| # | Domain | Technique | Failure mode | Score |
|---|---|---|---|---|
| 22925 | oilfield cement | cross-instrument transfer | delamination | 7 |
| 22926 | oilfield cement | cross-instrument transfer | fretting | 7 |
| 22927 | oilfield cement | cross-instrument transfer | galvanic couple current | 7 |
| 22928 | oilfield cement | cross-instrument transfer | hydrogen embrittlement | 7 |
| 22929 | oilfield cement | cross-instrument transfer | ionic contamination | 7 |
| 22930 | oilfield cement | cross-instrument transfer | microbial corrosion | 7 |
| 22931 | oilfield cement | cross-instrument transfer | misalignment | 7 |
| 22932 | oilfield cement | cross-instrument transfer | moisture ingress | 7 |
| 22933 | oilfield cement | cross-instrument transfer | outgassing | 7 |
| 22934 | oilfield cement | cross-instrument transfer | particulate contamination | 7 |
| 22935 | oilfield cement | cross-instrument transfer | process residue | 7 |
| 22936 | oilfield cement | cross-instrument transfer | solder voiding | 7 |
| 22937 | oilfield cement | cross-instrument transfer | stress-corrosion cracking | 7 |
| 22938 | oilfield cement | cross-instrument transfer | thermal-cycle fatigue | 7 |
| 22939 | oilfield cement | cross-instrument transfer | vibration loosening | 7 |
| 22940 | oilfield cement | cross-instrument transfer | whisker growth | 7 |
| 22941 | oilfield cement | derived-column detector | ESD damage | 7 |
| 22942 | oilfield cement | derived-column detector | UV embrittlement | 7 |
| 22943 | oilfield cement | derived-column detector | cavitation erosion | 7 |
| 22944 | oilfield cement | derived-column detector | creep relaxation | 7 |
| 22945 | oilfield cement | derived-column detector | delamination | 7 |
| 22946 | oilfield cement | derived-column detector | fretting | 7 |
| 22947 | oilfield cement | derived-column detector | galvanic couple current | 7 |
| 22948 | oilfield cement | derived-column detector | hydrogen embrittlement | 7 |
| 22949 | oilfield cement | derived-column detector | ionic contamination | 7 |
| 22950 | oilfield cement | derived-column detector | microbial corrosion | 7 |
| 22951 | oilfield cement | derived-column detector | misalignment | 7 |
| 22952 | oilfield cement | derived-column detector | moisture ingress | 7 |
| 22953 | oilfield cement | derived-column detector | outgassing | 7 |
| 22954 | oilfield cement | derived-column detector | particulate contamination | 7 |
| 22955 | oilfield cement | derived-column detector | process residue | 7 |
| 22956 | oilfield cement | derived-column detector | solder voiding | 7 |
| 22957 | oilfield cement | derived-column detector | stress-corrosion cracking | 7 |
| 22958 | oilfield cement | derived-column detector | thermal-cycle fatigue | 7 |
| 22959 | oilfield cement | derived-column detector | vibration loosening | 7 |
| 22960 | oilfield cement | derived-column detector | whisker growth | 7 |
| 22961 | oilfield cement | distribution not mean | ESD damage | 7 |
| 22962 | oilfield cement | distribution not mean | UV embrittlement | 7 |
| 22963 | oilfield cement | distribution not mean | cavitation erosion | 7 |
| 22964 | oilfield cement | distribution not mean | creep relaxation | 7 |
| 22965 | oilfield cement | distribution not mean | delamination | 7 |
| 22966 | oilfield cement | distribution not mean | fretting | 7 |
| 22967 | oilfield cement | distribution not mean | galvanic couple current | 7 |
| 22968 | oilfield cement | distribution not mean | hydrogen embrittlement | 7 |
| 22969 | oilfield cement | distribution not mean | ionic contamination | 7 |
| 22970 | oilfield cement | distribution not mean | microbial corrosion | 7 |
| 22971 | oilfield cement | distribution not mean | misalignment | 7 |
| 22972 | oilfield cement | distribution not mean | moisture ingress | 7 |
| 22973 | oilfield cement | distribution not mean | outgassing | 7 |
| 22974 | oilfield cement | distribution not mean | particulate contamination | 7 |
| 22975 | oilfield cement | distribution not mean | process residue | 7 |
| 22976 | oilfield cement | distribution not mean | solder voiding | 7 |
| 22977 | oilfield cement | distribution not mean | stress-corrosion cracking | 7 |
| 22978 | oilfield cement | distribution not mean | thermal-cycle fatigue | 7 |
| 22979 | oilfield cement | distribution not mean | vibration loosening | 7 |
| 22980 | oilfield cement | distribution not mean | whisker growth | 7 |
| 22981 | oilfield cement | hysteresis cycle | ESD damage | 7 |
| 22982 | oilfield cement | hysteresis cycle | UV embrittlement | 7 |
| 22983 | oilfield cement | hysteresis cycle | cavitation erosion | 7 |
| 22984 | oilfield cement | hysteresis cycle | creep relaxation | 7 |
| 22985 | oilfield cement | hysteresis cycle | delamination | 7 |
| 22986 | oilfield cement | hysteresis cycle | fretting | 7 |
| 22987 | oilfield cement | hysteresis cycle | galvanic couple current | 7 |
| 22988 | oilfield cement | hysteresis cycle | hydrogen embrittlement | 7 |
| 22989 | oilfield cement | hysteresis cycle | ionic contamination | 7 |
| 22990 | oilfield cement | hysteresis cycle | microbial corrosion | 7 |
| 22991 | oilfield cement | hysteresis cycle | misalignment | 7 |
| 22992 | oilfield cement | hysteresis cycle | moisture ingress | 7 |
| 22993 | oilfield cement | hysteresis cycle | outgassing | 7 |
| 22994 | oilfield cement | hysteresis cycle | particulate contamination | 7 |
| 22995 | oilfield cement | hysteresis cycle | process residue | 7 |
| 22996 | oilfield cement | hysteresis cycle | solder voiding | 7 |
| 22997 | oilfield cement | hysteresis cycle | stress-corrosion cracking | 7 |
| 22998 | oilfield cement | hysteresis cycle | thermal-cycle fatigue | 7 |
| 22999 | oilfield cement | hysteresis cycle | vibration loosening | 7 |
| 23000 | oilfield cement | hysteresis cycle | whisker growth | 7 |
| 23001 | oilfield cement | negative control arm | ESD damage | 7 |
| 23002 | oilfield cement | negative control arm | UV embrittlement | 7 |
| 23003 | oilfield cement | negative control arm | cavitation erosion | 7 |
| 23004 | oilfield cement | negative control arm | creep relaxation | 7 |
| 23005 | oilfield cement | negative control arm | delamination | 7 |
| 23006 | oilfield cement | negative control arm | fretting | 7 |
| 23007 | oilfield cement | negative control arm | galvanic couple current | 7 |
| 23008 | oilfield cement | negative control arm | hydrogen embrittlement | 7 |
| 23009 | oilfield cement | negative control arm | ionic contamination | 7 |
| 23010 | oilfield cement | negative control arm | microbial corrosion | 7 |
| 23011 | oilfield cement | negative control arm | misalignment | 7 |
| 23012 | oilfield cement | negative control arm | moisture ingress | 7 |
| 23013 | oilfield cement | negative control arm | outgassing | 7 |
| 23014 | oilfield cement | negative control arm | particulate contamination | 7 |
| 23015 | oilfield cement | negative control arm | process residue | 7 |
| 23016 | oilfield cement | negative control arm | solder voiding | 7 |
| 23017 | oilfield cement | negative control arm | stress-corrosion cracking | 7 |
| 23018 | oilfield cement | negative control arm | thermal-cycle fatigue | 7 |
| 23019 | oilfield cement | negative control arm | vibration loosening | 7 |
| 23020 | oilfield cement | negative control arm | whisker growth | 7 |
| 23021 | oilfield cement | order-of-operations test | ESD damage | 7 |
| 23022 | oilfield cement | order-of-operations test | UV embrittlement | 7 |
| 23023 | oilfield cement | order-of-operations test | cavitation erosion | 7 |
| 23024 | oilfield cement | order-of-operations test | creep relaxation | 7 |
| 23025 | oilfield cement | order-of-operations test | delamination | 7 |
| 23026 | oilfield cement | order-of-operations test | fretting | 7 |
| 23027 | oilfield cement | order-of-operations test | galvanic couple current | 7 |
| 23028 | oilfield cement | order-of-operations test | hydrogen embrittlement | 7 |
| 23029 | oilfield cement | order-of-operations test | ionic contamination | 7 |
| 23030 | oilfield cement | order-of-operations test | microbial corrosion | 7 |
| 23031 | oilfield cement | order-of-operations test | misalignment | 7 |
| 23032 | oilfield cement | order-of-operations test | moisture ingress | 7 |
| 23033 | oilfield cement | order-of-operations test | outgassing | 7 |
| 23034 | oilfield cement | order-of-operations test | particulate contamination | 7 |
| 23035 | oilfield cement | order-of-operations test | process residue | 7 |
| 23036 | oilfield cement | order-of-operations test | solder voiding | 7 |
| 23037 | oilfield cement | order-of-operations test | stress-corrosion cracking | 7 |
| 23038 | oilfield cement | order-of-operations test | thermal-cycle fatigue | 7 |
| 23039 | oilfield cement | order-of-operations test | vibration loosening | 7 |
| 23040 | oilfield cement | order-of-operations test | whisker growth | 7 |
| 23041 | oilfield cement | reference-ratio reporting | ESD damage | 7 |
| 23042 | oilfield cement | reference-ratio reporting | UV embrittlement | 7 |
| 23043 | oilfield cement | reference-ratio reporting | cavitation erosion | 7 |
| 23044 | oilfield cement | reference-ratio reporting | creep relaxation | 7 |
| 23045 | oilfield cement | reference-ratio reporting | delamination | 7 |
| 23046 | oilfield cement | reference-ratio reporting | fretting | 7 |
| 23047 | oilfield cement | reference-ratio reporting | galvanic couple current | 7 |
| 23048 | oilfield cement | reference-ratio reporting | hydrogen embrittlement | 7 |
| 23049 | oilfield cement | reference-ratio reporting | ionic contamination | 7 |
| 23050 | oilfield cement | reference-ratio reporting | microbial corrosion | 7 |
| 23051 | oilfield cement | reference-ratio reporting | misalignment | 7 |
| 23052 | oilfield cement | reference-ratio reporting | moisture ingress | 7 |
| 23053 | oilfield cement | reference-ratio reporting | outgassing | 7 |
| 23054 | oilfield cement | reference-ratio reporting | particulate contamination | 7 |
| 23055 | oilfield cement | reference-ratio reporting | process residue | 7 |
| 23056 | oilfield cement | reference-ratio reporting | solder voiding | 7 |
| 23057 | oilfield cement | reference-ratio reporting | stress-corrosion cracking | 7 |
| 23058 | oilfield cement | reference-ratio reporting | thermal-cycle fatigue | 7 |
| 23059 | oilfield cement | reference-ratio reporting | vibration loosening | 7 |
| 23060 | oilfield cement | reference-ratio reporting | whisker growth | 7 |
| 23061 | oilfield cement | sample-history audit | ESD damage | 7 |
| 23062 | oilfield cement | sample-history audit | UV embrittlement | 7 |
| 23063 | oilfield cement | sample-history audit | cavitation erosion | 7 |
| 23064 | oilfield cement | sample-history audit | creep relaxation | 7 |
| 23065 | oilfield cement | sample-history audit | delamination | 7 |
| 23066 | oilfield cement | sample-history audit | fretting | 7 |
| 23067 | oilfield cement | sample-history audit | galvanic couple current | 7 |
| 23068 | oilfield cement | sample-history audit | hydrogen embrittlement | 7 |
| 23069 | oilfield cement | sample-history audit | ionic contamination | 7 |
| 23070 | oilfield cement | sample-history audit | microbial corrosion | 7 |
| 23071 | oilfield cement | sample-history audit | misalignment | 7 |
| 23072 | oilfield cement | sample-history audit | moisture ingress | 7 |
| 23073 | oilfield cement | sample-history audit | outgassing | 7 |
| 23074 | oilfield cement | sample-history audit | particulate contamination | 7 |
| 23075 | oilfield cement | sample-history audit | process residue | 7 |
| 23076 | oilfield cement | sample-history audit | solder voiding | 7 |
| 23077 | oilfield cement | sample-history audit | stress-corrosion cracking | 7 |
| 23078 | oilfield cement | sample-history audit | thermal-cycle fatigue | 7 |
| 23079 | oilfield cement | sample-history audit | vibration loosening | 7 |
| 23080 | oilfield cement | sample-history audit | whisker growth | 7 |
| 23081 | oilfield cement | saturation sweep | ESD damage | 7 |
| 23082 | oilfield cement | saturation sweep | UV embrittlement | 7 |
| 23083 | oilfield cement | saturation sweep | cavitation erosion | 7 |
| 23084 | oilfield cement | saturation sweep | creep relaxation | 7 |
| 23085 | oilfield cement | saturation sweep | delamination | 7 |
| 23086 | oilfield cement | saturation sweep | fretting | 7 |
| 23087 | oilfield cement | saturation sweep | galvanic couple current | 7 |
| 23088 | oilfield cement | saturation sweep | hydrogen embrittlement | 7 |
| 23089 | oilfield cement | saturation sweep | ionic contamination | 7 |
| 23090 | oilfield cement | saturation sweep | microbial corrosion | 7 |
| 23091 | oilfield cement | saturation sweep | misalignment | 7 |
| 23092 | oilfield cement | saturation sweep | moisture ingress | 7 |
| 23093 | oilfield cement | saturation sweep | outgassing | 7 |
| 23094 | oilfield cement | saturation sweep | particulate contamination | 7 |
| 23095 | oilfield cement | saturation sweep | process residue | 7 |
| 23096 | oilfield cement | saturation sweep | solder voiding | 7 |
| 23097 | oilfield cement | saturation sweep | stress-corrosion cracking | 7 |
| 23098 | oilfield cement | saturation sweep | thermal-cycle fatigue | 7 |
| 23099 | oilfield cement | saturation sweep | vibration loosening | 7 |
| 23100 | oilfield cement | saturation sweep | whisker growth | 7 |
| 23101 | oilfield cement | second-condition replicate | ESD damage | 7 |
| 23102 | oilfield cement | second-condition replicate | UV embrittlement | 7 |
| 23103 | oilfield cement | second-condition replicate | cavitation erosion | 7 |
| 23104 | oilfield cement | second-condition replicate | creep relaxation | 7 |
| 23105 | oilfield cement | second-condition replicate | delamination | 7 |
| 23106 | oilfield cement | second-condition replicate | fretting | 7 |
| 23107 | oilfield cement | second-condition replicate | galvanic couple current | 7 |
| 23108 | oilfield cement | second-condition replicate | hydrogen embrittlement | 7 |
| 23109 | oilfield cement | second-condition replicate | ionic contamination | 7 |
| 23110 | oilfield cement | second-condition replicate | microbial corrosion | 7 |
| 23111 | oilfield cement | second-condition replicate | misalignment | 7 |
| 23112 | oilfield cement | second-condition replicate | moisture ingress | 7 |
| 23113 | oilfield cement | second-condition replicate | outgassing | 7 |
| 23114 | oilfield cement | second-condition replicate | particulate contamination | 7 |
| 23115 | oilfield cement | second-condition replicate | process residue | 7 |
| 23116 | oilfield cement | second-condition replicate | solder voiding | 7 |
| 23117 | oilfield cement | second-condition replicate | stress-corrosion cracking | 7 |
| 23118 | oilfield cement | second-condition replicate | thermal-cycle fatigue | 7 |
| 23119 | oilfield cement | second-condition replicate | vibration loosening | 7 |
| 23120 | oilfield cement | second-condition replicate | whisker growth | 7 |
| 23121 | oilfield cement | three-estimator agreement | ESD damage | 7 |
| 23122 | oilfield cement | three-estimator agreement | UV embrittlement | 7 |
| 23123 | oilfield cement | three-estimator agreement | cavitation erosion | 7 |
| 23124 | oilfield cement | three-estimator agreement | creep relaxation | 7 |
| 23125 | oilfield cement | three-estimator agreement | delamination | 7 |
| 23126 | oilfield cement | three-estimator agreement | fretting | 7 |
| 23127 | oilfield cement | three-estimator agreement | galvanic couple current | 7 |
| 23128 | oilfield cement | three-estimator agreement | hydrogen embrittlement | 7 |
| 23129 | oilfield cement | three-estimator agreement | ionic contamination | 7 |
| 23130 | oilfield cement | three-estimator agreement | microbial corrosion | 7 |
| 23131 | oilfield cement | three-estimator agreement | misalignment | 7 |
| 23132 | oilfield cement | three-estimator agreement | moisture ingress | 7 |
| 23133 | oilfield cement | three-estimator agreement | outgassing | 7 |
| 23134 | oilfield cement | three-estimator agreement | particulate contamination | 7 |
| 23135 | oilfield cement | three-estimator agreement | process residue | 7 |
| 23136 | oilfield cement | three-estimator agreement | solder voiding | 7 |
| 23137 | oilfield cement | three-estimator agreement | stress-corrosion cracking | 7 |
| 23138 | oilfield cement | three-estimator agreement | thermal-cycle fatigue | 7 |
| 23139 | oilfield cement | three-estimator agreement | vibration loosening | 7 |
| 23140 | oilfield cement | three-estimator agreement | whisker growth | 7 |
| 23141 | oilfield cement | threshold-stability sweep | ESD damage | 7 |
| 23142 | oilfield cement | threshold-stability sweep | UV embrittlement | 7 |
| 23143 | oilfield cement | threshold-stability sweep | cavitation erosion | 7 |
| 23144 | oilfield cement | threshold-stability sweep | creep relaxation | 7 |
| 23145 | oilfield cement | threshold-stability sweep | delamination | 7 |
| 23146 | oilfield cement | threshold-stability sweep | fretting | 7 |
| 23147 | oilfield cement | threshold-stability sweep | galvanic couple current | 7 |
| 23148 | oilfield cement | threshold-stability sweep | hydrogen embrittlement | 7 |
| 23149 | oilfield cement | threshold-stability sweep | ionic contamination | 7 |
| 23150 | oilfield cement | threshold-stability sweep | microbial corrosion | 7 |
| 23151 | oilfield cement | threshold-stability sweep | misalignment | 7 |
| 23152 | oilfield cement | threshold-stability sweep | moisture ingress | 7 |
| 23153 | oilfield cement | threshold-stability sweep | outgassing | 7 |
| 23154 | oilfield cement | threshold-stability sweep | particulate contamination | 7 |
| 23155 | oilfield cement | threshold-stability sweep | process residue | 7 |
| 23156 | oilfield cement | threshold-stability sweep | solder voiding | 7 |
| 23157 | oilfield cement | threshold-stability sweep | stress-corrosion cracking | 7 |
| 23158 | oilfield cement | threshold-stability sweep | thermal-cycle fatigue | 7 |
| 23159 | oilfield cement | threshold-stability sweep | vibration loosening | 7 |
| 23160 | oilfield cement | threshold-stability sweep | whisker growth | 7 |
| 23161 | oilfield cement | time-zero control | ESD damage | 7 |
| 23162 | oilfield cement | time-zero control | UV embrittlement | 7 |
| 23163 | oilfield cement | time-zero control | cavitation erosion | 7 |
| 23164 | oilfield cement | time-zero control | creep relaxation | 7 |
| 23165 | oilfield cement | time-zero control | delamination | 7 |
| 23166 | oilfield cement | time-zero control | fretting | 7 |
| 23167 | oilfield cement | time-zero control | galvanic couple current | 7 |
| 23168 | oilfield cement | time-zero control | hydrogen embrittlement | 7 |
| 23169 | oilfield cement | time-zero control | ionic contamination | 7 |
| 23170 | oilfield cement | time-zero control | microbial corrosion | 7 |
| 23171 | oilfield cement | time-zero control | misalignment | 7 |
| 23172 | oilfield cement | time-zero control | moisture ingress | 7 |
| 23173 | oilfield cement | time-zero control | outgassing | 7 |
| 23174 | oilfield cement | time-zero control | particulate contamination | 7 |
| 23175 | oilfield cement | time-zero control | process residue | 7 |
| 23176 | oilfield cement | time-zero control | solder voiding | 7 |
| 23177 | oilfield cement | time-zero control | stress-corrosion cracking | 7 |
| 23178 | oilfield cement | time-zero control | thermal-cycle fatigue | 7 |
| 23179 | oilfield cement | time-zero control | vibration loosening | 7 |
| 23180 | oilfield cement | time-zero control | whisker growth | 7 |
| 23181 | oilfield cement | two-condition identifiability | ESD damage | 7 |
| 23182 | oilfield cement | two-condition identifiability | UV embrittlement | 7 |
| 23183 | oilfield cement | two-condition identifiability | cavitation erosion | 7 |
| 23184 | oilfield cement | two-condition identifiability | creep relaxation | 7 |
| 23185 | oilfield cement | two-condition identifiability | delamination | 7 |
| 23186 | oilfield cement | two-condition identifiability | fretting | 7 |
| 23187 | oilfield cement | two-condition identifiability | galvanic couple current | 7 |
| 23188 | oilfield cement | two-condition identifiability | hydrogen embrittlement | 7 |
| 23189 | oilfield cement | two-condition identifiability | ionic contamination | 7 |
| 23190 | oilfield cement | two-condition identifiability | microbial corrosion | 7 |
| 23191 | oilfield cement | two-condition identifiability | misalignment | 7 |
| 23192 | oilfield cement | two-condition identifiability | moisture ingress | 7 |
| 23193 | oilfield cement | two-condition identifiability | outgassing | 7 |
| 23194 | oilfield cement | two-condition identifiability | particulate contamination | 7 |
| 23195 | oilfield cement | two-condition identifiability | process residue | 7 |
