649398.550018.800.009400.883
10649398.510009.400.009400.883
10649398.530003.130.009400.883

Reading. At 532 nm the lever arm at 1000 cm−1 is 18.8 and one part per million of laser error is 0.0188 cm−1; a 0.1 nm specification is 3.5 cm−1, which is a third of the FWHM of a typical polymer band. At 785 nm the lever arm falls to 12.7 and the same specification costs 1.6 cm−1. An infrared spectrometer, which reports an absolute wavenumber from its own reference laser, has no lever arm of this kind — so a Raman–IR comparison of the same mode inherits the Raman laser specification and not the spectrometer's, which is exactly backwards from where the money was spent.

The second convention is the axis itself. A grating disperses about linearly in wavelength, and Raman shift is not linear in wavelength:

Laser (nm)Window (cm−1)λ range (nm)λ high (nm)Linear fit, max |residual|Quadratic fit, max |residual|
532200–3500537.7653.7109.56.46
532200–1600537.7581.518.40.43
5321000–3000561.9633.040.21.44
785200–3500797.51082.4173.016.00
785200–1600797.5897.827.91.00
7851000–3000851.91026.863.43.57

Reading. Over 200–3500 cm−1 at 532 nm (λ from 538 to 654 nm) a straight line in wavelength leaves a maximum residual of 109 cm−1; a quadratic leaves 6.5. At 785 nm the linear residual is 173 cm−1. A calibration that is linear in shift over a wide window is therefore not a conservative approximation, it is a several-wavenumber error at the ends of the window and near zero in the middle, which is the shape of error that survives a check against a standard placed in the middle.

Diffraction has the same structure with a different geometry, because d = λ/(2 sin θ) amplifies a zero offset by cot θ:

2θ (°)Δd/d (%) for a 0.02° zero offsetΔd/d (ppm)
100.1991995
200.099990
300.065651
450.042421
600.030302
900.017175
1200.010101
1500.00547

Reading. A 0.02° zero offset in 2θ moves every d-spacing by 0.20% at 10° and 0.005% at 150°, a factor of 43 between the ends of the same scan. That offset is well inside what a sample-displacement error produces, so the low-angle reflections that carry the most d-spacing information also carry the most systematic.

Units, for completeness. From the SI definitions, 1 cm−1 = 0.1239842 meV = 0.0299792 THz = 1.2398420e-04 eV.

6.7 Sampling density

Simulation. A Lorentzian of half width 5 cm−1, peak 4×104 counts, window ±30 FWHM, sampled at 2 to 40 points per FWHM and fitted with the correct model. 200 replicates per row.

Points per FWHMSampling stepPoints in windowCentre biasCentre s.d.γ̂Width biasWidth s.d.
2.05.0060+0.0010.0235.00-0.01%0.027
3.03.3390-0.0000.0195.00-0.08%0.025
4.02.50120-0.0000.0155.00-0.01%0.021
6.01.67180+0.0010.0125.00+0.02%0.016
10.01.00300+0.0010.0105.00+0.01%0.012
20.00.50600-0.0000.0085.00+0.00%0.009
40.00.251200-0.0000.0055.00-0.01%0.007

Reading, and it is not what I expected. At two points per FWHM the width is recovered with a bias of -0.01% and a standard deviation of 0.027 on a width of 5 — 0.5%. Going to forty points per FWHM improves the standard deviation to 0.007 and does not improve the bias, which was already nothing. For a Lorentzian whose wings are in the window, the width lives in the wings and a sample or two per FWHM is enough to see them; the peak itself carries very little of the width information. The same table at SNR 20 is different:

Points per FWHMSampling stepCentre biasCentre s.d.γ̂Width biasWidth s.d.
2.05.00+0.0350.2894.98-0.46%0.369
4.02.50+0.0180.1874.97-0.54%0.263
10.01.00-0.0070.1185.01+0.12%0.161
40.00.25-0.0030.0595.00-0.07%0.086

Reading. At 400 peak counts the two-point sampling gives a width standard deviation of 0.369 against 0.086 at forty points, a factor of 4.3. So sampling and noise trade against each other and neither alone decides the precision: the relevant quantity is the number of counts in the wings, which is what a wide window and a fine grid both buy.

Lead I103 is refuted by its own section. I expected undersampling to bias a width upward before it biased a position. It does not: at SNR 200 the width bias at two points per FWHM is -0.01% and at SNR 20 it is -0.46%, with no monotone trend in either block. What sampling costs is precision, not accuracy, for a line whose wings are inside the window. The lead stays on the page with its tag because a lead is a claim to be checked, and this one has now been checked.

7. Counts

Two hundred leads, of which 181 are marked test and 19 note. The tags are a priority claim, not a quality claim: test means a check is cheap and would change what I do next, note means it would not, yet.

SectionLeadstestnoteNumbering
secI50455I1–I50
secJ50446I51–I100
secK50482I101–I150
secL50446I151–I200
Total20018119I1–I200

8. Limits

If one line survives: a width quoted without its line-shape model, its instrument width and its calibration convention is not a property of the sample. The instrument contributes a factor of four to a width and a part per million of laser drift contributes a third of a linewidth, while the counting statistics that would let you see either set a floor that falls only as the square root of the time you are willing to spend.

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