| 23196 | oilfield cement | two-condition identifiability | solder voiding | 7 |
| 23197 | oilfield cement | two-condition identifiability | stress-corrosion cracking | 7 |
| 23198 | oilfield cement | two-condition identifiability | thermal-cycle fatigue | 7 |
| 23199 | oilfield cement | two-condition identifiability | vibration loosening | 7 |
| 23200 | oilfield cement | two-condition identifiability | whisker growth | 7 |
| 23201 | pressure vessels | blank as sample | ESD damage | 7 |
| 23202 | pressure vessels | blank as sample | UV embrittlement | 7 |
| 23203 | pressure vessels | blank as sample | cavitation erosion | 7 |
| 23204 | pressure vessels | blank as sample | creep relaxation | 7 |
| 23205 | pressure vessels | blank as sample | delamination | 7 |
| 23206 | pressure vessels | blank as sample | fretting | 7 |
| 23207 | pressure vessels | blank as sample | galvanic couple current | 7 |
| 23208 | pressure vessels | blank as sample | hydrogen embrittlement | 7 |
| 23209 | pressure vessels | blank as sample | ionic contamination | 7 |
| 23210 | pressure vessels | blank as sample | microbial corrosion | 7 |
| 23211 | pressure vessels | blank as sample | misalignment | 7 |
| 23212 | pressure vessels | blank as sample | moisture ingress | 7 |
| 23213 | pressure vessels | blank as sample | outgassing | 7 |
| 23214 | pressure vessels | blank as sample | particulate contamination | 7 |
| 23215 | pressure vessels | blank as sample | process residue | 7 |
| 23216 | pressure vessels | blank as sample | solder voiding | 7 |
| 23217 | pressure vessels | blank as sample | stress-corrosion cracking | 7 |
| 23218 | pressure vessels | blank as sample | thermal-cycle fatigue | 7 |
| 23219 | pressure vessels | blank as sample | vibration loosening | 7 |
| 23220 | pressure vessels | blank as sample | whisker growth | 7 |
| 23221 | pressure vessels | cross-instrument transfer | ESD damage | 7 |
| 23222 | pressure vessels | cross-instrument transfer | UV embrittlement | 7 |
| 23223 | pressure vessels | cross-instrument transfer | cavitation erosion | 7 |
| 23224 | pressure vessels | cross-instrument transfer | creep relaxation | 7 |
| 23225 | pressure vessels | cross-instrument transfer | delamination | 7 |
| 23226 | pressure vessels | cross-instrument transfer | fretting | 7 |
| 23227 | pressure vessels | cross-instrument transfer | galvanic couple current | 7 |
| 23228 | pressure vessels | cross-instrument transfer | hydrogen embrittlement | 7 |
| 23229 | pressure vessels | cross-instrument transfer | ionic contamination | 7 |
| 23230 | pressure vessels | cross-instrument transfer | microbial corrosion | 7 |
| 23231 | pressure vessels | cross-instrument transfer | misalignment | 7 |
| 23232 | pressure vessels | cross-instrument transfer | moisture ingress | 7 |
| 23233 | pressure vessels | cross-instrument transfer | outgassing | 7 |
| 23234 | pressure vessels | cross-instrument transfer | particulate contamination | 7 |
| 23235 | pressure vessels | cross-instrument transfer | process residue | 7 |
| 23236 | pressure vessels | cross-instrument transfer | solder voiding | 7 |
| 23237 | pressure vessels | cross-instrument transfer | stress-corrosion cracking | 7 |
| 23238 | pressure vessels | cross-instrument transfer | thermal-cycle fatigue | 7 |
| 23239 | pressure vessels | cross-instrument transfer | vibration loosening | 7 |
| 23240 | pressure vessels | cross-instrument transfer | whisker growth | 7 |
| 23241 | pressure vessels | derived-column detector | ESD damage | 7 |
| 23242 | pressure vessels | derived-column detector | UV embrittlement | 7 |
| 23243 | pressure vessels | derived-column detector | cavitation erosion | 7 |
| 23244 | pressure vessels | derived-column detector | creep relaxation | 7 |
| 23245 | pressure vessels | derived-column detector | delamination | 7 |
| 23246 | pressure vessels | derived-column detector | fretting | 7 |
| 23247 | pressure vessels | derived-column detector | galvanic couple current | 7 |
| 23248 | pressure vessels | derived-column detector | hydrogen embrittlement | 7 |
| 23249 | pressure vessels | derived-column detector | ionic contamination | 7 |
| 23250 | pressure vessels | derived-column detector | microbial corrosion | 7 |
| 23251 | pressure vessels | derived-column detector | misalignment | 7 |
| 23252 | pressure vessels | derived-column detector | moisture ingress | 7 |
| 23253 | pressure vessels | derived-column detector | outgassing | 7 |
| 23254 | pressure vessels | derived-column detector | particulate contamination | 7 |
| 23255 | pressure vessels | derived-column detector | process residue | 7 |
| 23256 | pressure vessels | derived-column detector | solder voiding | 7 |
| 23257 | pressure vessels | derived-column detector | stress-corrosion cracking | 7 |
| 23258 | pressure vessels | derived-column detector | thermal-cycle fatigue | 7 |
| 23259 | pressure vessels | derived-column detector | vibration loosening | 7 |
| 23260 | pressure vessels | derived-column detector | whisker growth | 7 |
| 23261 | pressure vessels | distribution not mean | ESD damage | 7 |
| 23262 | pressure vessels | distribution not mean | UV embrittlement | 7 |
| 23263 | pressure vessels | distribution not mean | cavitation erosion | 7 |
| 23264 | pressure vessels | distribution not mean | creep relaxation | 7 |
| 23265 | pressure vessels | distribution not mean | delamination | 7 |
| 23266 | pressure vessels | distribution not mean | fretting | 7 |
| 23267 | pressure vessels | distribution not mean | galvanic couple current | 7 |
| 23268 | pressure vessels | distribution not mean | hydrogen embrittlement | 7 |
| 23269 | pressure vessels | distribution not mean | ionic contamination | 7 |
| 23270 | pressure vessels | distribution not mean | microbial corrosion | 7 |
| 23271 | pressure vessels | distribution not mean | misalignment | 7 |
| 23272 | pressure vessels | distribution not mean | moisture ingress | 7 |
| 23273 | pressure vessels | distribution not mean | outgassing | 7 |
| 23274 | pressure vessels | distribution not mean | particulate contamination | 7 |
| 23275 | pressure vessels | distribution not mean | process residue | 7 |
| 23276 | pressure vessels | distribution not mean | solder voiding | 7 |
| 23277 | pressure vessels | distribution not mean | stress-corrosion cracking | 7 |
| 23278 | pressure vessels | distribution not mean | thermal-cycle fatigue | 7 |
| 23279 | pressure vessels | distribution not mean | vibration loosening | 7 |
| 23280 | pressure vessels | distribution not mean | whisker growth | 7 |
| 23281 | pressure vessels | hysteresis cycle | ESD damage | 7 |
| 23282 | pressure vessels | hysteresis cycle | UV embrittlement | 7 |
| 23283 | pressure vessels | hysteresis cycle | cavitation erosion | 7 |
| 23284 | pressure vessels | hysteresis cycle | creep relaxation | 7 |
| 23285 | pressure vessels | hysteresis cycle | delamination | 7 |
| 23286 | pressure vessels | hysteresis cycle | fretting | 7 |
| 23287 | pressure vessels | hysteresis cycle | galvanic couple current | 7 |
| 23288 | pressure vessels | hysteresis cycle | hydrogen embrittlement | 7 |
| 23289 | pressure vessels | hysteresis cycle | ionic contamination | 7 |
| 23290 | pressure vessels | hysteresis cycle | microbial corrosion | 7 |
| 23291 | pressure vessels | hysteresis cycle | misalignment | 7 |
| 23292 | pressure vessels | hysteresis cycle | moisture ingress | 7 |
| 23293 | pressure vessels | hysteresis cycle | outgassing | 7 |
| 23294 | pressure vessels | hysteresis cycle | particulate contamination | 7 |
| 23295 | pressure vessels | hysteresis cycle | process residue | 7 |
| 23296 | pressure vessels | hysteresis cycle | solder voiding | 7 |
| 23297 | pressure vessels | hysteresis cycle | stress-corrosion cracking | 7 |
| 23298 | pressure vessels | hysteresis cycle | thermal-cycle fatigue | 7 |
| 23299 | pressure vessels | hysteresis cycle | vibration loosening | 7 |
| 23300 | pressure vessels | hysteresis cycle | whisker growth | 7 |
| 23301 | pressure vessels | negative control arm | ESD damage | 7 |
| 23302 | pressure vessels | negative control arm | UV embrittlement | 7 |
| 23303 | pressure vessels | negative control arm | cavitation erosion | 7 |
| 23304 | pressure vessels | negative control arm | creep relaxation | 7 |
| 23305 | pressure vessels | negative control arm | delamination | 7 |
| 23306 | pressure vessels | negative control arm | fretting | 7 |
| 23307 | pressure vessels | negative control arm | galvanic couple current | 7 |
| 23308 | pressure vessels | negative control arm | hydrogen embrittlement | 7 |
| 23309 | pressure vessels | negative control arm | ionic contamination | 7 |
| 23310 | pressure vessels | negative control arm | microbial corrosion | 7 |
| 23311 | pressure vessels | negative control arm | misalignment | 7 |
| 23312 | pressure vessels | negative control arm | moisture ingress | 7 |
| 23313 | pressure vessels | negative control arm | outgassing | 7 |
| 23314 | pressure vessels | negative control arm | particulate contamination | 7 |
| 23315 | pressure vessels | negative control arm | process residue | 7 |
| 23316 | pressure vessels | negative control arm | solder voiding | 7 |
| 23317 | pressure vessels | negative control arm | stress-corrosion cracking | 7 |
| 23318 | pressure vessels | negative control arm | thermal-cycle fatigue | 7 |
| 23319 | pressure vessels | negative control arm | vibration loosening | 7 |
| 23320 | pressure vessels | negative control arm | whisker growth | 7 |
| 23321 | pressure vessels | order-of-operations test | ESD damage | 7 |
| 23322 | pressure vessels | order-of-operations test | UV embrittlement | 7 |
| 23323 | pressure vessels | order-of-operations test | cavitation erosion | 7 |
| 23324 | pressure vessels | order-of-operations test | creep relaxation | 7 |
| 23325 | pressure vessels | order-of-operations test | delamination | 7 |
| 23326 | pressure vessels | order-of-operations test | fretting | 7 |
| 23327 | pressure vessels | order-of-operations test | galvanic couple current | 7 |
| 23328 | pressure vessels | order-of-operations test | hydrogen embrittlement | 7 |
| 23329 | pressure vessels | order-of-operations test | ionic contamination | 7 |
| 23330 | pressure vessels | order-of-operations test | microbial corrosion | 7 |
| 23331 | pressure vessels | order-of-operations test | misalignment | 7 |
| 23332 | pressure vessels | order-of-operations test | moisture ingress | 7 |
| 23333 | pressure vessels | order-of-operations test | outgassing | 7 |
| 23334 | pressure vessels | order-of-operations test | particulate contamination | 7 |
| 23335 | pressure vessels | order-of-operations test | process residue | 7 |
| 23336 | pressure vessels | order-of-operations test | solder voiding | 7 |
| 23337 | pressure vessels | order-of-operations test | stress-corrosion cracking | 7 |
| 23338 | pressure vessels | order-of-operations test | thermal-cycle fatigue | 7 |
| 23339 | pressure vessels | order-of-operations test | vibration loosening | 7 |
| 23340 | pressure vessels | order-of-operations test | whisker growth | 7 |
| 23341 | pressure vessels | reference-ratio reporting | ESD damage | 7 |
| 23342 | pressure vessels | reference-ratio reporting | UV embrittlement | 7 |
| 23343 | pressure vessels | reference-ratio reporting | cavitation erosion | 7 |
| 23344 | pressure vessels | reference-ratio reporting | creep relaxation | 7 |
| 23345 | pressure vessels | reference-ratio reporting | delamination | 7 |
| 23346 | pressure vessels | reference-ratio reporting | fretting | 7 |
| 23347 | pressure vessels | reference-ratio reporting | galvanic couple current | 7 |
| 23348 | pressure vessels | reference-ratio reporting | hydrogen embrittlement | 7 |
| 23349 | pressure vessels | reference-ratio reporting | ionic contamination | 7 |
| 23350 | pressure vessels | reference-ratio reporting | microbial corrosion | 7 |
| 23351 | pressure vessels | reference-ratio reporting | misalignment | 7 |
| 23352 | pressure vessels | reference-ratio reporting | moisture ingress | 7 |
| 23353 | pressure vessels | reference-ratio reporting | outgassing | 7 |
| 23354 | pressure vessels | reference-ratio reporting | particulate contamination | 7 |
| 23355 | pressure vessels | reference-ratio reporting | process residue | 7 |
| 23356 | pressure vessels | reference-ratio reporting | solder voiding | 7 |
| 23357 | pressure vessels | reference-ratio reporting | stress-corrosion cracking | 7 |
| 23358 | pressure vessels | reference-ratio reporting | thermal-cycle fatigue | 7 |
| 23359 | pressure vessels | reference-ratio reporting | vibration loosening | 7 |
| 23360 | pressure vessels | reference-ratio reporting | whisker growth | 7 |
| 23361 | pressure vessels | sample-history audit | ESD damage | 7 |
| 23362 | pressure vessels | sample-history audit | UV embrittlement | 7 |
| 23363 | pressure vessels | sample-history audit | cavitation erosion | 7 |
| 23364 | pressure vessels | sample-history audit | creep relaxation | 7 |
| 23365 | pressure vessels | sample-history audit | delamination | 7 |
| 23366 | pressure vessels | sample-history audit | fretting | 7 |
| 23367 | pressure vessels | sample-history audit | galvanic couple current | 7 |
| 23368 | pressure vessels | sample-history audit | hydrogen embrittlement | 7 |
| 23369 | pressure vessels | sample-history audit | ionic contamination | 7 |
| 23370 | pressure vessels | sample-history audit | microbial corrosion | 7 |
| 23371 | pressure vessels | sample-history audit | misalignment | 7 |
| 23372 | pressure vessels | sample-history audit | moisture ingress | 7 |
| 23373 | pressure vessels | sample-history audit | outgassing | 7 |
| 23374 | pressure vessels | sample-history audit | particulate contamination | 7 |
| 23375 | pressure vessels | sample-history audit | process residue | 7 |
| 23376 | pressure vessels | sample-history audit | solder voiding | 7 |
| 23377 | pressure vessels | sample-history audit | stress-corrosion cracking | 7 |
| 23378 | pressure vessels | sample-history audit | thermal-cycle fatigue | 7 |
| 23379 | pressure vessels | sample-history audit | vibration loosening | 7 |
| 23380 | pressure vessels | sample-history audit | whisker growth | 7 |
| 23381 | pressure vessels | saturation sweep | ESD damage | 7 |
| 23382 | pressure vessels | saturation sweep | UV embrittlement | 7 |
| 23383 | pressure vessels | saturation sweep | cavitation erosion | 7 |
| 23384 | pressure vessels | saturation sweep | creep relaxation | 7 |
| 23385 | pressure vessels | saturation sweep | delamination | 7 |
| 23386 | pressure vessels | saturation sweep | fretting | 7 |
| 23387 | pressure vessels | saturation sweep | galvanic couple current | 7 |
| 23388 | pressure vessels | saturation sweep | hydrogen embrittlement | 7 |
| 23389 | pressure vessels | saturation sweep | ionic contamination | 7 |
| 23390 | pressure vessels | saturation sweep | microbial corrosion | 7 |
| 23391 | pressure vessels | saturation sweep | misalignment | 7 |
| 23392 | pressure vessels | saturation sweep | moisture ingress | 7 |
| 23393 | pressure vessels | saturation sweep | outgassing | 7 |
| 23394 | pressure vessels | saturation sweep | particulate contamination | 7 |
| 23395 | pressure vessels | saturation sweep | process residue | 7 |
| 23396 | pressure vessels | saturation sweep | solder voiding | 7 |
| 23397 | pressure vessels | saturation sweep | stress-corrosion cracking | 7 |
| 23398 | pressure vessels | saturation sweep | thermal-cycle fatigue | 7 |
| 23399 | pressure vessels | saturation sweep | vibration loosening | 7 |
| 23400 | pressure vessels | saturation sweep | whisker growth | 7 |
| 23401 | pressure vessels | second-condition replicate | ESD damage | 7 |
| 23402 | pressure vessels | second-condition replicate | UV embrittlement | 7 |
| 23403 | pressure vessels | second-condition replicate | cavitation erosion | 7 |
| 23404 | pressure vessels | second-condition replicate | creep relaxation | 7 |
| 23405 | pressure vessels | second-condition replicate | delamination | 7 |
| 23406 | pressure vessels | second-condition replicate | fretting | 7 |
| 23407 | pressure vessels | second-condition replicate | galvanic couple current | 7 |
| 23408 | pressure vessels | second-condition replicate | hydrogen embrittlement | 7 |
| 23409 | pressure vessels | second-condition replicate | ionic contamination | 7 |
| 23410 | pressure vessels | second-condition replicate | microbial corrosion | 7 |
| 23411 | pressure vessels | second-condition replicate | misalignment | 7 |
| 23412 | pressure vessels | second-condition replicate | moisture ingress | 7 |
| 23413 | pressure vessels | second-condition replicate | outgassing | 7 |
| 23414 | pressure vessels | second-condition replicate | particulate contamination | 7 |
| 23415 | pressure vessels | second-condition replicate | process residue | 7 |
| 23416 | pressure vessels | second-condition replicate | solder voiding | 7 |
| 23417 | pressure vessels | second-condition replicate | stress-corrosion cracking | 7 |
| 23418 | pressure vessels | second-condition replicate | thermal-cycle fatigue | 7 |
| 23419 | pressure vessels | second-condition replicate | vibration loosening | 7 |
| 23420 | pressure vessels | second-condition replicate | whisker growth | 7 |
| 23421 | pressure vessels | three-estimator agreement | ESD damage | 7 |
| 23422 | pressure vessels | three-estimator agreement | UV embrittlement | 7 |
| 23423 | pressure vessels | three-estimator agreement | cavitation erosion | 7 |
| 23424 | pressure vessels | three-estimator agreement | creep relaxation | 7 |
| 23425 | pressure vessels | three-estimator agreement | delamination | 7 |
| 23426 | pressure vessels | three-estimator agreement | fretting | 7 |
| 23427 | pressure vessels | three-estimator agreement | galvanic couple current | 7 |
| 23428 | pressure vessels | three-estimator agreement | hydrogen embrittlement | 7 |
| 23429 | pressure vessels | three-estimator agreement | ionic contamination | 7 |
| 23430 | pressure vessels | three-estimator agreement | microbial corrosion | 7 |
| 23431 | pressure vessels | three-estimator agreement | misalignment | 7 |
| 23432 | pressure vessels | three-estimator agreement | moisture ingress | 7 |
| 23433 | pressure vessels | three-estimator agreement | outgassing | 7 |
| 23434 | pressure vessels | three-estimator agreement | particulate contamination | 7 |
| 23435 | pressure vessels | three-estimator agreement | process residue | 7 |
| 23436 | pressure vessels | three-estimator agreement | solder voiding | 7 |
| 23437 | pressure vessels | three-estimator agreement | stress-corrosion cracking | 7 |
| 23438 | pressure vessels | three-estimator agreement | thermal-cycle fatigue | 7 |
| 23439 | pressure vessels | three-estimator agreement | vibration loosening | 7 |
| 23440 | pressure vessels | three-estimator agreement | whisker growth | 7 |
| 23441 | pressure vessels | threshold-stability sweep | ESD damage | 7 |
| 23442 | pressure vessels | threshold-stability sweep | UV embrittlement | 7 |
| 23443 | pressure vessels | threshold-stability sweep | cavitation erosion | 7 |
| 23444 | pressure vessels | threshold-stability sweep | creep relaxation | 7 |
| 23445 | pressure vessels | threshold-stability sweep | delamination | 7 |
| 23446 | pressure vessels | threshold-stability sweep | fretting | 7 |
| 23447 | pressure vessels | threshold-stability sweep | galvanic couple current | 7 |
| 23448 | pressure vessels | threshold-stability sweep | hydrogen embrittlement | 7 |
| 23449 | pressure vessels | threshold-stability sweep | ionic contamination | 7 |
| 23450 | pressure vessels | threshold-stability sweep | microbial corrosion | 7 |
| 23451 | pressure vessels | threshold-stability sweep | misalignment | 7 |
| 23452 | pressure vessels | threshold-stability sweep | moisture ingress | 7 |
| 23453 | pressure vessels | threshold-stability sweep | outgassing | 7 |
| 23454 | pressure vessels | threshold-stability sweep | particulate contamination | 7 |
| 23455 | pressure vessels | threshold-stability sweep | process residue | 7 |
| 23456 | pressure vessels | threshold-stability sweep | solder voiding | 7 |
| 23457 | pressure vessels | threshold-stability sweep | stress-corrosion cracking | 7 |
| 23458 | pressure vessels | threshold-stability sweep | thermal-cycle fatigue | 7 |
| 23459 | pressure vessels | threshold-stability sweep | vibration loosening | 7 |
| 23460 | pressure vessels | threshold-stability sweep | whisker growth | 7 |
| 23461 | pressure vessels | time-zero control | ESD damage | 7 |
| 23462 | pressure vessels | time-zero control | UV embrittlement | 7 |
| 23463 | pressure vessels | time-zero control | cavitation erosion | 7 |
| 23464 | pressure vessels | time-zero control | creep relaxation | 7 |
| 23465 | pressure vessels | time-zero control | delamination | 7 |
| 23466 | pressure vessels | time-zero control | fretting | 7 |
| 23467 | pressure vessels | time-zero control | galvanic couple current | 7 |
| 23468 | pressure vessels | time-zero control | hydrogen embrittlement | 7 |
| 23469 | pressure vessels | time-zero control | ionic contamination | 7 |
| 23470 | pressure vessels | time-zero control | microbial corrosion | 7 |
| 23471 | pressure vessels | time-zero control | misalignment | 7 |
| 23472 | pressure vessels | time-zero control | moisture ingress | 7 |
| 23473 | pressure vessels | time-zero control | outgassing | 7 |
| 23474 | pressure vessels | time-zero control | particulate contamination | 7 |
| 23475 | pressure vessels | time-zero control | process residue | 7 |
| 23476 | pressure vessels | time-zero control | solder voiding | 7 |
| 23477 | pressure vessels | time-zero control | stress-corrosion cracking | 7 |
| 23478 | pressure vessels | time-zero control | thermal-cycle fatigue | 7 |
| 23479 | pressure vessels | time-zero control | vibration loosening | 7 |
| 23480 | pressure vessels | time-zero control | whisker growth | 7 |
| 23481 | pressure vessels | two-condition identifiability | ESD damage | 7 |
| 23482 | pressure vessels | two-condition identifiability | UV embrittlement | 7 |
| 23483 | pressure vessels | two-condition identifiability | cavitation erosion | 7 |
| 23484 | pressure vessels | two-condition identifiability | creep relaxation | 7 |
| 23485 | pressure vessels | two-condition identifiability | delamination | 7 |
| 23486 | pressure vessels | two-condition identifiability | fretting | 7 |
| 23487 | pressure vessels | two-condition identifiability | galvanic couple current | 7 |
| 23488 | pressure vessels | two-condition identifiability | hydrogen embrittlement | 7 |
| 23489 | pressure vessels | two-condition identifiability | ionic contamination | 7 |
| 23490 | pressure vessels | two-condition identifiability | microbial corrosion | 7 |
| 23491 | pressure vessels | two-condition identifiability | misalignment | 7 |
| 23492 | pressure vessels | two-condition identifiability | moisture ingress | 7 |
| 23493 | pressure vessels | two-condition identifiability | outgassing | 7 |
| 23494 | pressure vessels | two-condition identifiability | particulate contamination | 7 |
| 23495 | pressure vessels | two-condition identifiability | process residue | 7 |
| 23496 | pressure vessels | two-condition identifiability | solder voiding | 7 |
| 23497 | pressure vessels | two-condition identifiability | stress-corrosion cracking | 7 |
| 23498 | pressure vessels | two-condition identifiability | thermal-cycle fatigue | 7 |
| 23499 | pressure vessels | two-condition identifiability | vibration loosening | 7 |
| 23500 | pressure vessels | two-condition identifiability | whisker growth | 7 |
| 23501 | satellite thermal control | blank as sample | ESD damage | 7 |
| 23502 | satellite thermal control | blank as sample | UV embrittlement | 7 |
| 23503 | satellite thermal control | blank as sample | cavitation erosion | 7 |
| 23504 | satellite thermal control | blank as sample | creep relaxation | 7 |
| 23505 | satellite thermal control | blank as sample | delamination | 7 |
| 23506 | satellite thermal control | blank as sample | fretting | 7 |
| 23507 | satellite thermal control | blank as sample | galvanic couple current | 7 |
| 23508 | satellite thermal control | blank as sample | hydrogen embrittlement | 7 |
| 23509 | satellite thermal control | blank as sample | ionic contamination | 7 |
| 23510 | satellite thermal control | blank as sample | microbial corrosion | 7 |
| 23511 | satellite thermal control | blank as sample | misalignment | 7 |
| 23512 | satellite thermal control | blank as sample | moisture ingress | 7 |
| 23513 | satellite thermal control | blank as sample | outgassing | 7 |
| 23514 | satellite thermal control | blank as sample | particulate contamination | 7 |
| 23515 | satellite thermal control | blank as sample | process residue | 7 |
| 23516 | satellite thermal control | blank as sample | solder voiding | 7 |
| 23517 | satellite thermal control | blank as sample | stress-corrosion cracking | 7 |
| 23518 | satellite thermal control | blank as sample | thermal-cycle fatigue | 7 |
| 23519 | satellite thermal control | blank as sample | vibration loosening | 7 |
| 23520 | satellite thermal control | blank as sample | whisker growth | 7 |
| 23521 | satellite thermal control | cross-instrument transfer | ESD damage | 7 |
| 23522 | satellite thermal control | cross-instrument transfer | UV embrittlement | 7 |
| 23523 | satellite thermal control | cross-instrument transfer | cavitation erosion | 7 |
| 23524 | satellite thermal control | cross-instrument transfer | creep relaxation | 7 |
| 23525 | satellite thermal control | cross-instrument transfer | delamination | 7 |
| 23526 | satellite thermal control | cross-instrument transfer | fretting | 7 |
| 23527 | satellite thermal control | cross-instrument transfer | galvanic couple current | 7 |
| 23528 | satellite thermal control | cross-instrument transfer | hydrogen embrittlement | 7 |
| 23529 | satellite thermal control | cross-instrument transfer | ionic contamination | 7 |
| 23530 | satellite thermal control | cross-instrument transfer | microbial corrosion | 7 |
| 23531 | satellite thermal control | cross-instrument transfer | misalignment | 7 |
| 23532 | satellite thermal control | cross-instrument transfer | moisture ingress | 7 |
| 23533 | satellite thermal control | cross-instrument transfer | outgassing | 7 |
| 23534 | satellite thermal control | cross-instrument transfer | particulate contamination | 7 |
| 23535 | satellite thermal control | cross-instrument transfer | process residue | 7 |
| 23536 | satellite thermal control | cross-instrument transfer | solder voiding | 7 |
| 23537 | satellite thermal control | cross-instrument transfer | stress-corrosion cracking | 7 |
| 23538 | satellite thermal control | cross-instrument transfer | thermal-cycle fatigue | 7 |
| 23539 | satellite thermal control | cross-instrument transfer | vibration loosening | 7 |
| 23540 | satellite thermal control | cross-instrument transfer | whisker growth | 7 |
| 23541 | satellite thermal control | derived-column detector | ESD damage | 7 |
| 23542 | satellite thermal control | derived-column detector | UV embrittlement | 7 |
| 23543 | satellite thermal control | derived-column detector | cavitation erosion | 7 |
| 23544 | satellite thermal control | derived-column detector | creep relaxation | 7 |
| 23545 | satellite thermal control | derived-column detector | delamination | 7 |
| 23546 | satellite thermal control | derived-column detector | fretting | 7 |
| 23547 | satellite thermal control | derived-column detector | galvanic couple current | 7 |
| 23548 | satellite thermal control | derived-column detector | hydrogen embrittlement | 7 |
| 23549 | satellite thermal control | derived-column detector | ionic contamination | 7 |
| 23550 | satellite thermal control | derived-column detector | microbial corrosion | 7 |
| 23551 | satellite thermal control | derived-column detector | misalignment | 7 |
| 23552 | satellite thermal control | derived-column detector | moisture ingress | 7 |
| 23553 | satellite thermal control | derived-column detector | outgassing | 7 |
| 23554 | satellite thermal control | derived-column detector | particulate contamination | 7 |
| 23555 | satellite thermal control | derived-column detector | process residue | 7 |
| 23556 | satellite thermal control | derived-column detector | solder voiding | 7 |
| 23557 | satellite thermal control | derived-column detector | stress-corrosion cracking | 7 |
| 23558 | satellite thermal control | derived-column detector | thermal-cycle fatigue | 7 |
| 23559 | satellite thermal control | derived-column detector | vibration loosening | 7 |
| 23560 | satellite thermal control | derived-column detector | whisker growth | 7 |
| 23561 | satellite thermal control | distribution not mean | ESD damage | 7 |
| 23562 | satellite thermal control | distribution not mean | UV embrittlement | 7 |
| 23563 | satellite thermal control | distribution not mean | cavitation erosion | 7 |
| 23564 | satellite thermal control | distribution not mean | creep relaxation | 7 |
| 23565 | satellite thermal control | distribution not mean | delamination | 7 |
| 23566 | satellite thermal control | distribution not mean | fretting | 7 |
| 23567 | satellite thermal control | distribution not mean | galvanic couple current | 7 |
| 23568 | satellite thermal control | distribution not mean | hydrogen embrittlement | 7 |
| 23569 | satellite thermal control | distribution not mean | ionic contamination | 7 |
| 23570 | satellite thermal control | distribution not mean | microbial corrosion | 7 |
| 23571 | satellite thermal control | distribution not mean | misalignment | 7 |
| 23572 | satellite thermal control | distribution not mean | moisture ingress | 7 |
| 23573 | satellite thermal control | distribution not mean | outgassing | 7 |
| 23574 | satellite thermal control | distribution not mean | particulate contamination | 7 |
| 23575 | satellite thermal control | distribution not mean | process residue | 7 |
| 23576 | satellite thermal control | distribution not mean | solder voiding | 7 |
| 23577 | satellite thermal control | distribution not mean | stress-corrosion cracking | 7 |
| 23578 | satellite thermal control | distribution not mean | thermal-cycle fatigue | 7 |
| 23579 | satellite thermal control | distribution not mean | vibration loosening | 7 |
| 23580 | satellite thermal control | distribution not mean | whisker growth | 7 |
| 23581 | satellite thermal control | hysteresis cycle | ESD damage | 7 |
| 23582 | satellite thermal control | hysteresis cycle | UV embrittlement | 7 |
| 23583 | satellite thermal control | hysteresis cycle | cavitation erosion | 7 |
| 23584 | satellite thermal control | hysteresis cycle | creep relaxation | 7 |
| 23585 | satellite thermal control | hysteresis cycle | delamination | 7 |
| 23586 | satellite thermal control | hysteresis cycle | fretting | 7 |
| 23587 | satellite thermal control | hysteresis cycle | galvanic couple current | 7 |
| 23588 | satellite thermal control | hysteresis cycle | hydrogen embrittlement | 7 |
| 23589 | satellite thermal control | hysteresis cycle | ionic contamination | 7 |
| 23590 | satellite thermal control | hysteresis cycle | microbial corrosion | 7 |
| 23591 | satellite thermal control | hysteresis cycle | misalignment | 7 |
| 23592 | satellite thermal control | hysteresis cycle | moisture ingress | 7 |
| 23593 | satellite thermal control | hysteresis cycle | outgassing | 7 |
| 23594 | satellite thermal control | hysteresis cycle | particulate contamination | 7 |
| 23595 | satellite thermal control | hysteresis cycle | process residue | 7 |
| 23596 | satellite thermal control | hysteresis cycle | solder voiding | 7 |
| 23597 | satellite thermal control | hysteresis cycle | stress-corrosion cracking | 7 |
| 23598 | satellite thermal control | hysteresis cycle | thermal-cycle fatigue | 7 |
| 23599 | satellite thermal control | hysteresis cycle | vibration loosening | 7 |
| 23600 | satellite thermal control | hysteresis cycle | whisker growth | 7 |
| 23601 | satellite thermal control | negative control arm | ESD damage | 7 |
| 23602 | satellite thermal control | negative control arm | UV embrittlement | 7 |
| 23603 | satellite thermal control | negative control arm | cavitation erosion | 7 |
| 23604 | satellite thermal control | negative control arm | creep relaxation | 7 |
| 23605 | satellite thermal control | negative control arm | delamination | 7 |
| 23606 | satellite thermal control | negative control arm | fretting | 7 |
| 23607 | satellite thermal control | negative control arm | galvanic couple current | 7 |
| 23608 | satellite thermal control | negative control arm | hydrogen embrittlement | 7 |
| 23609 | satellite thermal control | negative control arm | ionic contamination | 7 |
| 23610 | satellite thermal control | negative control arm | microbial corrosion | 7 |
| 23611 | satellite thermal control | negative control arm | misalignment | 7 |
| 23612 | satellite thermal control | negative control arm | moisture ingress | 7 |
| 23613 | satellite thermal control | negative control arm | outgassing | 7 |
| 23614 | satellite thermal control | negative control arm | particulate contamination | 7 |
| 23615 | satellite thermal control | negative control arm | process residue | 7 |
| 23616 | satellite thermal control | negative control arm | solder voiding | 7 |
| 23617 | satellite thermal control | negative control arm | stress-corrosion cracking | 7 |
| 23618 | satellite thermal control | negative control arm | thermal-cycle fatigue | 7 |
| 23619 | satellite thermal control | negative control arm | vibration loosening | 7 |
| 23620 | satellite thermal control | negative control arm | whisker growth | 7 |
| 23621 | satellite thermal control | order-of-operations test | ESD damage | 7 |
| 23622 | satellite thermal control | order-of-operations test | UV embrittlement | 7 |
| 23623 | satellite thermal control | order-of-operations test | cavitation erosion | 7 |
| 23624 | satellite thermal control | order-of-operations test | creep relaxation | 7 |
| 23625 | satellite thermal control | order-of-operations test | delamination | 7 |
| 23626 | satellite thermal control | order-of-operations test | fretting | 7 |
| 23627 | satellite thermal control | order-of-operations test | galvanic couple current | 7 |
| 23628 | satellite thermal control | order-of-operations test | hydrogen embrittlement | 7 |
| 23629 | satellite thermal control | order-of-operations test | ionic contamination | 7 |
| 23630 | satellite thermal control | order-of-operations test | microbial corrosion | 7 |
| 23631 | satellite thermal control | order-of-operations test | misalignment | 7 |
| 23632 | satellite thermal control | order-of-operations test | moisture ingress | 7 |
| 23633 | satellite thermal control | order-of-operations test | outgassing | 7 |
| 23634 | satellite thermal control | order-of-operations test | particulate contamination | 7 |
| 23635 | satellite thermal control | order-of-operations test | process residue | 7 |
| 23636 | satellite thermal control | order-of-operations test | solder voiding | 7 |
| 23637 | satellite thermal control | order-of-operations test | stress-corrosion cracking | 7 |
| 23638 | satellite thermal control | order-of-operations test | thermal-cycle fatigue | 7 |
| 23639 | satellite thermal control | order-of-operations test | vibration loosening | 7 |
| 23640 | satellite thermal control | order-of-operations test | whisker growth | 7 |
| 23641 | satellite thermal control | reference-ratio reporting | ESD damage | 7 |
| 23642 | satellite thermal control | reference-ratio reporting | UV embrittlement | 7 |
| 23643 | satellite thermal control | reference-ratio reporting | cavitation erosion | 7 |
| 23644 | satellite thermal control | reference-ratio reporting | creep relaxation | 7 |
| 23645 | satellite thermal control | reference-ratio reporting | delamination | 7 |
| 23646 | satellite thermal control | reference-ratio reporting | fretting | 7 |
| 23647 | satellite thermal control | reference-ratio reporting | galvanic couple current | 7 |
| 23648 | satellite thermal control | reference-ratio reporting | hydrogen embrittlement | 7 |
| 23649 | satellite thermal control | reference-ratio reporting | ionic contamination | 7 |
| 23650 | satellite thermal control | reference-ratio reporting | microbial corrosion | 7 |
| 23651 | satellite thermal control | reference-ratio reporting | misalignment | 7 |
| 23652 | satellite thermal control | reference-ratio reporting | moisture ingress | 7 |
| 23653 | satellite thermal control | reference-ratio reporting | outgassing | 7 |
| 23654 | satellite thermal control | reference-ratio reporting | particulate contamination | 7 |
| 23655 | satellite thermal control | reference-ratio reporting | process residue | 7 |
| 23656 | satellite thermal control | reference-ratio reporting | solder voiding | 7 |
| 23657 | satellite thermal control | reference-ratio reporting | stress-corrosion cracking | 7 |
| 23658 | satellite thermal control | reference-ratio reporting | thermal-cycle fatigue | 7 |
| 23659 | satellite thermal control | reference-ratio reporting | vibration loosening | 7 |
| 23660 | satellite thermal control | reference-ratio reporting | whisker growth | 7 |
| 23661 | satellite thermal control | sample-history audit | ESD damage | 7 |
| 23662 | satellite thermal control | sample-history audit | UV embrittlement | 7 |
| 23663 | satellite thermal control | sample-history audit | cavitation erosion | 7 |
| 23664 | satellite thermal control | sample-history audit | creep relaxation | 7 |
| 23665 | satellite thermal control | sample-history audit | delamination | 7 |
| 23666 | satellite thermal control | sample-history audit | fretting | 7 |
| 23667 | satellite thermal control | sample-history audit | galvanic couple current | 7 |
| 23668 | satellite thermal control | sample-history audit | hydrogen embrittlement | 7 |
| 23669 | satellite thermal control | sample-history audit | ionic contamination | 7 |
| 23670 | satellite thermal control | sample-history audit | microbial corrosion | 7 |
| 23671 | satellite thermal control | sample-history audit | misalignment | 7 |
| 23672 | satellite thermal control | sample-history audit | moisture ingress | 7 |
| 23673 | satellite thermal control | sample-history audit | outgassing | 7 |
| 23674 | satellite thermal control | sample-history audit | particulate contamination | 7 |
| 23675 | satellite thermal control | sample-history audit | process residue | 7 |
| 23676 | satellite thermal control | sample-history audit | solder voiding | 7 |
| 23677 | satellite thermal control | sample-history audit | stress-corrosion cracking | 7 |
| 23678 | satellite thermal control | sample-history audit | thermal-cycle fatigue | 7 |
| 23679 | satellite thermal control | sample-history audit | vibration loosening | 7 |
| 23680 | satellite thermal control | sample-history audit | whisker growth | 7 |
| 23681 | satellite thermal control | saturation sweep | ESD damage | 7 |
| 23682 | satellite thermal control | saturation sweep | UV embrittlement | 7 |
| 23683 | satellite thermal control | saturation sweep | cavitation erosion | 7 |
| 23684 | satellite thermal control | saturation sweep | creep relaxation | 7 |
| 23685 | satellite thermal control | saturation sweep | delamination | 7 |
| 23686 | satellite thermal control | saturation sweep | fretting | 7 |
| 23687 | satellite thermal control | saturation sweep | galvanic couple current | 7 |
| 23688 | satellite thermal control | saturation sweep | hydrogen embrittlement | 7 |
| 23689 | satellite thermal control | saturation sweep | ionic contamination | 7 |
| 23690 | satellite thermal control | saturation sweep | microbial corrosion | 7 |
| 23691 | satellite thermal control | saturation sweep | misalignment | 7 |
| 23692 | satellite thermal control | saturation sweep | moisture ingress | 7 |
| 23693 | satellite thermal control | saturation sweep | outgassing | 7 |
| 23694 | satellite thermal control | saturation sweep | particulate contamination | 7 |
| 23695 | satellite thermal control | saturation sweep | process residue | 7 |
| 23696 | satellite thermal control | saturation sweep | solder voiding | 7 |
| 23697 | satellite thermal control | saturation sweep | stress-corrosion cracking | 7 |
| 23698 | satellite thermal control | saturation sweep | thermal-cycle fatigue | 7 |
| 23699 | satellite thermal control | saturation sweep | vibration loosening | 7 |
| 23700 | satellite thermal control | saturation sweep | whisker growth | 7 |
| 23701 | satellite thermal control | second-condition replicate | ESD damage | 7 |
| 23702 | satellite thermal control | second-condition replicate | UV embrittlement | 7 |
| 23703 | satellite thermal control | second-condition replicate | cavitation erosion | 7 |
| 23704 | satellite thermal control | second-condition replicate | creep relaxation | 7 |
| 23705 | satellite thermal control | second-condition replicate | delamination | 7 |
| 23706 | satellite thermal control | second-condition replicate | fretting | 7 |
| 23707 | satellite thermal control | second-condition replicate | galvanic couple current | 7 |
| 23708 | satellite thermal control | second-condition replicate | hydrogen embrittlement | 7 |
| 23709 | satellite thermal control | second-condition replicate | ionic contamination | 7 |
| 23710 | satellite thermal control | second-condition replicate | microbial corrosion | 7 |
| 23711 | satellite thermal control | second-condition replicate | misalignment | 7 |
| 23712 | satellite thermal control | second-condition replicate | moisture ingress | 7 |
| 23713 | satellite thermal control | second-condition replicate | outgassing | 7 |
| 23714 | satellite thermal control | second-condition replicate | particulate contamination | 7 |
| 23715 | satellite thermal control | second-condition replicate | process residue | 7 |
| 23716 | satellite thermal control | second-condition replicate | solder voiding | 7 |
| 23717 | satellite thermal control | second-condition replicate | stress-corrosion cracking | 7 |
| 23718 | satellite thermal control | second-condition replicate | thermal-cycle fatigue | 7 |
| 23719 | satellite thermal control | second-condition replicate | vibration loosening | 7 |
| 23720 | satellite thermal control | second-condition replicate | whisker growth | 7 |
| 23721 | satellite thermal control | three-estimator agreement | ESD damage | 7 |
| 23722 | satellite thermal control | three-estimator agreement | UV embrittlement | 7 |
| 23723 | satellite thermal control | three-estimator agreement | cavitation erosion | 7 |
| 23724 | satellite thermal control | three-estimator agreement | creep relaxation | 7 |
| 23725 | satellite thermal control | three-estimator agreement | delamination | 7 |
| 23726 | satellite thermal control | three-estimator agreement | fretting | 7 |
| 23727 | satellite thermal control | three-estimator agreement | galvanic couple current | 7 |
| 23728 | satellite thermal control | three-estimator agreement | hydrogen embrittlement | 7 |
| 23729 | satellite thermal control | three-estimator agreement | ionic contamination | 7 |
| 23730 | satellite thermal control | three-estimator agreement | microbial corrosion | 7 |
| 23731 | satellite thermal control | three-estimator agreement | misalignment | 7 |
| 23732 | satellite thermal control | three-estimator agreement | moisture ingress | 7 |
| 23733 | satellite thermal control | three-estimator agreement | outgassing | 7 |
| 23734 | satellite thermal control | three-estimator agreement | particulate contamination | 7 |
| 23735 | satellite thermal control | three-estimator agreement | process residue | 7 |
| 23736 | satellite thermal control | three-estimator agreement | solder voiding | 7 |
| 23737 | satellite thermal control | three-estimator agreement | stress-corrosion cracking | 7 |
| 23738 | satellite thermal control | three-estimator agreement | thermal-cycle fatigue | 7 |
| 23739 | satellite thermal control | three-estimator agreement | vibration loosening | 7 |
| 23740 | satellite thermal control | three-estimator agreement | whisker growth | 7 |
| 23741 | satellite thermal control | threshold-stability sweep | ESD damage | 7 |
| 23742 | satellite thermal control | threshold-stability sweep | UV embrittlement | 7 |
| 23743 | satellite thermal control | threshold-stability sweep | cavitation erosion | 7 |
| 23744 | satellite thermal control | threshold-stability sweep | creep relaxation | 7 |
| 23745 | satellite thermal control | threshold-stability sweep | delamination | 7 |
| 23746 | satellite thermal control | threshold-stability sweep | fretting | 7 |
| 23747 | satellite thermal control | threshold-stability sweep | galvanic couple current | 7 |
| 23748 | satellite thermal control | threshold-stability sweep | hydrogen embrittlement | 7 |
| 23749 | satellite thermal control | threshold-stability sweep | ionic contamination | 7 |
| 23750 | satellite thermal control | threshold-stability sweep | microbial corrosion | 7 |
| 23751 | satellite thermal control | threshold-stability sweep | misalignment | 7 |
| 23752 | satellite thermal control | threshold-stability sweep | moisture ingress | 7 |
| 23753 | satellite thermal control | threshold-stability sweep | outgassing | 7 |
| 23754 | satellite thermal control | threshold-stability sweep | particulate contamination | 7 |
| 23755 | satellite thermal control | threshold-stability sweep | process residue | 7 |
| 23756 | satellite thermal control | threshold-stability sweep | solder voiding | 7 |
| 23757 | satellite thermal control | threshold-stability sweep | stress-corrosion cracking | 7 |
| 23758 | satellite thermal control | threshold-stability sweep | thermal-cycle fatigue | 7 |
| 23759 | satellite thermal control | threshold-stability sweep | vibration loosening | 7 |
| 23760 | satellite thermal control | threshold-stability sweep | whisker growth | 7 |
| 23761 | satellite thermal control | time-zero control | ESD damage | 7 |
| 23762 | satellite thermal control | time-zero control | UV embrittlement | 7 |
| 23763 | satellite thermal control | time-zero control | cavitation erosion | 7 |
| 23764 | satellite thermal control | time-zero control | creep relaxation | 7 |
| 23765 | satellite thermal control | time-zero control | delamination | 7 |
| 23766 | satellite thermal control | time-zero control | fretting | 7 |
| 23767 | satellite thermal control | time-zero control | galvanic couple current | 7 |
| 23768 | satellite thermal control | time-zero control | hydrogen embrittlement | 7 |
| 23769 | satellite thermal control | time-zero control | ionic contamination | 7 |
| 23770 | satellite thermal control | time-zero control | microbial corrosion | 7 |
| 23771 | satellite thermal control | time-zero control | misalignment | 7 |
| 23772 | satellite thermal control | time-zero control | moisture ingress | 7 |
| 23773 | satellite thermal control | time-zero control | outgassing | 7 |
| 23774 | satellite thermal control | time-zero control | particulate contamination | 7 |
| 23775 | satellite thermal control | time-zero control | process residue | 7 |
| 23776 | satellite thermal control | time-zero control | solder voiding | 7 |
| 23777 | satellite thermal control | time-zero control | stress-corrosion cracking | 7 |
| 23778 | satellite thermal control | time-zero control | thermal-cycle fatigue | 7 |
| 23779 | satellite thermal control | time-zero control | vibration loosening | 7 |
| 23780 | satellite thermal control | time-zero control | whisker growth | 7 |
| 23781 | satellite thermal control | two-condition identifiability | ESD damage | 7 |
| 23782 | satellite thermal control | two-condition identifiability | UV embrittlement | 7 |
| 23783 | satellite thermal control | two-condition identifiability | cavitation erosion | 7 |
| 23784 | satellite thermal control | two-condition identifiability | creep relaxation | 7 |
| 23785 | satellite thermal control | two-condition identifiability | delamination | 7 |
| 23786 | satellite thermal control | two-condition identifiability | fretting | 7 |
| 23787 | satellite thermal control | two-condition identifiability | galvanic couple current | 7 |
| 23788 | satellite thermal control | two-condition identifiability | hydrogen embrittlement | 7 |
| 23789 | satellite thermal control | two-condition identifiability | ionic contamination | 7 |
| 23790 | satellite thermal control | two-condition identifiability | microbial corrosion | 7 |
| 23791 | satellite thermal control | two-condition identifiability | misalignment | 7 |
| 23792 | satellite thermal control | two-condition identifiability | moisture ingress | 7 |
| 23793 | satellite thermal control | two-condition identifiability | outgassing | 7 |
| 23794 | satellite thermal control | two-condition identifiability | particulate contamination | 7 |
| 23795 | satellite thermal control | two-condition identifiability | process residue | 7 |
| 23796 | satellite thermal control | two-condition identifiability | solder voiding | 7 |
| 23797 | satellite thermal control | two-condition identifiability | stress-corrosion cracking | 7 |
| 23798 | satellite thermal control | two-condition identifiability | thermal-cycle fatigue | 7 |
| 23799 | satellite thermal control | two-condition identifiability | vibration loosening | 7 |
| 23800 | satellite thermal control | two-condition identifiability | whisker growth | 7 |
| 23801 | semiconductor lithography | blank as sample | ESD damage | 7 |
| 23802 | semiconductor lithography | blank as sample | UV embrittlement | 7 |
| 23803 | semiconductor lithography | blank as sample | cavitation erosion | 7 |
| 23804 | semiconductor lithography | blank as sample | creep relaxation | 7 |
| 23805 | semiconductor lithography | blank as sample | delamination | 7 |
| 23806 | semiconductor lithography | blank as sample | fretting | 7 |
| 23807 | semiconductor lithography | blank as sample | galvanic couple current | 7 |
| 23808 | semiconductor lithography | blank as sample | hydrogen embrittlement | 7 |
| 23809 | semiconductor lithography | blank as sample | ionic contamination | 7 |
| 23810 | semiconductor lithography | blank as sample | microbial corrosion | 7 |
| 23811 | semiconductor lithography | blank as sample | misalignment | 7 |
| 23812 | semiconductor lithography | blank as sample | moisture ingress | 7 |
| 23813 | semiconductor lithography | blank as sample | outgassing | 7 |
| 23814 | semiconductor lithography | blank as sample | particulate contamination | 7 |
| 23815 | semiconductor lithography | blank as sample | process residue | 7 |
| 23816 | semiconductor lithography | blank as sample | solder voiding | 7 |
| 23817 | semiconductor lithography | blank as sample | stress-corrosion cracking | 7 |
| 23818 | semiconductor lithography | blank as sample | thermal-cycle fatigue | 7 |
| 23819 | semiconductor lithography | blank as sample | vibration loosening | 7 |
| 23820 | semiconductor lithography | blank as sample | whisker growth | 7 |
| 23821 | semiconductor lithography | cross-instrument transfer | ESD damage | 7 |
| 23822 | semiconductor lithography | cross-instrument transfer | UV embrittlement | 7 |
| 23823 | semiconductor lithography | cross-instrument transfer | cavitation erosion | 7 |
| 23824 | semiconductor lithography | cross-instrument transfer | creep relaxation | 7 |
| 23825 | semiconductor lithography | cross-instrument transfer | delamination | 7 |
| 23826 | semiconductor lithography | cross-instrument transfer | fretting | 7 |
| 23827 | semiconductor lithography | cross-instrument transfer | galvanic couple current | 7 |
| 23828 | semiconductor lithography | cross-instrument transfer | hydrogen embrittlement | 7 |
| 23829 | semiconductor lithography | cross-instrument transfer | ionic contamination | 7 |
| 23830 | semiconductor lithography | cross-instrument transfer | microbial corrosion | 7 |
| 23831 | semiconductor lithography | cross-instrument transfer | misalignment | 7 |
| 23832 | semiconductor lithography | cross-instrument transfer | moisture ingress | 7 |
| 23833 | semiconductor lithography | cross-instrument transfer | outgassing | 7 |
| 23834 | semiconductor lithography | cross-instrument transfer | particulate contamination | 7 |
| 23835 | semiconductor lithography | cross-instrument transfer | process residue | 7 |
| 23836 | semiconductor lithography | cross-instrument transfer | solder voiding | 7 |
| 23837 | semiconductor lithography | cross-instrument transfer | stress-corrosion cracking | 7 |
| 23838 | semiconductor lithography | cross-instrument transfer | thermal-cycle fatigue | 7 |
| 23839 | semiconductor lithography | cross-instrument transfer | vibration loosening | 7 |
| 23840 | semiconductor lithography | cross-instrument transfer | whisker growth | 7 |
| 23841 | semiconductor lithography | derived-column detector | ESD damage | 7 |
| 23842 | semiconductor lithography | derived-column detector | UV embrittlement | 7 |
| 23843 | semiconductor lithography | derived-column detector | cavitation erosion | 7 |
| 23844 | semiconductor lithography | derived-column detector | creep relaxation | 7 |
| 23845 | semiconductor lithography | derived-column detector | delamination | 7 |
| 23846 | semiconductor lithography | derived-column detector | fretting | 7 |
| 23847 | semiconductor lithography | derived-column detector | galvanic couple current | 7 |
| 23848 | semiconductor lithography | derived-column detector | hydrogen embrittlement | 7 |
| 23849 | semiconductor lithography | derived-column detector | ionic contamination | 7 |
| 23850 | semiconductor lithography | derived-column detector | microbial corrosion | 7 |
| 23851 | semiconductor lithography | derived-column detector | misalignment | 7 |
| 23852 | semiconductor lithography | derived-column detector | moisture ingress | 7 |
| 23853 | semiconductor lithography | derived-column detector | outgassing | 7 |
| 23854 | semiconductor lithography | derived-column detector | particulate contamination | 7 |
| 23855 | semiconductor lithography | derived-column detector | process residue | 7 |
| 23856 | semiconductor lithography | derived-column detector | solder voiding | 7 |
| 23857 | semiconductor lithography | derived-column detector | stress-corrosion cracking | 7 |
| 23858 | semiconductor lithography | derived-column detector | thermal-cycle fatigue | 7 |
| 23859 | semiconductor lithography | derived-column detector | vibration loosening | 7 |
| 23860 | semiconductor lithography | derived-column detector | whisker growth | 7 |
| 23861 | semiconductor lithography | distribution not mean | ESD damage | 7 |
| 23862 | semiconductor lithography | distribution not mean | UV embrittlement | 7 |
| 23863 | semiconductor lithography | distribution not mean | cavitation erosion | 7 |
| 23864 | semiconductor lithography | distribution not mean | creep relaxation | 7 |
| 23865 | semiconductor lithography | distribution not mean | delamination | 7 |
| 23866 | semiconductor lithography | distribution not mean | fretting | 7 |
| 23867 | semiconductor lithography | distribution not mean | galvanic couple current | 7 |
| 23868 | semiconductor lithography | distribution not mean | hydrogen embrittlement | 7 |
| 23869 | semiconductor lithography | distribution not mean | ionic contamination | 7 |
| 23870 | semiconductor lithography | distribution not mean | microbial corrosion | 7 |
| 23871 | semiconductor lithography | distribution not mean | misalignment | 7 |
| 23872 | semiconductor lithography | distribution not mean | moisture ingress | 7 |
| 23873 | semiconductor lithography | distribution not mean | outgassing | 7 |
| 23874 | semiconductor lithography | distribution not mean | particulate contamination | 7 |
| 23875 | semiconductor lithography | distribution not mean | process residue | 7 |
| 23876 | semiconductor lithography | distribution not mean | solder voiding | 7 |
| 23877 | semiconductor lithography | distribution not mean | stress-corrosion cracking | 7 |
| 23878 | semiconductor lithography | distribution not mean | thermal-cycle fatigue | 7 |
| 23879 | semiconductor lithography | distribution not mean | vibration loosening | 7 |
| 23880 | semiconductor lithography | distribution not mean | whisker growth | 7 |
| 23881 | semiconductor lithography | hysteresis cycle | ESD damage | 7 |
| 23882 | semiconductor lithography | hysteresis cycle | UV embrittlement | 7 |
| 23883 | semiconductor lithography | hysteresis cycle | cavitation erosion | 7 |
| 23884 | semiconductor lithography | hysteresis cycle | creep relaxation | 7 |
| 23885 | semiconductor lithography | hysteresis cycle | delamination | 7 |
| 23886 | semiconductor lithography | hysteresis cycle | fretting | 7 |
| 23887 | semiconductor lithography | hysteresis cycle | galvanic couple current | 7 |
| 23888 | semiconductor lithography | hysteresis cycle | hydrogen embrittlement | 7 |
| 23889 | semiconductor lithography | hysteresis cycle | ionic contamination | 7 |
| 23890 | semiconductor lithography | hysteresis cycle | microbial corrosion | 7 |
| 23891 | semiconductor lithography | hysteresis cycle | misalignment | 7 |
| 23892 | semiconductor lithography | hysteresis cycle | moisture ingress | 7 |
| 23893 | semiconductor lithography | hysteresis cycle | outgassing | 7 |
| 23894 | semiconductor lithography | hysteresis cycle | particulate contamination | 7 |
| 23895 | semiconductor lithography | hysteresis cycle | process residue | 7 |
| 23896 | semiconductor lithography | hysteresis cycle | solder voiding | 7 |
| 23897 | semiconductor lithography | hysteresis cycle | stress-corrosion cracking | 7 |
| 23898 | semiconductor lithography | hysteresis cycle | thermal-cycle fatigue | 7 |
| 23899 | semiconductor lithography | hysteresis cycle | vibration loosening | 7 |
| 23900 | semiconductor lithography | hysteresis cycle | whisker growth | 7 |
| 23901 | semiconductor lithography | negative control arm | ESD damage | 7 |
| 23902 | semiconductor lithography | negative control arm | UV embrittlement | 7 |
| 23903 | semiconductor lithography | negative control arm | cavitation erosion | 7 |
| 23904 | semiconductor lithography | negative control arm | creep relaxation | 7 |
| 23905 | semiconductor lithography | negative control arm | delamination | 7 |
| 23906 | semiconductor lithography | negative control arm | fretting | 7 |
| 23907 | semiconductor lithography | negative control arm | galvanic couple current | 7 |
| 23908 | semiconductor lithography | negative control arm | hydrogen embrittlement | 7 |
| 23909 | semiconductor lithography | negative control arm | ionic contamination | 7 |
| 23910 | semiconductor lithography | negative control arm | microbial corrosion | 7 |
| 23911 | semiconductor lithography | negative control arm | misalignment | 7 |
| 23912 | semiconductor lithography | negative control arm | moisture ingress | 7 |
| 23913 | semiconductor lithography | negative control arm | outgassing | 7 |
| 23914 | semiconductor lithography | negative control arm | particulate contamination | 7 |
| 23915 | semiconductor lithography | negative control arm | process residue | 7 |
| 23916 | semiconductor lithography | negative control arm | solder voiding | 7 |
| 23917 | semiconductor lithography | negative control arm | stress-corrosion cracking | 7 |
| 23918 | semiconductor lithography | negative control arm | thermal-cycle fatigue | 7 |
| 23919 | semiconductor lithography | negative control arm | vibration loosening | 7 |
| 23920 | semiconductor lithography | negative control arm | whisker growth | 7 |
| 23921 | semiconductor lithography | order-of-operations test | ESD damage | 7 |
| 23922 | semiconductor lithography | order-of-operations test | UV embrittlement | 7 |
| 23923 | semiconductor lithography | order-of-operations test | cavitation erosion | 7 |
| 23924 | semiconductor lithography | order-of-operations test | creep relaxation | 7 |
| 23925 | semiconductor lithography | order-of-operations test | delamination | 7 |
| 23926 | semiconductor lithography | order-of-operations test | fretting | 7 |
| 23927 | semiconductor lithography | order-of-operations test | galvanic couple current | 7 |
| 23928 | semiconductor lithography | order-of-operations test | hydrogen embrittlement | 7 |
| 23929 | semiconductor lithography | order-of-operations test | ionic contamination | 7 |
| 23930 | semiconductor lithography | order-of-operations test | microbial corrosion | 7 |
| 23931 | semiconductor lithography | order-of-operations test | misalignment | 7 |
| 23932 | semiconductor lithography | order-of-operations test | moisture ingress | 7 |
| 23933 | semiconductor lithography | order-of-operations test | outgassing | 7 |
| 23934 | semiconductor lithography | order-of-operations test | particulate contamination | 7 |
| 23935 | semiconductor lithography | order-of-operations test | process residue | 7 |
| 23936 | semiconductor lithography | order-of-operations test | solder voiding | 7 |
| 23937 | semiconductor lithography | order-of-operations test | stress-corrosion cracking | 7 |
| 23938 | semiconductor lithography | order-of-operations test | thermal-cycle fatigue | 7 |
| 23939 | semiconductor lithography | order-of-operations test | vibration loosening | 7 |
| 23940 | semiconductor lithography | order-of-operations test | whisker growth | 7 |
| 23941 | semiconductor lithography | reference-ratio reporting | ESD damage | 7 |
| 23942 | semiconductor lithography | reference-ratio reporting | UV embrittlement | 7 |
| 23943 | semiconductor lithography | reference-ratio reporting | cavitation erosion | 7 |
| 23944 | semiconductor lithography | reference-ratio reporting | creep relaxation | 7 |
| 23945 | semiconductor lithography | reference-ratio reporting | delamination | 7 |
| 23946 | semiconductor lithography | reference-ratio reporting | fretting | 7 |
| 23947 | semiconductor lithography | reference-ratio reporting | galvanic couple current | 7 |
| 23948 | semiconductor lithography | reference-ratio reporting | hydrogen embrittlement | 7 |
| 23949 | semiconductor lithography | reference-ratio reporting | ionic contamination | 7 |
| 23950 | semiconductor lithography | reference-ratio reporting | microbial corrosion | 7 |
| 23951 | semiconductor lithography | reference-ratio reporting | misalignment | 7 |
| 23952 | semiconductor lithography | reference-ratio reporting | moisture ingress | 7 |
| 23953 | semiconductor lithography | reference-ratio reporting | outgassing | 7 |
| 23954 | semiconductor lithography | reference-ratio reporting | particulate contamination | 7 |
| 23955 | semiconductor lithography | reference-ratio reporting | process residue | 7 |
| 23956 | semiconductor lithography | reference-ratio reporting | solder voiding | 7 |
| 23957 | semiconductor lithography | reference-ratio reporting | stress-corrosion cracking | 7 |
| 23958 | semiconductor lithography | reference-ratio reporting | thermal-cycle fatigue | 7 |
| 23959 | semiconductor lithography | reference-ratio reporting | vibration loosening | 7 |
| 23960 | semiconductor lithography | reference-ratio reporting | whisker growth | 7 |
| 23961 | semiconductor lithography | sample-history audit | ESD damage | 7 |
| 23962 | semiconductor lithography | sample-history audit | UV embrittlement | 7 |
| 23963 | semiconductor lithography | sample-history audit | cavitation erosion | 7 |
| 23964 | semiconductor lithography | sample-history audit | creep relaxation | 7 |
| 23965 | semiconductor lithography | sample-history audit | delamination | 7 |
| 23966 | semiconductor lithography | sample-history audit | fretting | 7 |
| 23967 | semiconductor lithography | sample-history audit | galvanic couple current | 7 |
| 23968 | semiconductor lithography | sample-history audit | hydrogen embrittlement | 7 |
| 23969 | semiconductor lithography | sample-history audit | ionic contamination | 7 |
| 23970 | semiconductor lithography | sample-history audit | microbial corrosion | 7 |
| 23971 | semiconductor lithography | sample-history audit | misalignment | 7 |
| 23972 | semiconductor lithography | sample-history audit | moisture ingress | 7 |
| 23973 | semiconductor lithography | sample-history audit | outgassing | 7 |
| 23974 | semiconductor lithography | sample-history audit | particulate contamination | 7 |
| 23975 | semiconductor lithography | sample-history audit | process residue | 7 |
| 23976 | semiconductor lithography | sample-history audit | solder voiding | 7 |
| 23977 | semiconductor lithography | sample-history audit | stress-corrosion cracking | 7 |
| 23978 | semiconductor lithography | sample-history audit | thermal-cycle fatigue | 7 |
| 23979 | semiconductor lithography | sample-history audit | vibration loosening | 7 |
| 23980 | semiconductor lithography | sample-history audit | whisker growth | 7 |
| 23981 | semiconductor lithography | saturation sweep | ESD damage | 7 |
| 23982 | semiconductor lithography | saturation sweep | UV embrittlement | 7 |
| 23983 | semiconductor lithography | saturation sweep | cavitation erosion | 7 |
| 23984 | semiconductor lithography | saturation sweep | creep relaxation | 7 |
| 23985 | semiconductor lithography | saturation sweep | delamination | 7 |
| 23986 | semiconductor lithography | saturation sweep | fretting | 7 |
| 23987 | semiconductor lithography | saturation sweep | galvanic couple current | 7 |
| 23988 | semiconductor lithography | saturation sweep | hydrogen embrittlement | 7 |
| 23989 | semiconductor lithography | saturation sweep | ionic contamination | 7 |
| 23990 | semiconductor lithography | saturation sweep | microbial corrosion | 7 |
| 23991 | semiconductor lithography | saturation sweep | misalignment | 7 |
| 23992 | semiconductor lithography | saturation sweep | moisture ingress | 7 |
| 23993 | semiconductor lithography | saturation sweep | outgassing | 7 |
| 23994 | semiconductor lithography | saturation sweep | particulate contamination | 7 |
| 23995 | semiconductor lithography | saturation sweep | process residue | 7 |
| 23996 | semiconductor lithography | saturation sweep | solder voiding | 7 |
| 23997 | semiconductor lithography | saturation sweep | stress-corrosion cracking | 7 |
| 23998 | semiconductor lithography | saturation sweep | thermal-cycle fatigue | 7 |
| 23999 | semiconductor lithography | saturation sweep | vibration loosening | 7 |
| 24000 | semiconductor lithography | saturation sweep | whisker growth | 7 |
| 24001 | semiconductor lithography | second-condition replicate | ESD damage | 7 |
| 24002 | semiconductor lithography | second-condition replicate | UV embrittlement | 7 |
| 24003 | semiconductor lithography | second-condition replicate | cavitation erosion | 7 |
| 24004 | semiconductor lithography | second-condition replicate | creep relaxation | 7 |
| 24005 | semiconductor lithography | second-condition replicate | delamination | 7 |
| 24006 | semiconductor lithography | second-condition replicate | fretting | 7 |
| 24007 | semiconductor lithography | second-condition replicate | galvanic couple current | 7 |
| 24008 | semiconductor lithography | second-condition replicate | hydrogen embrittlement | 7 |
| 24009 | semiconductor lithography | second-condition replicate | ionic contamination | 7 |
| 24010 | semiconductor lithography | second-condition replicate | microbial corrosion | 7 |
| 24011 | semiconductor lithography | second-condition replicate | misalignment | 7 |
| 24012 | semiconductor lithography | second-condition replicate | moisture ingress | 7 |
| 24013 | semiconductor lithography | second-condition replicate | outgassing | 7 |
| 24014 | semiconductor lithography | second-condition replicate | particulate contamination | 7 |
| 24015 | semiconductor lithography | second-condition replicate | process residue | 7 |
| 24016 | semiconductor lithography | second-condition replicate | solder voiding | 7 |
| 24017 | semiconductor lithography | second-condition replicate | stress-corrosion cracking | 7 |
| 24018 | semiconductor lithography | second-condition replicate | thermal-cycle fatigue | 7 |
| 24019 | semiconductor lithography | second-condition replicate | vibration loosening | 7 |
| 24020 | semiconductor lithography | second-condition replicate | whisker growth | 7 |
| 24021 | semiconductor lithography | three-estimator agreement | ESD damage | 7 |
| 24022 | semiconductor lithography | three-estimator agreement | UV embrittlement | 7 |
| 24023 | semiconductor lithography | three-estimator agreement | cavitation erosion | 7 |
| 24024 | semiconductor lithography | three-estimator agreement | creep relaxation | 7 |
| 24025 | semiconductor lithography | three-estimator agreement | delamination | 7 |
| 24026 | semiconductor lithography | three-estimator agreement | fretting | 7 |
| 24027 | semiconductor lithography | three-estimator agreement | galvanic couple current | 7 |
| 24028 | semiconductor lithography | three-estimator agreement | hydrogen embrittlement | 7 |
| 24029 | semiconductor lithography | three-estimator agreement | ionic contamination | 7 |
| 24030 | semiconductor lithography | three-estimator agreement | microbial corrosion | 7 |
| 24031 | semiconductor lithography | three-estimator agreement | misalignment | 7 |
| 24032 | semiconductor lithography | three-estimator agreement | moisture ingress | 7 |
| 24033 | semiconductor lithography | three-estimator agreement | outgassing | 7 |
| 24034 | semiconductor lithography | three-estimator agreement | particulate contamination | 7 |
| 24035 | semiconductor lithography | three-estimator agreement | process residue | 7 |
| 24036 | semiconductor lithography | three-estimator agreement | solder voiding | 7 |
| 24037 | semiconductor lithography | three-estimator agreement | stress-corrosion cracking | 7 |
| 24038 | semiconductor lithography | three-estimator agreement | thermal-cycle fatigue | 7 |
| 24039 | semiconductor lithography | three-estimator agreement | vibration loosening | 7 |
| 24040 | semiconductor lithography | three-estimator agreement | whisker growth | 7 |
| 24041 | semiconductor lithography | threshold-stability sweep | ESD damage | 7 |
| 24042 | semiconductor lithography | threshold-stability sweep | UV embrittlement | 7 |
| 24043 | semiconductor lithography | threshold-stability sweep | cavitation erosion | 7 |
| 24044 | semiconductor lithography | threshold-stability sweep | creep relaxation | 7 |
| 24045 | semiconductor lithography | threshold-stability sweep | delamination | 7 |
| 24046 | semiconductor lithography | threshold-stability sweep | fretting | 7 |
| 24047 | semiconductor lithography | threshold-stability sweep | galvanic couple current | 7 |
| 24048 | semiconductor lithography | threshold-stability sweep | hydrogen embrittlement | 7 |
| 24049 | semiconductor lithography | threshold-stability sweep | ionic contamination | 7 |
| 24050 | semiconductor lithography | threshold-stability sweep | microbial corrosion | 7 |
| 24051 | semiconductor lithography | threshold-stability sweep | misalignment | 7 |
| 24052 | semiconductor lithography | threshold-stability sweep | moisture ingress | 7 |
| 24053 | semiconductor lithography | threshold-stability sweep | outgassing | 7 |
| 24054 | semiconductor lithography | threshold-stability sweep | particulate contamination | 7 |
| 24055 | semiconductor lithography | threshold-stability sweep | process residue | 7 |
| 24056 | semiconductor lithography | threshold-stability sweep | solder voiding | 7 |
| 24057 | semiconductor lithography | threshold-stability sweep | stress-corrosion cracking | 7 |
| 24058 | semiconductor lithography | threshold-stability sweep | thermal-cycle fatigue | 7 |
| 24059 | semiconductor lithography | threshold-stability sweep | vibration loosening | 7 |
| 24060 | semiconductor lithography | threshold-stability sweep | whisker growth | 7 |
| 24061 | semiconductor lithography | time-zero control | ESD damage | 7 |
| 24062 | semiconductor lithography | time-zero control | UV embrittlement | 7 |
| 24063 | semiconductor lithography | time-zero control | cavitation erosion | 7 |
| 24064 | semiconductor lithography | time-zero control | creep relaxation | 7 |
| 24065 | semiconductor lithography | time-zero control | delamination | 7 |
| 24066 | semiconductor lithography | time-zero control | fretting | 7 |
| 24067 | semiconductor lithography | time-zero control | galvanic couple current | 7 |
| 24068 | semiconductor lithography | time-zero control | hydrogen embrittlement | 7 |
| 24069 | semiconductor lithography | time-zero control | ionic contamination | 7 |
| 24070 | semiconductor lithography | time-zero control | microbial corrosion | 7 |
| 24071 | semiconductor lithography | time-zero control | misalignment | 7 |
| 24072 | semiconductor lithography | time-zero control | moisture ingress | 7 |
| 24073 | semiconductor lithography | time-zero control | outgassing | 7 |
| 24074 | semiconductor lithography | time-zero control | particulate contamination | 7 |
| 24075 | semiconductor lithography | time-zero control | process residue | 7 |
| 24076 | semiconductor lithography | time-zero control | solder voiding | 7 |
| 24077 | semiconductor lithography | time-zero control | stress-corrosion cracking | 7 |
| 24078 | semiconductor lithography | time-zero control | thermal-cycle fatigue | 7 |
| 24079 | semiconductor lithography | time-zero control | vibration loosening | 7 |
| 24080 | semiconductor lithography | time-zero control | whisker growth | 7 |
| 24081 | semiconductor lithography | two-condition identifiability | ESD damage | 7 |
| 24082 | semiconductor lithography | two-condition identifiability | UV embrittlement | 7 |
| 24083 | semiconductor lithography | two-condition identifiability | cavitation erosion | 7 |
| 24084 | semiconductor lithography | two-condition identifiability | creep relaxation | 7 |
| 24085 | semiconductor lithography | two-condition identifiability | delamination | 7 |
| 24086 | semiconductor lithography | two-condition identifiability | fretting | 7 |
| 24087 | semiconductor lithography | two-condition identifiability | galvanic couple current | 7 |
| 24088 | semiconductor lithography | two-condition identifiability | hydrogen embrittlement | 7 |
| 24089 | semiconductor lithography | two-condition identifiability | ionic contamination | 7 |
| 24090 | semiconductor lithography | two-condition identifiability | microbial corrosion | 7 |
| 24091 | semiconductor lithography | two-condition identifiability | misalignment | 7 |
| 24092 | semiconductor lithography | two-condition identifiability | moisture ingress | 7 |
| 24093 | semiconductor lithography | two-condition identifiability | outgassing | 7 |
| 24094 | semiconductor lithography | two-condition identifiability | particulate contamination | 7 |
| 24095 | semiconductor lithography | two-condition identifiability | process residue | 7 |
| 24096 | semiconductor lithography | two-condition identifiability | solder voiding | 7 |
| 24097 | semiconductor lithography | two-condition identifiability | stress-corrosion cracking | 7 |
| 24098 | semiconductor lithography | two-condition identifiability | thermal-cycle fatigue | 7 |
| 24099 | semiconductor lithography | two-condition identifiability | vibration loosening | 7 |
| 24100 | semiconductor lithography | two-condition identifiability | whisker growth | 7 |
| 24101 | switchgear insulation | blank as sample | ESD damage | 7 |
| 24102 | switchgear insulation | blank as sample | UV embrittlement | 7 |
| 24103 | switchgear insulation | blank as sample | cavitation erosion | 7 |
| 24104 | switchgear insulation | blank as sample | creep relaxation | 7 |
| 24105 | switchgear insulation | blank as sample | delamination | 7 |
| 24106 | switchgear insulation | blank as sample | fretting | 7 |
| 24107 | switchgear insulation | blank as sample | galvanic couple current | 7 |
| 24108 | switchgear insulation | blank as sample | hydrogen embrittlement | 7 |
| 24109 | switchgear insulation | blank as sample | ionic contamination | 7 |
| 24110 | switchgear insulation | blank as sample | microbial corrosion | 7 |
| 24111 | switchgear insulation | blank as sample | misalignment | 7 |
| 24112 | switchgear insulation | blank as sample | moisture ingress | 7 |
| 24113 | switchgear insulation | blank as sample | outgassing | 7 |
| 24114 | switchgear insulation | blank as sample | particulate contamination | 7 |
| 24115 | switchgear insulation | blank as sample | process residue | 7 |
| 24116 | switchgear insulation | blank as sample | solder voiding | 7 |
| 24117 | switchgear insulation | blank as sample | stress-corrosion cracking | 7 |
| 24118 | switchgear insulation | blank as sample | thermal-cycle fatigue | 7 |
| 24119 | switchgear insulation | blank as sample | vibration loosening | 7 |
| 24120 | switchgear insulation | blank as sample | whisker growth | 7 |
| 24121 | switchgear insulation | cross-instrument transfer | ESD damage | 7 |
| 24122 | switchgear insulation | cross-instrument transfer | UV embrittlement | 7 |
| 24123 | switchgear insulation | cross-instrument transfer | cavitation erosion | 7 |
| 24124 | switchgear insulation | cross-instrument transfer | creep relaxation | 7 |
| 24125 | switchgear insulation | cross-instrument transfer | delamination | 7 |
| 24126 | switchgear insulation | cross-instrument transfer | fretting | 7 |
| 24127 | switchgear insulation | cross-instrument transfer | galvanic couple current | 7 |
| 24128 | switchgear insulation | cross-instrument transfer | hydrogen embrittlement | 7 |
| 24129 | switchgear insulation | cross-instrument transfer | ionic contamination | 7 |
| 24130 | switchgear insulation | cross-instrument transfer | microbial corrosion | 7 |
| 24131 | switchgear insulation | cross-instrument transfer | misalignment | 7 |
| 24132 | switchgear insulation | cross-instrument transfer | moisture ingress | 7 |
| 24133 | switchgear insulation | cross-instrument transfer | outgassing | 7 |
| 24134 | switchgear insulation | cross-instrument transfer | particulate contamination | 7 |
| 24135 | switchgear insulation | cross-instrument transfer | process residue | 7 |
| 24136 | switchgear insulation | cross-instrument transfer | solder voiding | 7 |
| 24137 | switchgear insulation | cross-instrument transfer | stress-corrosion cracking | 7 |
| 24138 | switchgear insulation | cross-instrument transfer | thermal-cycle fatigue | 7 |
| 24139 | switchgear insulation | cross-instrument transfer | vibration loosening | 7 |
| 24140 | switchgear insulation | cross-instrument transfer | whisker growth | 7 |
| 24141 | switchgear insulation | derived-column detector | ESD damage | 7 |
| 24142 | switchgear insulation | derived-column detector | UV embrittlement | 7 |
| 24143 | switchgear insulation | derived-column detector | cavitation erosion | 7 |
| 24144 | switchgear insulation | derived-column detector | creep relaxation | 7 |
| 24145 | switchgear insulation | derived-column detector | delamination | 7 |
| 24146 | switchgear insulation | derived-column detector | fretting | 7 |
| 24147 | switchgear insulation | derived-column detector | galvanic couple current | 7 |
| 24148 | switchgear insulation | derived-column detector | hydrogen embrittlement | 7 |
| 24149 | switchgear insulation | derived-column detector | ionic contamination | 7 |
| 24150 | switchgear insulation | derived-column detector | microbial corrosion | 7 |
| 24151 | switchgear insulation | derived-column detector | misalignment | 7 |
| 24152 | switchgear insulation | derived-column detector | moisture ingress | 7 |
| 24153 | switchgear insulation | derived-column detector | outgassing | 7 |
| 24154 | switchgear insulation | derived-column detector | particulate contamination | 7 |
| 24155 | switchgear insulation | derived-column detector | process residue | 7 |
| 24156 | switchgear insulation | derived-column detector | solder voiding | 7 |
| 24157 | switchgear insulation | derived-column detector | stress-corrosion cracking | 7 |
| 24158 | switchgear insulation | derived-column detector | thermal-cycle fatigue | 7 |
| 24159 | switchgear insulation | derived-column detector | vibration loosening | 7 |
| 24160 | switchgear insulation | derived-column detector | whisker growth | 7 |
| 24161 | switchgear insulation | distribution not mean | ESD damage | 7 |
| 24162 | switchgear insulation | distribution not mean | UV embrittlement | 7 |
| 24163 | switchgear insulation | distribution not mean | cavitation erosion | 7 |
| 24164 | switchgear insulation | distribution not mean | creep relaxation | 7 |
| 24165 | switchgear insulation | distribution not mean | delamination | 7 |
| 24166 | switchgear insulation | distribution not mean | fretting | 7 |
| 24167 | switchgear insulation | distribution not mean | galvanic couple current | 7 |
| 24168 | switchgear insulation | distribution not mean | hydrogen embrittlement | 7 |
| 24169 | switchgear insulation | distribution not mean | ionic contamination | 7 |
| 24170 | switchgear insulation | distribution not mean | microbial corrosion | 7 |
| 24171 | switchgear insulation | distribution not mean | misalignment | 7 |
| 24172 | switchgear insulation | distribution not mean | moisture ingress | 7 |
| 24173 | switchgear insulation | distribution not mean | outgassing | 7 |
| 24174 | switchgear insulation | distribution not mean | particulate contamination | 7 |
| 24175 | switchgear insulation | distribution not mean | process residue | 7 |
| 24176 | switchgear insulation | distribution not mean | solder voiding | 7 |
| 24177 | switchgear insulation | distribution not mean | stress-corrosion cracking | 7 |
| 24178 | switchgear insulation | distribution not mean | thermal-cycle fatigue | 7 |
| 24179 | switchgear insulation | distribution not mean | vibration loosening | 7 |
| 24180 | switchgear insulation | distribution not mean | whisker growth | 7 |
| 24181 | switchgear insulation | hysteresis cycle | ESD damage | 7 |
| 24182 | switchgear insulation | hysteresis cycle | UV embrittlement | 7 |
| 24183 | switchgear insulation | hysteresis cycle | cavitation erosion | 7 |
| 24184 | switchgear insulation | hysteresis cycle | creep relaxation | 7 |
| 24185 | switchgear insulation | hysteresis cycle | delamination | 7 |
| 24186 | switchgear insulation | hysteresis cycle | fretting | 7 |
| 24187 | switchgear insulation | hysteresis cycle | galvanic couple current | 7 |
| 24188 | switchgear insulation | hysteresis cycle | hydrogen embrittlement | 7 |
| 24189 | switchgear insulation | hysteresis cycle | ionic contamination | 7 |
| 24190 | switchgear insulation | hysteresis cycle | microbial corrosion | 7 |
| 24191 | switchgear insulation | hysteresis cycle | misalignment | 7 |
| 24192 | switchgear insulation | hysteresis cycle | moisture ingress | 7 |
| 24193 | switchgear insulation | hysteresis cycle | outgassing | 7 |
| 24194 | switchgear insulation | hysteresis cycle | particulate contamination | 7 |
| 24195 | switchgear insulation | hysteresis cycle | process residue | 7 |
| 24196 | switchgear insulation | hysteresis cycle | solder voiding | 7 |
| 24197 | switchgear insulation | hysteresis cycle | stress-corrosion cracking | 7 |
| 24198 | switchgear insulation | hysteresis cycle | thermal-cycle fatigue | 7 |
| 24199 | switchgear insulation | hysteresis cycle | vibration loosening | 7 |
| 24200 | switchgear insulation | hysteresis cycle | whisker growth | 7 |
| 24201 | switchgear insulation | negative control arm | ESD damage | 7 |
| 24202 | switchgear insulation | negative control arm | UV embrittlement | 7 |
| 24203 | switchgear insulation | negative control arm | cavitation erosion | 7 |
| 24204 | switchgear insulation | negative control arm | creep relaxation | 7 |
| 24205 | switchgear insulation | negative control arm | delamination | 7 |
| 24206 | switchgear insulation | negative control arm | fretting | 7 |
| 24207 | switchgear insulation | negative control arm | galvanic couple current | 7 |
| 24208 | switchgear insulation | negative control arm | hydrogen embrittlement | 7 |
| 24209 | switchgear insulation | negative control arm | ionic contamination | 7 |
| 24210 | switchgear insulation | negative control arm | microbial corrosion | 7 |
| 24211 | switchgear insulation | negative control arm | misalignment | 7 |
| 24212 | switchgear insulation | negative control arm | moisture ingress | 7 |
| 24213 | switchgear insulation | negative control arm | outgassing | 7 |
| 24214 | switchgear insulation | negative control arm | particulate contamination | 7 |
| 24215 | switchgear insulation | negative control arm | process residue | 7 |
| 24216 | switchgear insulation | negative control arm | solder voiding | 7 |
| 24217 | switchgear insulation | negative control arm | stress-corrosion cracking | 7 |
| 24218 | switchgear insulation | negative control arm | thermal-cycle fatigue | 7 |
| 24219 | switchgear insulation | negative control arm | vibration loosening | 7 |
| 24220 | switchgear insulation | negative control arm | whisker growth | 7 |
| 24221 | switchgear insulation | order-of-operations test | ESD damage | 7 |
| 24222 | switchgear insulation | order-of-operations test | UV embrittlement | 7 |
| 24223 | switchgear insulation | order-of-operations test | cavitation erosion | 7 |
| 24224 | switchgear insulation | order-of-operations test | creep relaxation | 7 |
| 24225 | switchgear insulation | order-of-operations test | delamination | 7 |
| 24226 | switchgear insulation | order-of-operations test | fretting | 7 |
| 24227 | switchgear insulation | order-of-operations test | galvanic couple current | 7 |
| 24228 | switchgear insulation | order-of-operations test | hydrogen embrittlement | 7 |
| 24229 | switchgear insulation | order-of-operations test | ionic contamination | 7 |
| 24230 | switchgear insulation | order-of-operations test | microbial corrosion | 7 |
| 24231 | switchgear insulation | order-of-operations test | misalignment | 7 |
| 24232 | switchgear insulation | order-of-operations test | moisture ingress | 7 |
| 24233 | switchgear insulation | order-of-operations test | outgassing | 7 |
| 24234 | switchgear insulation | order-of-operations test | particulate contamination | 7 |
| 24235 | switchgear insulation | order-of-operations test | process residue | 7 |
| 24236 | switchgear insulation | order-of-operations test | solder voiding | 7 |
| 24237 | switchgear insulation | order-of-operations test | stress-corrosion cracking | 7 |
| 24238 | switchgear insulation | order-of-operations test | thermal-cycle fatigue | 7 |
| 24239 | switchgear insulation | order-of-operations test | vibration loosening | 7 |
| 24240 | switchgear insulation | order-of-operations test | whisker growth | 7 |
| 24241 | switchgear insulation | reference-ratio reporting | ESD damage | 7 |
| 24242 | switchgear insulation | reference-ratio reporting | UV embrittlement | 7 |
| 24243 | switchgear insulation | reference-ratio reporting | cavitation erosion | 7 |
| 24244 | switchgear insulation | reference-ratio reporting | creep relaxation | 7 |
| 24245 | switchgear insulation | reference-ratio reporting | delamination | 7 |
| 24246 | switchgear insulation | reference-ratio reporting | fretting | 7 |
| 24247 | switchgear insulation | reference-ratio reporting | galvanic couple current | 7 |
| 24248 | switchgear insulation | reference-ratio reporting | hydrogen embrittlement | 7 |
| 24249 | switchgear insulation | reference-ratio reporting | ionic contamination | 7 |
| 24250 | switchgear insulation | reference-ratio reporting | microbial corrosion | 7 |
| 24251 | switchgear insulation | reference-ratio reporting | misalignment | 7 |
| 24252 | switchgear insulation | reference-ratio reporting | moisture ingress | 7 |
| 24253 | switchgear insulation | reference-ratio reporting | outgassing | 7 |
| 24254 | switchgear insulation | reference-ratio reporting | particulate contamination | 7 |
| 24255 | switchgear insulation | reference-ratio reporting | process residue | 7 |
| 24256 | switchgear insulation | reference-ratio reporting | solder voiding | 7 |
| 24257 | switchgear insulation | reference-ratio reporting | stress-corrosion cracking | 7 |
| 24258 | switchgear insulation | reference-ratio reporting | thermal-cycle fatigue | 7 |
| 24259 | switchgear insulation | reference-ratio reporting | vibration loosening | 7 |
| 24260 | switchgear insulation | reference-ratio reporting | whisker growth | 7 |
| 24261 | switchgear insulation | sample-history audit | ESD damage | 7 |
| 24262 | switchgear insulation | sample-history audit | UV embrittlement | 7 |
| 24263 | switchgear insulation | sample-history audit | cavitation erosion | 7 |
| 24264 | switchgear insulation | sample-history audit | creep relaxation | 7 |
| 24265 | switchgear insulation | sample-history audit | delamination | 7 |
| 24266 | switchgear insulation | sample-history audit | fretting | 7 |
| 24267 | switchgear insulation | sample-history audit | galvanic couple current | 7 |
| 24268 | switchgear insulation | sample-history audit | hydrogen embrittlement | 7 |
| 24269 | switchgear insulation | sample-history audit | ionic contamination | 7 |
| 24270 | switchgear insulation | sample-history audit | microbial corrosion | 7 |
| 24271 | switchgear insulation | sample-history audit | misalignment | 7 |
| 24272 | switchgear insulation | sample-history audit | moisture ingress | 7 |
| 24273 | switchgear insulation | sample-history audit | outgassing | 7 |
| 24274 | switchgear insulation | sample-history audit | particulate contamination | 7 |
| 24275 | switchgear insulation | sample-history audit | process residue | 7 |
| 24276 | switchgear insulation | sample-history audit | solder voiding | 7 |
| 24277 | switchgear insulation | sample-history audit | stress-corrosion cracking | 7 |
| 24278 | switchgear insulation | sample-history audit | thermal-cycle fatigue | 7 |
| 24279 | switchgear insulation | sample-history audit | vibration loosening | 7 |
| 24280 | switchgear insulation | sample-history audit | whisker growth | 7 |
| 24281 | switchgear insulation | saturation sweep | ESD damage | 7 |
| 24282 | switchgear insulation | saturation sweep | UV embrittlement | 7 |
| 24283 | switchgear insulation | saturation sweep | cavitation erosion | 7 |
| 24284 | switchgear insulation | saturation sweep | creep relaxation | 7 |
| 24285 | switchgear insulation | saturation sweep | delamination | 7 |
| 24286 | switchgear insulation | saturation sweep | fretting | 7 |
| 24287 | switchgear insulation | saturation sweep | galvanic couple current | 7 |
| 24288 | switchgear insulation | saturation sweep | hydrogen embrittlement | 7 |
| 24289 | switchgear insulation | saturation sweep | ionic contamination | 7 |
| 24290 | switchgear insulation | saturation sweep | microbial corrosion | 7 |
| 24291 | switchgear insulation | saturation sweep | misalignment | 7 |
| 24292 | switchgear insulation | saturation sweep | moisture ingress | 7 |
| 24293 | switchgear insulation | saturation sweep | outgassing | 7 |
| 24294 | switchgear insulation | saturation sweep | particulate contamination | 7 |
| 24295 | switchgear insulation | saturation sweep | process residue | 7 |
| 24296 | switchgear insulation | saturation sweep | solder voiding | 7 |
| 24297 | switchgear insulation | saturation sweep | stress-corrosion cracking | 7 |
| 24298 | switchgear insulation | saturation sweep | thermal-cycle fatigue | 7 |
| 24299 | switchgear insulation | saturation sweep | vibration loosening | 7 |
| 24300 | switchgear insulation | saturation sweep | whisker growth | 7 |
| 24301 | switchgear insulation | second-condition replicate | ESD damage | 7 |
| 24302 | switchgear insulation | second-condition replicate | UV embrittlement | 7 |
| 24303 | switchgear insulation | second-condition replicate | cavitation erosion | 7 |
| 24304 | switchgear insulation | second-condition replicate | creep relaxation | 7 |
| 24305 | switchgear insulation | second-condition replicate | delamination | 7 |
| 24306 | switchgear insulation | second-condition replicate | fretting | 7 |
| 24307 | switchgear insulation | second-condition replicate | galvanic couple current | 7 |
| 24308 | switchgear insulation | second-condition replicate | hydrogen embrittlement | 7 |
| 24309 | switchgear insulation | second-condition replicate | ionic contamination | 7 |
| 24310 | switchgear insulation | second-condition replicate | microbial corrosion | 7 |
| 24311 | switchgear insulation | second-condition replicate | misalignment | 7 |
| 24312 | switchgear insulation | second-condition replicate | moisture ingress | 7 |
| 24313 | switchgear insulation | second-condition replicate | outgassing | 7 |
| 24314 | switchgear insulation | second-condition replicate | particulate contamination | 7 |
| 24315 | switchgear insulation | second-condition replicate | process residue | 7 |
| 24316 | switchgear insulation | second-condition replicate | solder voiding | 7 |
| 24317 | switchgear insulation | second-condition replicate | stress-corrosion cracking | 7 |
| 24318 | switchgear insulation | second-condition replicate | thermal-cycle fatigue | 7 |
| 24319 | switchgear insulation | second-condition replicate | vibration loosening | 7 |
| 24320 | switchgear insulation | second-condition replicate | whisker growth | 7 |
| 24321 | switchgear insulation | three-estimator agreement | ESD damage | 7 |
| 24322 | switchgear insulation | three-estimator agreement | UV embrittlement | 7 |
| 24323 | switchgear insulation | three-estimator agreement | cavitation erosion | 7 |
| 24324 | switchgear insulation | three-estimator agreement | creep relaxation | 7 |
| 24325 | switchgear insulation | three-estimator agreement | delamination | 7 |
| 24326 | switchgear insulation | three-estimator agreement | fretting | 7 |
| 24327 | switchgear insulation | three-estimator agreement | galvanic couple current | 7 |
| 24328 | switchgear insulation | three-estimator agreement | hydrogen embrittlement | 7 |
| 24329 | switchgear insulation | three-estimator agreement | ionic contamination | 7 |
| 24330 | switchgear insulation | three-estimator agreement | microbial corrosion | 7 |
| 24331 | switchgear insulation | three-estimator agreement | misalignment | 7 |
| 24332 | switchgear insulation | three-estimator agreement | moisture ingress | 7 |
| 24333 | switchgear insulation | three-estimator agreement | outgassing | 7 |
| 24334 | switchgear insulation | three-estimator agreement | particulate contamination | 7 |
| 24335 | switchgear insulation | three-estimator agreement | process residue | 7 |
| 24336 | switchgear insulation | three-estimator agreement | solder voiding | 7 |
| 24337 | switchgear insulation | three-estimator agreement | stress-corrosion cracking | 7 |
| 24338 | switchgear insulation | three-estimator agreement | thermal-cycle fatigue | 7 |
| 24339 | switchgear insulation | three-estimator agreement | vibration loosening | 7 |
| 24340 | switchgear insulation | three-estimator agreement | whisker growth | 7 |
| 24341 | switchgear insulation | threshold-stability sweep | ESD damage | 7 |
| 24342 | switchgear insulation | threshold-stability sweep | UV embrittlement | 7 |
| 24343 | switchgear insulation | threshold-stability sweep | cavitation erosion | 7 |
| 24344 | switchgear insulation | threshold-stability sweep | creep relaxation | 7 |
| 24345 | switchgear insulation | threshold-stability sweep | delamination | 7 |
| 24346 | switchgear insulation | threshold-stability sweep | fretting | 7 |
| 24347 | switchgear insulation | threshold-stability sweep | galvanic couple current | 7 |
| 24348 | switchgear insulation | threshold-stability sweep | hydrogen embrittlement | 7 |
| 24349 | switchgear insulation | threshold-stability sweep | ionic contamination | 7 |
| 24350 | switchgear insulation | threshold-stability sweep | microbial corrosion | 7 |
| 24351 | switchgear insulation | threshold-stability sweep | misalignment | 7 |
| 24352 | switchgear insulation | threshold-stability sweep | moisture ingress | 7 |
| 24353 | switchgear insulation | threshold-stability sweep | outgassing | 7 |
| 24354 | switchgear insulation | threshold-stability sweep | particulate contamination | 7 |
| 24355 | switchgear insulation | threshold-stability sweep | process residue | 7 |
| 24356 | switchgear insulation | threshold-stability sweep | solder voiding | 7 |
| 24357 | switchgear insulation | threshold-stability sweep | stress-corrosion cracking | 7 |
| 24358 | switchgear insulation | threshold-stability sweep | thermal-cycle fatigue | 7 |
| 24359 | switchgear insulation | threshold-stability sweep | vibration loosening | 7 |
| 24360 | switchgear insulation | threshold-stability sweep | whisker growth | 7 |
| 24361 | switchgear insulation | time-zero control | ESD damage | 7 |
| 24362 | switchgear insulation | time-zero control | UV embrittlement | 7 |
| 24363 | switchgear insulation | time-zero control | cavitation erosion | 7 |
| 24364 | switchgear insulation | time-zero control | creep relaxation | 7 |
| 24365 | switchgear insulation | time-zero control | delamination | 7 |
| 24366 | switchgear insulation | time-zero control | fretting | 7 |
| 24367 | switchgear insulation | time-zero control | galvanic couple current | 7 |
| 24368 | switchgear insulation | time-zero control | hydrogen embrittlement | 7 |
| 24369 | switchgear insulation | time-zero control | ionic contamination | 7 |
| 24370 | switchgear insulation | time-zero control | microbial corrosion | 7 |
| 24371 | switchgear insulation | time-zero control | misalignment | 7 |
| 24372 | switchgear insulation | time-zero control | moisture ingress | 7 |
| 24373 | switchgear insulation | time-zero control | outgassing | 7 |
| 24374 | switchgear insulation | time-zero control | particulate contamination | 7 |
| 24375 | switchgear insulation | time-zero control | process residue | 7 |
| 24376 | switchgear insulation | time-zero control | solder voiding | 7 |
| 24377 | switchgear insulation | time-zero control | stress-corrosion cracking | 7 |
| 24378 | switchgear insulation | time-zero control | thermal-cycle fatigue | 7 |
| 24379 | switchgear insulation | time-zero control | vibration loosening | 7 |
| 24380 | switchgear insulation | time-zero control | whisker growth | 7 |
| 24381 | switchgear insulation | two-condition identifiability | ESD damage | 7 |
| 24382 | switchgear insulation | two-condition identifiability | UV embrittlement | 7 |
| 24383 | switchgear insulation | two-condition identifiability | cavitation erosion | 7 |
| 24384 | switchgear insulation | two-condition identifiability | creep relaxation | 7 |
| 24385 | switchgear insulation | two-condition identifiability | delamination | 7 |
| 24386 | switchgear insulation | two-condition identifiability | fretting | 7 |
| 24387 | switchgear insulation | two-condition identifiability | galvanic couple current | 7 |
| 24388 | switchgear insulation | two-condition identifiability | hydrogen embrittlement | 7 |
| 24389 | switchgear insulation | two-condition identifiability | ionic contamination | 7 |
| 24390 | switchgear insulation | two-condition identifiability | microbial corrosion | 7 |
| 24391 | switchgear insulation | two-condition identifiability | misalignment | 7 |
| 24392 | switchgear insulation | two-condition identifiability | moisture ingress | 7 |
| 24393 | switchgear insulation | two-condition identifiability | outgassing | 7 |
| 24394 | switchgear insulation | two-condition identifiability | particulate contamination | 7 |
| 24395 | switchgear insulation | two-condition identifiability | process residue | 7 |
| 24396 | switchgear insulation | two-condition identifiability | solder voiding | 7 |
| 24397 | switchgear insulation | two-condition identifiability | stress-corrosion cracking | 7 |
| 24398 | switchgear insulation | two-condition identifiability | thermal-cycle fatigue | 7 |
| 24399 | switchgear insulation | two-condition identifiability | vibration loosening | 7 |
| 24400 | switchgear insulation | two-condition identifiability | whisker growth | 7 |
| 24401 | tidal turbines | blank as sample | ESD damage | 7 |
| 24402 | tidal turbines | blank as sample | UV embrittlement | 7 |
| 24403 | tidal turbines | blank as sample | cavitation erosion | 7 |
| 24404 | tidal turbines | blank as sample | creep relaxation | 7 |
| 24405 | tidal turbines | blank as sample | delamination | 7 |
| 24406 | tidal turbines | blank as sample | fretting | 7 |
| 24407 | tidal turbines | blank as sample | galvanic couple current | 7 |
| 24408 | tidal turbines | blank as sample | hydrogen embrittlement | 7 |
| 24409 | tidal turbines | blank as sample | ionic contamination | 7 |
| 24410 | tidal turbines | blank as sample | microbial corrosion | 7 |
| 24411 | tidal turbines | blank as sample | misalignment | 7 |
| 24412 | tidal turbines | blank as sample | moisture ingress | 7 |
| 24413 | tidal turbines | blank as sample | outgassing | 7 |
| 24414 | tidal turbines | blank as sample | particulate contamination | 7 |
| 24415 | tidal turbines | blank as sample | process residue | 7 |
| 24416 | tidal turbines | blank as sample | solder voiding | 7 |
| 24417 | tidal turbines | blank as sample | stress-corrosion cracking | 7 |
| 24418 | tidal turbines | blank as sample | thermal-cycle fatigue | 7 |
| 24419 | tidal turbines | blank as sample | vibration loosening | 7 |
| 24420 | tidal turbines | blank as sample | whisker growth | 7 |
| 24421 | tidal turbines | cross-instrument transfer | ESD damage | 7 |
| 24422 | tidal turbines | cross-instrument transfer | UV embrittlement | 7 |
| 24423 | tidal turbines | cross-instrument transfer | cavitation erosion | 7 |
| 24424 | tidal turbines | cross-instrument transfer | creep relaxation | 7 |
| 24425 | tidal turbines | cross-instrument transfer | delamination | 7 |
| 24426 | tidal turbines | cross-instrument transfer | fretting | 7 |
| 24427 | tidal turbines | cross-instrument transfer | galvanic couple current | 7 |
| 24428 | tidal turbines | cross-instrument transfer | hydrogen embrittlement | 7 |
| 24429 | tidal turbines | cross-instrument transfer | ionic contamination | 7 |
| 24430 | tidal turbines | cross-instrument transfer | microbial corrosion | 7 |
| 24431 | tidal turbines | cross-instrument transfer | misalignment | 7 |
| 24432 | tidal turbines | cross-instrument transfer | moisture ingress | 7 |
| 24433 | tidal turbines | cross-instrument transfer | outgassing | 7 |
| 24434 | tidal turbines | cross-instrument transfer | particulate contamination | 7 |
| 24435 | tidal turbines | cross-instrument transfer | process residue | 7 |
| 24436 | tidal turbines | cross-instrument transfer | solder voiding | 7 |
| 24437 | tidal turbines | cross-instrument transfer | stress-corrosion cracking | 7 |
| 24438 | tidal turbines | cross-instrument transfer | thermal-cycle fatigue | 7 |
| 24439 | tidal turbines | cross-instrument transfer | vibration loosening | 7 |
| 24440 | tidal turbines | cross-instrument transfer | whisker growth | 7 |
| 24441 | tidal turbines | derived-column detector | ESD damage | 7 |
| 24442 | tidal turbines | derived-column detector | UV embrittlement | 7 |
| 24443 | tidal turbines | derived-column detector | cavitation erosion | 7 |
| 24444 | tidal turbines | derived-column detector | creep relaxation | 7 |
| 24445 | tidal turbines | derived-column detector | delamination | 7 |
| 24446 | tidal turbines | derived-column detector | fretting | 7 |
| 24447 | tidal turbines | derived-column detector | galvanic couple current | 7 |
| 24448 | tidal turbines | derived-column detector | hydrogen embrittlement | 7 |
| 24449 | tidal turbines | derived-column detector | ionic contamination | 7 |
| 24450 | tidal turbines | derived-column detector | microbial corrosion | 7 |
| 24451 | tidal turbines | derived-column detector | misalignment | 7 |
| 24452 | tidal turbines | derived-column detector | moisture ingress | 7 |
| 24453 | tidal turbines | derived-column detector | outgassing | 7 |
| 24454 | tidal turbines | derived-column detector | particulate contamination | 7 |
| 24455 | tidal turbines | derived-column detector | process residue | 7 |
| 24456 | tidal turbines | derived-column detector | solder voiding | 7 |
| 24457 | tidal turbines | derived-column detector | stress-corrosion cracking | 7 |
| 24458 | tidal turbines | derived-column detector | thermal-cycle fatigue | 7 |
| 24459 | tidal turbines | derived-column detector | vibration loosening | 7 |
| 24460 | tidal turbines | derived-column detector | whisker growth | 7 |
| 24461 | tidal turbines | distribution not mean | ESD damage | 7 |
| 24462 | tidal turbines | distribution not mean | UV embrittlement | 7 |
| 24463 | tidal turbines | distribution not mean | cavitation erosion | 7 |
| 24464 | tidal turbines | distribution not mean | creep relaxation | 7 |
| 24465 | tidal turbines | distribution not mean | delamination | 7 |
| 24466 | tidal turbines | distribution not mean | fretting | 7 |
| 24467 | tidal turbines | distribution not mean | galvanic couple current | 7 |
| 24468 | tidal turbines | distribution not mean | hydrogen embrittlement | 7 |
| 24469 | tidal turbines | distribution not mean | ionic contamination | 7 |
| 24470 | tidal turbines | distribution not mean | microbial corrosion | 7 |
| 24471 | tidal turbines | distribution not mean | misalignment | 7 |
| 24472 | tidal turbines | distribution not mean | moisture ingress | 7 |
| 24473 | tidal turbines | distribution not mean | outgassing | 7 |
| 24474 | tidal turbines | distribution not mean | particulate contamination | 7 |
| 24475 | tidal turbines | distribution not mean | process residue | 7 |
| 24476 | tidal turbines | distribution not mean | solder voiding | 7 |
| 24477 | tidal turbines | distribution not mean | stress-corrosion cracking | 7 |
| 24478 | tidal turbines | distribution not mean | thermal-cycle fatigue | 7 |
| 24479 | tidal turbines | distribution not mean | vibration loosening | 7 |
| 24480 | tidal turbines | distribution not mean | whisker growth | 7 |
| 24481 | tidal turbines | hysteresis cycle | ESD damage | 7 |
| 24482 | tidal turbines | hysteresis cycle | UV embrittlement | 7 |
| 24483 | tidal turbines | hysteresis cycle | cavitation erosion | 7 |
| 24484 | tidal turbines | hysteresis cycle | creep relaxation | 7 |
| 24485 | tidal turbines | hysteresis cycle | delamination | 7 |
| 24486 | tidal turbines | hysteresis cycle | fretting | 7 |
| 24487 | tidal turbines | hysteresis cycle | galvanic couple current | 7 |
| 24488 | tidal turbines | hysteresis cycle | hydrogen embrittlement | 7 |
| 24489 | tidal turbines | hysteresis cycle | ionic contamination | 7 |
| 24490 | tidal turbines | hysteresis cycle | microbial corrosion | 7 |
| 24491 | tidal turbines | hysteresis cycle | misalignment | 7 |
| 24492 | tidal turbines | hysteresis cycle | moisture ingress | 7 |
| 24493 | tidal turbines | hysteresis cycle | outgassing | 7 |
| 24494 | tidal turbines | hysteresis cycle | particulate contamination | 7 |
| 24495 | tidal turbines | hysteresis cycle | process residue | 7 |
| 24496 | tidal turbines | hysteresis cycle | solder voiding | 7 |
| 24497 | tidal turbines | hysteresis cycle | stress-corrosion cracking | 7 |
| 24498 | tidal turbines | hysteresis cycle | thermal-cycle fatigue | 7 |
| 24499 | tidal turbines | hysteresis cycle | vibration loosening | 7 |
| 24500 | tidal turbines | hysteresis cycle | whisker growth | 7 |
| 24501 | tidal turbines | negative control arm | ESD damage | 7 |
| 24502 | tidal turbines | negative control arm | UV embrittlement | 7 |
| 24503 | tidal turbines | negative control arm | cavitation erosion | 7 |
| 24504 | tidal turbines | negative control arm | creep relaxation | 7 |
| 24505 | tidal turbines | negative control arm | delamination | 7 |
| 24506 | tidal turbines | negative control arm | fretting | 7 |
| 24507 | tidal turbines | negative control arm | galvanic couple current | 7 |
| 24508 | tidal turbines | negative control arm | hydrogen embrittlement | 7 |
| 24509 | tidal turbines | negative control arm | ionic contamination | 7 |
| 24510 | tidal turbines | negative control arm | microbial corrosion | 7 |
| 24511 | tidal turbines | negative control arm | misalignment | 7 |
| 24512 | tidal turbines | negative control arm | moisture ingress | 7 |
| 24513 | tidal turbines | negative control arm | outgassing | 7 |
| 24514 | tidal turbines | negative control arm | particulate contamination | 7 |
| 24515 | tidal turbines | negative control arm | process residue | 7 |
| 24516 | tidal turbines | negative control arm | solder voiding | 7 |
| 24517 | tidal turbines | negative control arm | stress-corrosion cracking | 7 |
| 24518 | tidal turbines | negative control arm | thermal-cycle fatigue | 7 |
| 24519 | tidal turbines | negative control arm | vibration loosening | 7 |
| 24520 | tidal turbines | negative control arm | whisker growth | 7 |
| 24521 | tidal turbines | order-of-operations test | ESD damage | 7 |
| 24522 | tidal turbines | order-of-operations test | UV embrittlement | 7 |
| 24523 | tidal turbines | order-of-operations test | cavitation erosion | 7 |
| 24524 | tidal turbines | order-of-operations test | creep relaxation | 7 |
| 24525 | tidal turbines | order-of-operations test | delamination | 7 |
| 24526 | tidal turbines | order-of-operations test | fretting | 7 |
| 24527 | tidal turbines | order-of-operations test | galvanic couple current | 7 |
| 24528 | tidal turbines | order-of-operations test | hydrogen embrittlement | 7 |
| 24529 | tidal turbines | order-of-operations test | ionic contamination | 7 |
| 24530 | tidal turbines | order-of-operations test | microbial corrosion | 7 |
| 24531 | tidal turbines | order-of-operations test | misalignment | 7 |
| 24532 | tidal turbines | order-of-operations test | moisture ingress | 7 |
| 24533 | tidal turbines | order-of-operations test | outgassing | 7 |
| 24534 | tidal turbines | order-of-operations test | particulate contamination | 7 |
| 24535 | tidal turbines | order-of-operations test | process residue | 7 |
| 24536 | tidal turbines | order-of-operations test | solder voiding | 7 |
| 24537 | tidal turbines | order-of-operations test | stress-corrosion cracking | 7 |
| 24538 | tidal turbines | order-of-operations test | thermal-cycle fatigue | 7 |
| 24539 | tidal turbines | order-of-operations test | vibration loosening | 7 |
| 24540 | tidal turbines | order-of-operations test | whisker growth | 7 |
| 24541 | tidal turbines | reference-ratio reporting | ESD damage | 7 |
| 24542 | tidal turbines | reference-ratio reporting | UV embrittlement | 7 |
| 24543 | tidal turbines | reference-ratio reporting | cavitation erosion | 7 |
| 24544 | tidal turbines | reference-ratio reporting | creep relaxation | 7 |
| 24545 | tidal turbines | reference-ratio reporting | delamination | 7 |
| 24546 | tidal turbines | reference-ratio reporting | fretting | 7 |
| 24547 | tidal turbines | reference-ratio reporting | galvanic couple current | 7 |
| 24548 | tidal turbines | reference-ratio reporting | hydrogen embrittlement | 7 |
| 24549 | tidal turbines | reference-ratio reporting | ionic contamination | 7 |
| 24550 | tidal turbines | reference-ratio reporting | microbial corrosion | 7 |
| 24551 | tidal turbines | reference-ratio reporting | misalignment | 7 |
| 24552 | tidal turbines | reference-ratio reporting | moisture ingress | 7 |
| 24553 | tidal turbines | reference-ratio reporting | outgassing | 7 |
| 24554 | tidal turbines | reference-ratio reporting | particulate contamination | 7 |
| 24555 | tidal turbines | reference-ratio reporting | process residue | 7 |
| 24556 | tidal turbines | reference-ratio reporting | solder voiding | 7 |
| 24557 | tidal turbines | reference-ratio reporting | stress-corrosion cracking | 7 |
| 24558 | tidal turbines | reference-ratio reporting | thermal-cycle fatigue | 7 |
| 24559 | tidal turbines | reference-ratio reporting | vibration loosening | 7 |
| 24560 | tidal turbines | reference-ratio reporting | whisker growth | 7 |
| 24561 | tidal turbines | sample-history audit | ESD damage | 7 |
| 24562 | tidal turbines | sample-history audit | UV embrittlement | 7 |
| 24563 | tidal turbines | sample-history audit | cavitation erosion | 7 |
| 24564 | tidal turbines | sample-history audit | creep relaxation | 7 |
| 24565 | tidal turbines | sample-history audit | delamination | 7 |
| 24566 | tidal turbines | sample-history audit | fretting | 7 |
| 24567 | tidal turbines | sample-history audit | galvanic couple current | 7 |
| 24568 | tidal turbines | sample-history audit | hydrogen embrittlement | 7 |
| 24569 | tidal turbines | sample-history audit | ionic contamination | 7 |
| 24570 | tidal turbines | sample-history audit | microbial corrosion | 7 |
| 24571 | tidal turbines | sample-history audit | misalignment | 7 |
| 24572 | tidal turbines | sample-history audit | moisture ingress | 7 |
| 24573 | tidal turbines | sample-history audit | outgassing | 7 |
| 24574 | tidal turbines | sample-history audit | particulate contamination | 7 |
| 24575 | tidal turbines | sample-history audit | process residue | 7 |
| 24576 | tidal turbines | sample-history audit | solder voiding | 7 |
| 24577 | tidal turbines | sample-history audit | stress-corrosion cracking | 7 |
| 24578 | tidal turbines | sample-history audit | thermal-cycle fatigue | 7 |
| 24579 | tidal turbines | sample-history audit | vibration loosening | 7 |
| 24580 | tidal turbines | sample-history audit | whisker growth | 7 |
| 24581 | tidal turbines | saturation sweep | ESD damage | 7 |
| 24582 | tidal turbines | saturation sweep | UV embrittlement | 7 |
| 24583 | tidal turbines | saturation sweep | cavitation erosion | 7 |
| 24584 | tidal turbines | saturation sweep | creep relaxation | 7 |
| 24585 | tidal turbines | saturation sweep | delamination | 7 |
| 24586 | tidal turbines | saturation sweep | fretting | 7 |
| 24587 | tidal turbines | saturation sweep | galvanic couple current | 7 |
| 24588 | tidal turbines | saturation sweep | hydrogen embrittlement | 7 |
| 24589 | tidal turbines | saturation sweep | ionic contamination | 7 |
| 24590 | tidal turbines | saturation sweep | microbial corrosion | 7 |
| 24591 | tidal turbines | saturation sweep | misalignment | 7 |
| 24592 | tidal turbines | saturation sweep | moisture ingress | 7 |
| 24593 | tidal turbines | saturation sweep | outgassing | 7 |
| 24594 | tidal turbines | saturation sweep | particulate contamination | 7 |
| 24595 | tidal turbines | saturation sweep | process residue | 7 |
| 24596 | tidal turbines | saturation sweep | solder voiding | 7 |
| 24597 | tidal turbines | saturation sweep | stress-corrosion cracking | 7 |
| 24598 | tidal turbines | saturation sweep | thermal-cycle fatigue | 7 |
| 24599 | tidal turbines | saturation sweep | vibration loosening | 7 |
| 24600 | tidal turbines | saturation sweep | whisker growth | 7 |
| 24601 | tidal turbines | second-condition replicate | ESD damage | 7 |
| 24602 | tidal turbines | second-condition replicate | UV embrittlement | 7 |
| 24603 | tidal turbines | second-condition replicate | cavitation erosion | 7 |
| 24604 | tidal turbines | second-condition replicate | creep relaxation | 7 |
| 24605 | tidal turbines | second-condition replicate | delamination | 7 |
| 24606 | tidal turbines | second-condition replicate | fretting | 7 |
| 24607 | tidal turbines | second-condition replicate | galvanic couple current | 7 |
| 24608 | tidal turbines | second-condition replicate | hydrogen embrittlement | 7 |
| 24609 | tidal turbines | second-condition replicate | ionic contamination | 7 |
| 24610 | tidal turbines | second-condition replicate | microbial corrosion | 7 |
| 24611 | tidal turbines | second-condition replicate | misalignment | 7 |
| 24612 | tidal turbines | second-condition replicate | moisture ingress | 7 |
| 24613 | tidal turbines | second-condition replicate | outgassing | 7 |
| 24614 | tidal turbines | second-condition replicate | particulate contamination | 7 |
| 24615 | tidal turbines | second-condition replicate | process residue | 7 |
| 24616 | tidal turbines | second-condition replicate | solder voiding | 7 |
| 24617 | tidal turbines | second-condition replicate | stress-corrosion cracking | 7 |
| 24618 | tidal turbines | second-condition replicate | thermal-cycle fatigue | 7 |
| 24619 | tidal turbines | second-condition replicate | vibration loosening | 7 |
| 24620 | tidal turbines | second-condition replicate | whisker growth | 7 |
| 24621 | tidal turbines | three-estimator agreement | ESD damage | 7 |
| 24622 | tidal turbines | three-estimator agreement | UV embrittlement | 7 |
| 24623 | tidal turbines | three-estimator agreement | cavitation erosion | 7 |
| 24624 | tidal turbines | three-estimator agreement | creep relaxation | 7 |
| 24625 | tidal turbines | three-estimator agreement | delamination | 7 |
| 24626 | tidal turbines | three-estimator agreement | fretting | 7 |
| 24627 | tidal turbines | three-estimator agreement | galvanic couple current | 7 |
| 24628 | tidal turbines | three-estimator agreement | hydrogen embrittlement | 7 |
| 24629 | tidal turbines | three-estimator agreement | ionic contamination | 7 |
| 24630 | tidal turbines | three-estimator agreement | microbial corrosion | 7 |
| 24631 | tidal turbines | three-estimator agreement | misalignment | 7 |
| 24632 | tidal turbines | three-estimator agreement | moisture ingress | 7 |
| 24633 | tidal turbines | three-estimator agreement | outgassing | 7 |
| 24634 | tidal turbines | three-estimator agreement | particulate contamination | 7 |
| 24635 | tidal turbines | three-estimator agreement | process residue | 7 |
| 24636 | tidal turbines | three-estimator agreement | solder voiding | 7 |
| 24637 | tidal turbines | three-estimator agreement | stress-corrosion cracking | 7 |
| 24638 | tidal turbines | three-estimator agreement | thermal-cycle fatigue | 7 |
| 24639 | tidal turbines | three-estimator agreement | vibration loosening | 7 |
| 24640 | tidal turbines | three-estimator agreement | whisker growth | 7 |
| 24641 | tidal turbines | threshold-stability sweep | ESD damage | 7 |
| 24642 | tidal turbines | threshold-stability sweep | UV embrittlement | 7 |
| 24643 | tidal turbines | threshold-stability sweep | cavitation erosion | 7 |
| 24644 | tidal turbines | threshold-stability sweep | creep relaxation | 7 |
| 24645 | tidal turbines | threshold-stability sweep | delamination | 7 |
| 24646 | tidal turbines | threshold-stability sweep | fretting | 7 |
| 24647 | tidal turbines | threshold-stability sweep | galvanic couple current | 7 |
| 24648 | tidal turbines | threshold-stability sweep | hydrogen embrittlement | 7 |
| 24649 | tidal turbines | threshold-stability sweep | ionic contamination | 7 |
| 24650 | tidal turbines | threshold-stability sweep | microbial corrosion | 7 |
| 24651 | tidal turbines | threshold-stability sweep | misalignment | 7 |
| 24652 | tidal turbines | threshold-stability sweep | moisture ingress | 7 |
| 24653 | tidal turbines | threshold-stability sweep | outgassing | 7 |
| 24654 | tidal turbines | threshold-stability sweep | particulate contamination | 7 |
| 24655 | tidal turbines | threshold-stability sweep | process residue | 7 |
| 24656 | tidal turbines | threshold-stability sweep | solder voiding | 7 |
| 24657 | tidal turbines | threshold-stability sweep | stress-corrosion cracking | 7 |
| 24658 | tidal turbines | threshold-stability sweep | thermal-cycle fatigue | 7 |
| 24659 | tidal turbines | threshold-stability sweep | vibration loosening | 7 |
| 24660 | tidal turbines | threshold-stability sweep | whisker growth | 7 |
| 24661 | tidal turbines | time-zero control | ESD damage | 7 |
| 24662 | tidal turbines | time-zero control | UV embrittlement | 7 |
| 24663 | tidal turbines | time-zero control | cavitation erosion | 7 |
| 24664 | tidal turbines | time-zero control | creep relaxation | 7 |
| 24665 | tidal turbines | time-zero control | delamination | 7 |
| 24666 | tidal turbines | time-zero control | fretting | 7 |
| 24667 | tidal turbines | time-zero control | galvanic couple current | 7 |
| 24668 | tidal turbines | time-zero control | hydrogen embrittlement | 7 |
| 24669 | tidal turbines | time-zero control | ionic contamination | 7 |
| 24670 | tidal turbines | time-zero control | microbial corrosion | 7 |
| 24671 | tidal turbines | time-zero control | misalignment | 7 |
| 24672 | tidal turbines | time-zero control | moisture ingress | 7 |
| 24673 | tidal turbines | time-zero control | outgassing | 7 |
| 24674 | tidal turbines | time-zero control | particulate contamination | 7 |
| 24675 | tidal turbines | time-zero control | process residue | 7 |
| 24676 | tidal turbines | time-zero control | solder voiding | 7 |
| 24677 | tidal turbines | time-zero control | stress-corrosion cracking | 7 |
| 24678 | tidal turbines | time-zero control | thermal-cycle fatigue | 7 |
| 24679 | tidal turbines | time-zero control | vibration loosening | 7 |
| 24680 | tidal turbines | time-zero control | whisker growth | 7 |
| 24681 | tidal turbines | two-condition identifiability | ESD damage | 7 |
| 24682 | tidal turbines | two-condition identifiability | UV embrittlement | 7 |
| 24683 | tidal turbines | two-condition identifiability | cavitation erosion | 7 |
| 24684 | tidal turbines | two-condition identifiability | creep relaxation | 7 |
| 24685 | tidal turbines | two-condition identifiability | delamination | 7 |
| 24686 | tidal turbines | two-condition identifiability | fretting | 7 |
| 24687 | tidal turbines | two-condition identifiability | galvanic couple current | 7 |
| 24688 | tidal turbines | two-condition identifiability | hydrogen embrittlement | 7 |
| 24689 | tidal turbines | two-condition identifiability | ionic contamination | 7 |
| 24690 | tidal turbines | two-condition identifiability | microbial corrosion | 7 |
| 24691 | tidal turbines | two-condition identifiability | misalignment | 7 |
| 24692 | tidal turbines | two-condition identifiability | moisture ingress | 7 |
| 24693 | tidal turbines | two-condition identifiability | outgassing | 7 |
| 24694 | tidal turbines | two-condition identifiability | particulate contamination | 7 |
| 24695 | tidal turbines | two-condition identifiability | process residue | 7 |
| 24696 | tidal turbines | two-condition identifiability | solder voiding | 7 |
| 24697 | tidal turbines | two-condition identifiability | stress-corrosion cracking | 7 |
| 24698 | tidal turbines | two-condition identifiability | thermal-cycle fatigue | 7 |
| 24699 | tidal turbines | two-condition identifiability | vibration loosening | 7 |
| 24700 | tidal turbines | two-condition identifiability | whisker growth | 7 |
| 24701 | wafer polishing | blank as sample | ESD damage | 7 |
| 24702 | wafer polishing | blank as sample | UV embrittlement | 7 |
| 24703 | wafer polishing | blank as sample | cavitation erosion | 7 |
| 24704 | wafer polishing | blank as sample | creep relaxation | 7 |
| 24705 | wafer polishing | blank as sample | delamination | 7 |
| 24706 | wafer polishing | blank as sample | fretting | 7 |
| 24707 | wafer polishing | blank as sample | galvanic couple current | 7 |
| 24708 | wafer polishing | blank as sample | hydrogen embrittlement | 7 |
| 24709 | wafer polishing | blank as sample | ionic contamination | 7 |
| 24710 | wafer polishing | blank as sample | microbial corrosion | 7 |
| 24711 | wafer polishing | blank as sample | misalignment | 7 |
| 24712 | wafer polishing | blank as sample | moisture ingress | 7 |
| 24713 | wafer polishing | blank as sample | outgassing | 7 |
| 24714 | wafer polishing | blank as sample | particulate contamination | 7 |
| 24715 | wafer polishing | blank as sample | process residue | 7 |
| 24716 | wafer polishing | blank as sample | solder voiding | 7 |
| 24717 | wafer polishing | blank as sample | stress-corrosion cracking | 7 |
| 24718 | wafer polishing | blank as sample | thermal-cycle fatigue | 7 |
| 24719 | wafer polishing | blank as sample | vibration loosening | 7 |
| 24720 | wafer polishing | blank as sample | whisker growth | 7 |
| 24721 | wafer polishing | cross-instrument transfer | ESD damage | 7 |
| 24722 | wafer polishing | cross-instrument transfer | UV embrittlement | 7 |
| 24723 | wafer polishing | cross-instrument transfer | cavitation erosion | 7 |
| 24724 | wafer polishing | cross-instrument transfer | creep relaxation | 7 |
| 24725 | wafer polishing | cross-instrument transfer | delamination | 7 |
| 24726 | wafer polishing | cross-instrument transfer | fretting | 7 |
| 24727 | wafer polishing | cross-instrument transfer | galvanic couple current | 7 |
| 24728 | wafer polishing | cross-instrument transfer | hydrogen embrittlement | 7 |
| 24729 | wafer polishing | cross-instrument transfer | ionic contamination | 7 |
| 24730 | wafer polishing | cross-instrument transfer | microbial corrosion | 7 |
| 24731 | wafer polishing | cross-instrument transfer | misalignment | 7 |
| 24732 | wafer polishing | cross-instrument transfer | moisture ingress | 7 |
| 24733 | wafer polishing | cross-instrument transfer | outgassing | 7 |
| 24734 | wafer polishing | cross-instrument transfer | particulate contamination | 7 |
| 24735 | wafer polishing | cross-instrument transfer | process residue | 7 |
| 24736 | wafer polishing | cross-instrument transfer | solder voiding | 7 |
| 24737 | wafer polishing | cross-instrument transfer | stress-corrosion cracking | 7 |
| 24738 | wafer polishing | cross-instrument transfer | thermal-cycle fatigue | 7 |
| 24739 | wafer polishing | cross-instrument transfer | vibration loosening | 7 |
| 24740 | wafer polishing | cross-instrument transfer | whisker growth | 7 |
| 24741 | wafer polishing | derived-column detector | ESD damage | 7 |
| 24742 | wafer polishing | derived-column detector | UV embrittlement | 7 |
| 24743 | wafer polishing | derived-column detector | cavitation erosion | 7 |
| 24744 | wafer polishing | derived-column detector | creep relaxation | 7 |
| 24745 | wafer polishing | derived-column detector | delamination | 7 |
| 24746 | wafer polishing | derived-column detector | fretting | 7 |
| 24747 | wafer polishing | derived-column detector | galvanic couple current | 7 |
| 24748 | wafer polishing | derived-column detector | hydrogen embrittlement | 7 |
| 24749 | wafer polishing | derived-column detector | ionic contamination | 7 |
| 24750 | wafer polishing | derived-column detector | microbial corrosion | 7 |
| 24751 | wafer polishing | derived-column detector | misalignment | 7 |
| 24752 | wafer polishing | derived-column detector | moisture ingress | 7 |
| 24753 | wafer polishing | derived-column detector | outgassing | 7 |
| 24754 | wafer polishing | derived-column detector | particulate contamination | 7 |
| 24755 | wafer polishing | derived-column detector | process residue | 7 |
| 24756 | wafer polishing | derived-column detector | solder voiding | 7 |
| 24757 | wafer polishing | derived-column detector | stress-corrosion cracking | 7 |
| 24758 | wafer polishing | derived-column detector | thermal-cycle fatigue | 7 |
| 24759 | wafer polishing | derived-column detector | vibration loosening | 7 |
| 24760 | wafer polishing | derived-column detector | whisker growth | 7 |
| 24761 | wafer polishing | distribution not mean | ESD damage | 7 |
| 24762 | wafer polishing | distribution not mean | UV embrittlement | 7 |
| 24763 | wafer polishing | distribution not mean | cavitation erosion | 7 |
| 24764 | wafer polishing | distribution not mean | creep relaxation | 7 |
| 24765 | wafer polishing | distribution not mean | delamination | 7 |
| 24766 | wafer polishing | distribution not mean | fretting | 7 |
| 24767 | wafer polishing | distribution not mean | galvanic couple current | 7 |
| 24768 | wafer polishing | distribution not mean | hydrogen embrittlement | 7 |
| 24769 | wafer polishing | distribution not mean | ionic contamination | 7 |
| 24770 | wafer polishing | distribution not mean | microbial corrosion | 7 |
| 24771 | wafer polishing | distribution not mean | misalignment | 7 |
| 24772 | wafer polishing | distribution not mean | moisture ingress | 7 |
| 24773 | wafer polishing | distribution not mean | outgassing | 7 |
| 24774 | wafer polishing | distribution not mean | particulate contamination | 7 |
| 24775 | wafer polishing | distribution not mean | process residue | 7 |
| 24776 | wafer polishing | distribution not mean | solder voiding | 7 |
| 24777 | wafer polishing | distribution not mean | stress-corrosion cracking | 7 |
| 24778 | wafer polishing | distribution not mean | thermal-cycle fatigue | 7 |
| 24779 | wafer polishing | distribution not mean | vibration loosening | 7 |
| 24780 | wafer polishing | distribution not mean | whisker growth | 7 |
| 24781 | wafer polishing | hysteresis cycle | ESD damage | 7 |
| 24782 | wafer polishing | hysteresis cycle | UV embrittlement | 7 |
| 24783 | wafer polishing | hysteresis cycle | cavitation erosion | 7 |
| 24784 | wafer polishing | hysteresis cycle | creep relaxation | 7 |
| 24785 | wafer polishing | hysteresis cycle | delamination | 7 |
| 24786 | wafer polishing | hysteresis cycle | fretting | 7 |
| 24787 | wafer polishing | hysteresis cycle | galvanic couple current | 7 |
| 24788 | wafer polishing | hysteresis cycle | hydrogen embrittlement | 7 |
| 24789 | wafer polishing | hysteresis cycle | ionic contamination | 7 |
| 24790 | wafer polishing | hysteresis cycle | microbial corrosion | 7 |
| 24791 | wafer polishing | hysteresis cycle | misalignment | 7 |
| 24792 | wafer polishing | hysteresis cycle | moisture ingress | 7 |
| 24793 | wafer polishing | hysteresis cycle | outgassing | 7 |
| 24794 | wafer polishing | hysteresis cycle | particulate contamination | 7 |
| 24795 | wafer polishing | hysteresis cycle | process residue | 7 |
| 24796 | wafer polishing | hysteresis cycle | solder voiding | 7 |
| 24797 | wafer polishing | hysteresis cycle | stress-corrosion cracking | 7 |
| 24798 | wafer polishing | hysteresis cycle | thermal-cycle fatigue | 7 |
| 24799 | wafer polishing | hysteresis cycle | vibration loosening | 7 |
| 24800 | wafer polishing | hysteresis cycle | whisker growth | 7 |
| 24801 | wafer polishing | negative control arm | ESD damage | 7 |
| 24802 | wafer polishing | negative control arm | UV embrittlement | 7 |
| 24803 | wafer polishing | negative control arm | cavitation erosion | 7 |
| 24804 | wafer polishing | negative control arm | creep relaxation | 7 |
| 24805 | wafer polishing | negative control arm | delamination | 7 |
| 24806 | wafer polishing | negative control arm | fretting | 7 |
| 24807 | wafer polishing | negative control arm | galvanic couple current | 7 |
| 24808 | wafer polishing | negative control arm | hydrogen embrittlement | 7 |
| 24809 | wafer polishing | negative control arm | ionic contamination | 7 |
| 24810 | wafer polishing | negative control arm | microbial corrosion | 7 |
| 24811 | wafer polishing | negative control arm | misalignment | 7 |
| 24812 | wafer polishing | negative control arm | moisture ingress | 7 |
| 24813 | wafer polishing | negative control arm | outgassing | 7 |
| 24814 | wafer polishing | negative control arm | particulate contamination | 7 |
| 24815 | wafer polishing | negative control arm | process residue | 7 |
| 24816 | wafer polishing | negative control arm | solder voiding | 7 |
| 24817 | wafer polishing | negative control arm | stress-corrosion cracking | 7 |
| 24818 | wafer polishing | negative control arm | thermal-cycle fatigue | 7 |
| 24819 | wafer polishing | negative control arm | vibration loosening | 7 |
| 24820 | wafer polishing | negative control arm | whisker growth | 7 |
| 24821 | wafer polishing | order-of-operations test | ESD damage | 7 |
| 24822 | wafer polishing | order-of-operations test | UV embrittlement | 7 |
| 24823 | wafer polishing | order-of-operations test | cavitation erosion | 7 |
| 24824 | wafer polishing | order-of-operations test | creep relaxation | 7 |
| 24825 | wafer polishing | order-of-operations test | delamination | 7 |
| 24826 | wafer polishing | order-of-operations test | fretting | 7 |
| 24827 | wafer polishing | order-of-operations test | galvanic couple current | 7 |
| 24828 | wafer polishing | order-of-operations test | hydrogen embrittlement | 7 |
| 24829 | wafer polishing | order-of-operations test | ionic contamination | 7 |
| 24830 | wafer polishing | order-of-operations test | microbial corrosion | 7 |
| 24831 | wafer polishing | order-of-operations test | misalignment | 7 |
| 24832 | wafer polishing | order-of-operations test | moisture ingress | 7 |
| 24833 | wafer polishing | order-of-operations test | outgassing | 7 |
| 24834 | wafer polishing | order-of-operations test | particulate contamination | 7 |
| 24835 | wafer polishing | order-of-operations test | process residue | 7 |
| 24836 | wafer polishing | order-of-operations test | solder voiding | 7 |
| 24837 | wafer polishing | order-of-operations test | stress-corrosion cracking | 7 |
| 24838 | wafer polishing | order-of-operations test | thermal-cycle fatigue | 7 |
| 24839 | wafer polishing | order-of-operations test | vibration loosening | 7 |
| 24840 | wafer polishing | order-of-operations test | whisker growth | 7 |
| 24841 | wafer polishing | reference-ratio reporting | ESD damage | 7 |
| 24842 | wafer polishing | reference-ratio reporting | UV embrittlement | 7 |
| 24843 | wafer polishing | reference-ratio reporting | cavitation erosion | 7 |
| 24844 | wafer polishing | reference-ratio reporting | creep relaxation | 7 |
| 24845 | wafer polishing | reference-ratio reporting | delamination | 7 |
| 24846 | wafer polishing | reference-ratio reporting | fretting | 7 |
| 24847 | wafer polishing | reference-ratio reporting | galvanic couple current | 7 |
| 24848 | wafer polishing | reference-ratio reporting | hydrogen embrittlement | 7 |
| 24849 | wafer polishing | reference-ratio reporting | ionic contamination | 7 |
| 24850 | wafer polishing | reference-ratio reporting | microbial corrosion | 7 |
| 24851 | wafer polishing | reference-ratio reporting | misalignment | 7 |
| 24852 | wafer polishing | reference-ratio reporting | moisture ingress | 7 |
| 24853 | wafer polishing | reference-ratio reporting | outgassing | 7 |
| 24854 | wafer polishing | reference-ratio reporting | particulate contamination | 7 |
| 24855 | wafer polishing | reference-ratio reporting | process residue | 7 |
| 24856 | wafer polishing | reference-ratio reporting | solder voiding | 7 |
| 24857 | wafer polishing | reference-ratio reporting | stress-corrosion cracking | 7 |
| 24858 | wafer polishing | reference-ratio reporting | thermal-cycle fatigue | 7 |
| 24859 | wafer polishing | reference-ratio reporting | vibration loosening | 7 |
| 24860 | wafer polishing | reference-ratio reporting | whisker growth | 7 |
| 24861 | wafer polishing | sample-history audit | ESD damage | 7 |
| 24862 | wafer polishing | sample-history audit | UV embrittlement | 7 |
| 24863 | wafer polishing | sample-history audit | cavitation erosion | 7 |
| 24864 | wafer polishing | sample-history audit | creep relaxation | 7 |
| 24865 | wafer polishing | sample-history audit | delamination | 7 |
| 24866 | wafer polishing | sample-history audit | fretting | 7 |
| 24867 | wafer polishing | sample-history audit | galvanic couple current | 7 |
| 24868 | wafer polishing | sample-history audit | hydrogen embrittlement | 7 |
| 24869 | wafer polishing | sample-history audit | ionic contamination | 7 |
| 24870 | wafer polishing | sample-history audit | microbial corrosion | 7 |
| 24871 | wafer polishing | sample-history audit | misalignment | 7 |
| 24872 | wafer polishing | sample-history audit | moisture ingress | 7 |
| 24873 | wafer polishing | sample-history audit | outgassing | 7 |
| 24874 | wafer polishing | sample-history audit | particulate contamination | 7 |
| 24875 | wafer polishing | sample-history audit | process residue | 7 |
| 24876 | wafer polishing | sample-history audit | solder voiding | 7 |
| 24877 | wafer polishing | sample-history audit | stress-corrosion cracking | 7 |
| 24878 | wafer polishing | sample-history audit | thermal-cycle fatigue | 7 |
| 24879 | wafer polishing | sample-history audit | vibration loosening | 7 |
| 24880 | wafer polishing | sample-history audit | whisker growth | 7 |
| 24881 | wafer polishing | saturation sweep | ESD damage | 7 |
| 24882 | wafer polishing | saturation sweep | UV embrittlement | 7 |
| 24883 | wafer polishing | saturation sweep | cavitation erosion | 7 |
| 24884 | wafer polishing | saturation sweep | creep relaxation | 7 |
| 24885 | wafer polishing | saturation sweep | delamination | 7 |
| 24886 | wafer polishing | saturation sweep | fretting | 7 |
| 24887 | wafer polishing | saturation sweep | galvanic couple current | 7 |
| 24888 | wafer polishing | saturation sweep | hydrogen embrittlement | 7 |
| 24889 | wafer polishing | saturation sweep | ionic contamination | 7 |
| 24890 | wafer polishing | saturation sweep | microbial corrosion | 7 |
| 24891 | wafer polishing | saturation sweep | misalignment | 7 |
| 24892 | wafer polishing | saturation sweep | moisture ingress | 7 |
| 24893 | wafer polishing | saturation sweep | outgassing | 7 |
| 24894 | wafer polishing | saturation sweep | particulate contamination | 7 |
| 24895 | wafer polishing | saturation sweep | process residue | 7 |
| 24896 | wafer polishing | saturation sweep | solder voiding | 7 |
| 24897 | wafer polishing | saturation sweep | stress-corrosion cracking | 7 |
| 24898 | wafer polishing | saturation sweep | thermal-cycle fatigue | 7 |
| 24899 | wafer polishing | saturation sweep | vibration loosening | 7 |
| 24900 | wafer polishing | saturation sweep | whisker growth | 7 |
| 24901 | wafer polishing | second-condition replicate | ESD damage | 7 |
| 24902 | wafer polishing | second-condition replicate | UV embrittlement | 7 |
| 24903 | wafer polishing | second-condition replicate | cavitation erosion | 7 |
| 24904 | wafer polishing | second-condition replicate | creep relaxation | 7 |
| 24905 | wafer polishing | second-condition replicate | delamination | 7 |
| 24906 | wafer polishing | second-condition replicate | fretting | 7 |
| 24907 | wafer polishing | second-condition replicate | galvanic couple current | 7 |
| 24908 | wafer polishing | second-condition replicate | hydrogen embrittlement | 7 |
| 24909 | wafer polishing | second-condition replicate | ionic contamination | 7 |
| 24910 | wafer polishing | second-condition replicate | microbial corrosion | 7 |
| 24911 | wafer polishing | second-condition replicate | misalignment | 7 |
| 24912 | wafer polishing | second-condition replicate | moisture ingress | 7 |
| 24913 | wafer polishing | second-condition replicate | outgassing | 7 |
| 24914 | wafer polishing | second-condition replicate | particulate contamination | 7 |
| 24915 | wafer polishing | second-condition replicate | process residue | 7 |
| 24916 | wafer polishing | second-condition replicate | solder voiding | 7 |
| 24917 | wafer polishing | second-condition replicate | stress-corrosion cracking | 7 |
| 24918 | wafer polishing | second-condition replicate | thermal-cycle fatigue | 7 |
| 24919 | wafer polishing | second-condition replicate | vibration loosening | 7 |
| 24920 | wafer polishing | second-condition replicate | whisker growth | 7 |
| 24921 | wafer polishing | three-estimator agreement | ESD damage | 7 |
| 24922 | wafer polishing | three-estimator agreement | UV embrittlement | 7 |
| 24923 | wafer polishing | three-estimator agreement | cavitation erosion | 7 |
| 24924 | wafer polishing | three-estimator agreement | creep relaxation | 7 |
| 24925 | wafer polishing | three-estimator agreement | delamination | 7 |
| 24926 | wafer polishing | three-estimator agreement | fretting | 7 |
| 24927 | wafer polishing | three-estimator agreement | galvanic couple current | 7 |
| 24928 | wafer polishing | three-estimator agreement | hydrogen embrittlement | 7 |
| 24929 | wafer polishing | three-estimator agreement | ionic contamination | 7 |
| 24930 | wafer polishing | three-estimator agreement | microbial corrosion | 7 |
| 24931 | wafer polishing | three-estimator agreement | misalignment | 7 |
| 24932 | wafer polishing | three-estimator agreement | moisture ingress | 7 |
| 24933 | wafer polishing | three-estimator agreement | outgassing | 7 |
| 24934 | wafer polishing | three-estimator agreement | particulate contamination | 7 |
| 24935 | wafer polishing | three-estimator agreement | process residue | 7 |
| 24936 | wafer polishing | three-estimator agreement | solder voiding | 7 |
| 24937 | wafer polishing | three-estimator agreement | stress-corrosion cracking | 7 |
| 24938 | wafer polishing | three-estimator agreement | thermal-cycle fatigue | 7 |
| 24939 | wafer polishing | three-estimator agreement | vibration loosening | 7 |
| 24940 | wafer polishing | three-estimator agreement | whisker growth | 7 |
| 24941 | wafer polishing | threshold-stability sweep | ESD damage | 7 |
| 24942 | wafer polishing | threshold-stability sweep | UV embrittlement | 7 |
| 24943 | wafer polishing | threshold-stability sweep | cavitation erosion | 7 |
| 24944 | wafer polishing | threshold-stability sweep | creep relaxation | 7 |
| 24945 | wafer polishing | threshold-stability sweep | delamination | 7 |
| 24946 | wafer polishing | threshold-stability sweep | fretting | 7 |
| 24947 | wafer polishing | threshold-stability sweep | galvanic couple current | 7 |
| 24948 | wafer polishing | threshold-stability sweep | hydrogen embrittlement | 7 |
| 24949 | wafer polishing | threshold-stability sweep | ionic contamination | 7 |
| 24950 | wafer polishing | threshold-stability sweep | microbial corrosion | 7 |
| 24951 | wafer polishing | threshold-stability sweep | misalignment | 7 |
| 24952 | wafer polishing | threshold-stability sweep | moisture ingress | 7 |
| 24953 | wafer polishing | threshold-stability sweep | outgassing | 7 |
| 24954 | wafer polishing | threshold-stability sweep | particulate contamination | 7 |
| 24955 | wafer polishing | threshold-stability sweep | process residue | 7 |
| 24956 | wafer polishing | threshold-stability sweep | solder voiding | 7 |
| 24957 | wafer polishing | threshold-stability sweep | stress-corrosion cracking | 7 |
| 24958 | wafer polishing | threshold-stability sweep | thermal-cycle fatigue | 7 |
| 24959 | wafer polishing | threshold-stability sweep | vibration loosening | 7 |
| 24960 | wafer polishing | threshold-stability sweep | whisker growth | 7 |
| 24961 | wafer polishing | time-zero control | ESD damage | 7 |
| 24962 | wafer polishing | time-zero control | UV embrittlement | 7 |
| 24963 | wafer polishing | time-zero control | cavitation erosion | 7 |
| 24964 | wafer polishing | time-zero control | creep relaxation | 7 |
| 24965 | wafer polishing | time-zero control | delamination | 7 |
| 24966 | wafer polishing | time-zero control | fretting | 7 |
| 24967 | wafer polishing | time-zero control | galvanic couple current | 7 |
| 24968 | wafer polishing | time-zero control | hydrogen embrittlement | 7 |
| 24969 | wafer polishing | time-zero control | ionic contamination | 7 |
| 24970 | wafer polishing | time-zero control | microbial corrosion | 7 |
| 24971 | wafer polishing | time-zero control | misalignment | 7 |
| 24972 | wafer polishing | time-zero control | moisture ingress | 7 |
| 24973 | wafer polishing | time-zero control | outgassing | 7 |
| 24974 | wafer polishing | time-zero control | particulate contamination | 7 |
| 24975 | wafer polishing | time-zero control | process residue | 7 |
| 24976 | wafer polishing | time-zero control | solder voiding | 7 |
| 24977 | wafer polishing | time-zero control | stress-corrosion cracking | 7 |
| 24978 | wafer polishing | time-zero control | thermal-cycle fatigue | 7 |
| 24979 | wafer polishing | time-zero control | vibration loosening | 7 |
| 24980 | wafer polishing | time-zero control | whisker growth | 7 |
| 24981 | wafer polishing | two-condition identifiability | ESD damage | 7 |
| 24982 | wafer polishing | two-condition identifiability | UV embrittlement | 7 |
| 24983 | wafer polishing | two-condition identifiability | cavitation erosion | 7 |
| 24984 | wafer polishing | two-condition identifiability | creep relaxation | 7 |
| 24985 | wafer polishing | two-condition identifiability | delamination | 7 |
| 24986 | wafer polishing | two-condition identifiability | fretting | 7 |
| 24987 | wafer polishing | two-condition identifiability | galvanic couple current | 7 |
| 24988 | wafer polishing | two-condition identifiability | hydrogen embrittlement | 7 |
| 24989 | wafer polishing | two-condition identifiability | ionic contamination | 7 |
| 24990 | wafer polishing | two-condition identifiability | microbial corrosion | 7 |
| 24991 | wafer polishing | two-condition identifiability | misalignment | 7 |
| 24992 | wafer polishing | two-condition identifiability | moisture ingress | 7 |
| 24993 | wafer polishing | two-condition identifiability | outgassing | 7 |
| 24994 | wafer polishing | two-condition identifiability | particulate contamination | 7 |
| 24995 | wafer polishing | two-condition identifiability | process residue | 7 |
| 24996 | wafer polishing | two-condition identifiability | solder voiding | 7 |
| 24997 | wafer polishing | two-condition identifiability | stress-corrosion cracking | 7 |
| 24998 | wafer polishing | two-condition identifiability | thermal-cycle fatigue | 7 |
| 24999 | wafer polishing | two-condition identifiability | vibration loosening | 7 |
| 25000 | wafer polishing | two-condition identifiability | whisker growth | 7 |
Incoprea Research · third project, 25,000 leads · 3 November 2026. Composition plus the programme's own techniques. No experiment performed.